Ryutaro Yasuhara

12 papers C 1Unranked 11
YearRankTypeTitle / Venue / Authors
2020 — conf
TaOx ReRAM as a Highly-Reliable Embedded Memory and Its Application to Edge AI.
VLSI-DAT
Ryutaro Yasuhara
2019 — conf
Comprehensive Analysis of Data-Retention and Endurance Trade-Off of 40nm TaOx-based ReRAM.
IRPS
Shouhei Fukuyama, Atsuna Hayakawa, Ryutaro Yasuhara, Shinpei Matsuda, Hiroshi Kinoshita, Ken Takeuchi
2019 — conf
Reliability Issues in Analog ReRAM Based Neural-Network Processor.
IRPS
Ryutaro Yasuhara, Takashi Ono, Reiji Mochida, Shunsaku Muraoka, Kazuyuki Kouno, Koji Katayama, Yuriko Hayata, Masayoshi Nakayama, Hitoshi Suwa, Yukio Hayakawa, Takumi Mikawa, Yasushi Gohou, Shinichi Yoneda
2018 — conf
Improvement of Endurance and Data-retention in 40nm TaOX-based ReRAM by Finalize Verify.
NVMTS
Shouhei Fukuyama, Shinpei Matsuda, Ryutaro Yasuhara, Ken Takeuchi
2018 — conf
Observation and Analysis of Bit-by-Bit Cell Current Variation During Data-Retention of TaOx-based ReRAM.
ESSDERC
Kazuki Maeda, Shinpei Matsuda, Ken Takeuchi, Ryutaro Yasuhara
2018 — conf
Suppression of endurance-stressed data-retention failures of 40nm TaOx-based ReRAM.
IRPS
Shouhei Fukuyama, Kazuki Maeda, Shinpei Matsuda, Ken Takeuchi, Ryutaro Yasuhara
2017 — conf
Study of error repeatability and recovery in 40nm TaOx ReRAM.
ESSDERC
Takashi Inose, Seiichi Aritome, Ryutaro Yasuhara, Satoshi Mishima, Ken Takeuchi
2015 — conf
A new prediction method for ReRAM data retention statistics based on 3D filament structures.
IRPS
Zhiqiang Wei, Koji Katayama, Shunsaku Muraoka, Ryutaro Yasuhara, Takumi Mikawa, Koji Eriguchi
2015 — conf
Highly reliable TaOx ReRAM with centralized filament for 28-nm embedded application.
VLSIC
Yukio Hayakawa, Atsushi Himeno, Ryutaro Yasuhara, W. Boullart, E. Vecchio, T. Vandeweyer, T. Witters, D. Crotti, M. Jurczak, S. Fujii, S. Ito, Y. Kawashima, Yuuichirou Ikeda, Akifumi Kawahara, Ken Kawai, Zhiqiang Wei, Shunsaku Muraoka, Kazuhiko Shimakawa, Takumi Mikawa, Shinichi Yoneda
2014 — conf
Highly-reliable TaOx reram technology using automatic forming circuit.
ICICDT
Ken Kawai, Akifumi Kawahara, Ryutaro Yasuhara, Shunsaku Muraoka, Zhiqiang Wei, Ryotaro Azuma, Kouhei Tanabe, Kazuhiko Shimakawa
2014 C conf
Quantitative method for estimating characteristics of conductive filament in ReRAM.
ISCAS
Zhiqiang Wei, Ryutaro Yasuhara, Koji Katayama, Takumi Mikawa, Takeki Ninomiya, Shunsaku Muraoka
2013 — conf
Filament scaling forming technique and level-verify-write scheme with endurance over 107 cycles in ReRAM.
ISSCC
Akifumi Kawahara, Ken Kawai, Yuuichirou Ikeda, Yoshikazu Katoh, Ryotaro Azuma, Yuhei Yoshimoto, Kouhei Tanabe, Zhiqiang Wei, Takeki Ninomiya, Koji Katayama, Ryutaro Yasuhara, Shunsaku Muraoka, Atsushi Himeno, Naoki Yoshikawa, Hideaki Murase, Kazuhiko Shimakawa, Takeshi Takagi, Takumi Mikawa, Kunitoshi Aono