S. Mahapatra

11 papers Misc 2Journal 5Unranked 4
YearRankTypeTitle / Venue / Authors
2025 — conf
Modeling BTI Reliability in CMOS DRAM Periphery Device: A Review of BTI Analysis Tool (BAT).
IRPS
A. Subirats, M. Samiee, G. Ferrari, U. Sharma, T. Imamoto, M. Yokomichi, S. Srivastava, K. Florent, T. Owens, A. S. Bisht, S. Mahapatra
2018 — conf
Epitaxial Gd2O3on Si (111) Substrate by Sputtering to Enable Low Cost SOI.
DRC
K. R. Khiangte Amlta, A. Laha, S. Mahapatra, U. Gangway
2018 — conf
Key parameters driving transistor degradation in advanced strained SiGe channels.
IRPS
Vincent Huard, Cheikh Ndiaye, M. Arabi, Narendra Parihar, X. Federspiel, Souhir Mhira, S. Mahapatra, Alain Bravaix
2015 — conf
Impact of time-zero and NBTI variability on sub-20nm FinFET based SRAM at low voltages.
IRPS
Nilesh Goel, P. Dubey, J. Kawa, S. Mahapatra
2007 J jnl
A comprehensive model for PMOS NBTI degradation: Recent progress.
Microelectron. Reliab.
Muhammad Ashraful Alam, Haldun Kufluoglu, Dhanoop Varghese, S. Mahapatra
2007 J jnl
Analysis of an optical packet switch with partially shared buffer and wavelength conversion.
IET Commun.
Sandip Debnath, S. Mahapatra, Ranjan Gangopadhyay
2006 J jnl
The Jahn-Teller and pseudo-Jahn-Teller effects in the anion photoelectron spectroscopy of B3 cluster.
J. Comput. Chem.
T. S. Venkatesan, K. Deepika, S. Mahapatra
2005 J jnl
A comprehensive model of PMOS NBTI degradation.
Microelectron. Reliab.
Muhammad Ashraful Alam, S. Mahapatra
2003 Misc conf
Substrate Bias Effect on Cycling Induced Performance Degradation of Flash EEPROMs.
VLSI Design
S. Mahapatra, S. Shukuri, Jeff Bude
2001 J jnl
Multi-frequency transconductance technique for interface characterization of deep sub-micron SOI-MOSFETs.
Microelectron. Reliab.
Aatish Kumar, S. Mahapatra, R. Lal, V. Ramgopal Rao
2001 Misc conf
erformance Optimization Of 60 Nm Channel Length Vertical Mosfets Using Channel Engineering.
VLSI Design
G. Shrivastav, S. Mahapatra, V. Ramgopal Rao, J. Vasi, K. G. Anil, C. Fink, Walter Hansch, I. Eisele