Ruijing Shen

15 papers A* 2A 1Journal 5Unranked 5
YearRankTypeTitle / Venue / Authors
2012 — conf
A new voltage binning technique for yield improvement based on graph theory.
ISQED
Ruijing Shen, Sheldon X.-D. Tan, Xuexin Liu
2012 J jnl
Decentralized and Passive Model Order Reduction of Linear Networks With Massive Ports.
IEEE Trans. Very Large Scale Integr. Syst.
Boyuan Yan, Sheldon X.-D. Tan, Lingfei Zhou, Jie Chen, Ruijing Shen
2012 J jnl
Fast Statistical Full-Chip Leakage Analysis for Nanometer VLSI Systems.
ACM Trans. Design Autom. Electr. Syst.
Ruijing Shen, Sheldon X.-D. Tan, Hai Wang, Jinjun Xiong
2012 J jnl
General Parameterized Thermal Modeling for High-Performance Microprocessor Design.
IEEE Trans. Very Large Scale Integr. Syst.
Thom Jefferson A. Eguia, Sheldon X.-D. Tan, Ruijing Shen, Duo Li, Eduardo H. Pacheco, Murli Tirumala, Lingli Wang
2012 — book
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs.
Ruijing Shen, Sheldon X.-D. Tan, Hao Yu
2011 A* conf
Performance bound analysis of analog circuits considering process variations.
DAC
Zhigang Hao, Sheldon X.-D. Tan, Ruijing Shen, Guoyong Shi
2011 — —
Statistical Performance Characterization and Analysis of Nano-Scale VLSI Circuits
Ruijing Shen
2011 — conf
Statistical full-chip dynamic power estimation considering spatial correlations.
ISQED
Zhigang Hao, Ruijing Shen, Sheldon X.-D. Tan, Bao Liu, Guoyong Shi, Yici Cai
2010 A* conf
A linear algorithm for full-chip statistical leakage power analysis considering weak spatial correlation.
DAC
Ruijing Shen, Sheldon X.-D. Tan, Jinjun Xiong
2010 — conf
A linear statistical analysis for full-chip leakage power with spatial correlation.
ACM Great Lakes Symposium on VLSI
Ruijing Shen, Sheldon X.-D. Tan, Jinjun Xiong
2010 A conf
General behavioral thermal modeling and characterization for multi-core microprocessor design.
DATE
Thom Jefferson A. Eguia, Sheldon X.-D. Tan, Ruijing Shen, Eduardo H. Pacheco, Murli Tirumala
2010 J jnl
Statistical modeling and analysis of chip-level leakage power by spectral stochastic method.
Integr.
Ruijing Shen, Sheldon X.-D. Tan, Ning Mi, Yici Cai
2010 J jnl
Variational Capacitance Extraction and Modeling Based on Orthogonal Polynomial Method.
IEEE Trans. Very Large Scale Integr. Syst.
Ruijing Shen, Sheldon X.-D. Tan, Jian Cui, Wenjian Yu, Yici Cai, Gengsheng Chen
2009 — conf
Statistical modeling and analysis of chip-level leakage power by spectral stochastic method.
ASP-DAC
Ruijing Shen, Ning Mi, Sheldon X.-D. Tan, Yici Cai, Xianlong Hong
2008 — conf
Variational capacitance modeling using orthogonal polynomial method.
ACM Great Lakes Symposium on VLSI
Jian Cui, Gengsheng Chen, Ruijing Shen, Sheldon X.-D. Tan, Wenjian Yu, Jiarong Tong