Ryo Kishida

19 papers C 3Misc 1Journal 4Unranked 11
YearRankTypeTitle / Venue / Authors
2025 C conf
An Expandable Digital Delay Line using Phase Interpolator with Duty Cycle Correction Capability.
ISCAS
Shinya Nagasaki, Ryo Kishida, Takefumi Yoshikawa
2025 — conf
Investigation of the Time-Dependent BTI-induced Degradation Distribution for Ring Oscillators in Ultra-Long-Term Stress Conditions.
IRPS
Tomoharu Kishita, Ryo Kishida, Kazutoshi Kobayashi
2024 C conf
A Fractional-N PLL for Multi-phase Clock Generation with Loop Bandwidth Enhancement.
ISCAS
Reo Nagasue, Isamu Mizuno, Ryo Kishida, Tatsuya Iwata, Takefumi Yoshikawa
2024 Misc conf
A Power Reduction Scheme by Arithmetic Format Conversion for a DSP to Estimate Qubit States Under 4K Cryogenic Environment.
QCE
Takashi Imagawa, Ryo Kishida, Yuki Koyama, Kazutoshi Kobayashi, Takefumi Miyoshi
2023 — conf
Ring Oscillators with identical Circuit Structure to Measure Bias Temperature Instability.
ASICON
Daisuke Kikuta, Ryo Kishida, Kazutoshi Kobayashi
2022 — conf
An Aging Degradation Suppression Scheme at Constant Performance by Controlling Supply Voltage and Body Bias in a 65 nm Fully-Depleted Silicon-On-Insulator Process.
IRPS
Ikuo Suda, Ryo Kishida, Kazutoshi Kobayashi
2021 — conf
Bias Temperature Instability Depending on Body Bias through Buried Oxide (BOX) Layer in a 65 nm Fully-Depleted Silicon-On-Insulator Process.
IRPS
Ryo Kishida, Ikuo Suda, Kazutoshi Kobayashi
2021 J jnl
Digital Calibration Algorithm of Conversion Error Influenced by Parasitic Capacitance in C-C SAR-ADC Based on γ-Estimation.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
Satoshi Sekine, Tatsuji Matsuura, Ryo Kishida, Akira Hyogo
2020 J jnl
Universal NBTI Compact Model Replicating AC Stress/Recovery from a Single-shot Long-term DC Measurement.
IPSJ Trans. Syst. LSI Des. Methodol.
Takumi Hosaka, Shinichi Nishizawa, Ryo Kishida, Takashi Matsumoto, Kazutoshi Kobayashi
2019 C conf
Compact Modeling of NBTI Replicating AC Stress / Recovery from a Single-shot Long-term DC Measurement.
IOLTS
Takumi Hosaka, Shinichi Nishizawa, Ryo Kishida, Takashi Matsumoto, Kazutoshi Kobayashi
2019 — conf
Duty Ratio and Capacitance Analysis of AC/DC Converter without Current Control Circuit.
ISPACS
Yuki Tanaka, Tatsuji Matsuura, Ryo Kishida, Akira Hyogo
2019 — conf
Examination of Incremental ADC with SAR ADC to Reduce Conversion Time with High Accuracy.
ISPACS
Yuichiro Unno, Tatsuji Matsuura, Ryo Kishida, Akira Hyogo
2019 — conf
Investigation of Hybrid ADC Combined with First-order Feedforward Incremental and SAR ADCs.
ISPACS
Yuichiro Kobayashi, Tatsuji Matsuura, Ryo Kishida, Akira Hyogo
2019 — conf
Temperature Dependence of Bias Temperature Instability (BTI) in Long-term Measurement by BTI-sensitive and -insensitive Ring Oscillators Removing Environmental Fluctuation.
ASICON
Takuya Asuke, Ryo Kishida, Jun Furuta, Kazutoshi Kobayashi
2018 — conf
A Novel C-2αC Ladder Based Non-binary DAC for SAR-ADC Using Unit Capacitors.
ISPACS
Satoshi Sekine, Tatsuji Matsuura, Ryo Kishida, Akira Hyogo
2017 — conf
Circuit-level simulation methodology for Random Telegraph Noise by using Verilog-AMS.
ICICDT
Takuya Komawaki, Michitarou Yabuuchi, Ryo Kishida, Jun Furuta, Takashi Matsumoto, Kazutoshi Kobayashi
2017 J jnl
Replication of Random Telegraph Noise by Using a Physical-Based Verilog-AMS Model.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
Takuya Komawaki, Michitarou Yabuuchi, Ryo Kishida, Jun Furuta, Takashi Matsumoto, Kazutoshi Kobayashi
2015 — conf
Negative bias temperature instability caused by plasma induced damage in 65 nm bulk and Silicon on thin BOX (SOTB) processes.
IRPS
Ryo Kishida, Azusa Oshima, Kazutoshi Kobayashi
2014 J jnl
Correlations between BTI-Induced Degradations and Process Variations on ASICs and FPGAs.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
Michitarou Yabuuchi, Ryo Kishida, Kazutoshi Kobayashi