Rui Zhang

29 papers Misc 1Journal 7Unranked 20
YearRankTypeTitle / Venue / Authors
2022 J jnl
CacheEM: For Reliability Analysis on Cache Memory Aging Due to Electromigration.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Rui Zhang, Taizhi Liu, Kexin Yang, Linda Milor
2022 — conf
Intra-Data Center 120Gbaud/DP-16QAM Self-Homodyne Coherent Links with Simplified Coherent DSP.
OFC
Rui Zhang, You-Wei Chen, Konstantin Kuzmin, Winston I. Way
2022 — —
Modeling and simulation of FinFET SRAM reliability degraded by various wearout mechanisms.
Rui Zhang
2021 — conf
115-Gbps/λ Fiber/FSO Transmission with Supervised and Semi-supervised Nonlinearity Correction Using Lasso.
OFC
Rui Zhang, Xizi Tang, Chin-Wei Hsu, You-Wei Chen, Qi Zhou, Shuyi Shen, Shuang Yao, Yahya Alfadhli, Shang-Jen Su, Gee-Kung Chang
2021 J jnl
A Comprehensive Framework for Analysis of Time-Dependent Performance-Reliability Degradation of SRAM Cache Memory.
IEEE Trans. Very Large Scale Integr. Syst.
Rui Zhang, Kexin Yang, Zhaocheng Liu, Taizhi Liu, Wenshan Cai, Linda Milor
2021 — conf
Demonstration of Spatial Multiplexing by Digital Beamforming in 5G Fiber-Wireless Integrated Network.
OFC
Shang-Jen Su, Chin-Wei Hsu, Shuyi Shen, Shuang Yao, Yahya Alfadhli, Rui Zhang, Qi Zhou, Gee-Kung Chang
2021 — conf
Digital Predistortion Enhancement by Convolutional Neural Network for Probabilistic Shaped Discrete Multi-Tone Signal Transmission in Passive Optical Network.
OFC
Qi Zhou, Rui Zhang, Shuyi Shen, Chin-Wei Hsu, Shuang Yao, Shang-Jen Su, Gee-Kung Chang
2021 — conf
Experimental Analysis of Fourier Transform based Blind Frequency Offset Estimation for PS-QAM in W-band Fiber-Millimeter Wave Integrated System.
OFC
Shuang Yao, Chin-Wei Hsu, Rui Zhang, Shuyi Shen, Qi Zhou, Shang-Jen Su, Yahya Alfadhli, John R. Barry, Gee-Kung Chang
2021 — conf
LDPC Coded PAM-4/8 Transmission in Fiber-FSO Link Using Unipolar Probability Distribution and Pre-distortion.
OFC
Rui Zhang, Chin-Wei Hsu, Xizi Tang, Qi Zhou, Gee-Kung Chang
2020 — conf
Asynchronous Multi-Service Fiber-Wireless Integrated Network using UFMC and PS for Flexible 5G Applications.
OFC
You-Wei Chen, Rui Zhang, Shang-Jen Su, Shuyi Shen, Qi Zhou, Shuang Yao, Gee-Kung Chang
2020 — conf
Combining Efficient Probabilistic Shaping and Deep Neural Network to Mitigate Capacity Crunch in 5G Fronthaul.
OFC
Qi Zhou, Rui Zhang, You-Wei Chen, Shuyi Shen, Shang-Jen Su, Jeffrey Finkelstein, Gee-Kung Chang
2020 — conf
Design of Flexible Fronthaul Featuring Per-UE Granularity and RU-Level Puncturing for URLLC Applications.
OFC
Yahya Alfadhli, Shuang Yao, Muhammad S. Omar, Shang-Jen Su, Shuyi Shen, Rui Zhang, You-Wei Chen, Peng-Chun Peng, Gee-Kung Chang
2020 — conf
Hybrid W-Band/Baseband Transmission for Fixed-Mobile Convergence Supported by Heterodyne Detection with Data-Carrying Local Oscillator.
OFC
Shuyi Shen, Qi Zhou, You-Wei Chen, Shuang Yao, Rui Zhang, Yahya Alfadhli, Shang-Jen Su, Jeffrey Finkelstein, Gee-Kung Chang
2020 — conf
Inverse Design of FinFET SRAM Cells.
IRPS
Rui Zhang, Zhaocheng Liu, Kexin Yang, Taizhi Liu, Wenshan Cai, Linda Milor
2020 — conf
Joint Optimization of Processing Complexity and Rate Allocation through Entropy Tunability for 64-/256-QAM Based Radio Fronthauling with LDPC and PAS-OFDM.
OFC
Rui Zhang, You-Wei Chen, Shuyi Shen, Qi Zhou, Shuang Yao, Shang-Jen Su, Yahya Alfadhli, Gee-Kung Chang
2020 J jnl
Key Enabling Technologies for the Post-5G Era: Fully Adaptive, All-Spectra Coordinated Radio Access Network with Function Decoupling.
IEEE Commun. Mag.
You-Wei Chen, Rui Zhang, Chin-Wei Hsu, Gee-Kung Chang
2020 J jnl
SRAM Stability Analysis and Performance-Reliability Tradeoff for Different Cache Configurations.
IEEE Trans. Very Large Scale Integr. Syst.
Rui Zhang, Taizhi Liu, Kexin Yang, Chang-Chih Chen, Linda Milor
2019 — conf
Elastic Optical Transmission of 50 Gb/s/Lambda OFDM Based Mobile Fronthaul via DSP-Aided Sub-band Spreading.
OFC
You-Wei Chen, Peng-Chun Peng, Jhih-Heng Yan, Shuyi Shen, Qi Zhou, Long Huang, Siming Liu, Rui Zhang, Kai-Ming Feng, Gee-Kung Chang
2019 — conf
Impact of Front-End Wearout Mechanisms on the Performance of a Ring Oscillator-Based Thermal Sensor.
IWASI
Rui Zhang, Kexin Yang, Taizhi Liu, Linda Milor
2019 — conf
Laser Frequency Jitter Tolerance and Linewidth Requirement for ≥ 64Gbaud DP-16QAM Coherent Systems.
OFC
Rui Zhang, Wen-Jr Jiang, Konstantin Kuzmin, Reggie Juluri, Gee-Kung Chang, Winston I. Way
2019 — conf
Real-Time FPGA Demonstration of Hybrid Bi-Directional MMW and FSO Fronthaul Architecture.
OFC
Yahya Alfadhli, Peng-Chun Peng, Hyunwoo Cho, Siming Liu, Rui Zhang, You-Wei Chen, Gee-Kung Chang
2019 — conf
Resilient MMW-RoF Network Enabled by Implementation of Tomlinson-Harashima Precoding.
OFC
Shuyi Shen, You-Wei Chen, Qi Zhou, Shuang Yao, Rui Zhang, Yahya Alfadhli, Gee-Kung Chang
2019 — conf
Symmetric Long-Reach 16-QAM Transmission using Lite Coherent Receiver for Next-Generation Optical Access Network.
OFC
Qi Zhou, Jiale He, Shuyi Shen, Rui Zhang, Shuang Yao, Yahya Alfadhli, You-Wei Chen, Gee-Kung Chang
2018 J jnl
A Comprehensive Time-Dependent Dielectric Breakdown Lifetime Simulator for Both Traditional CMOS and FinFET Technology.
IEEE Trans. Very Large Scale Integr. Syst.
Kexin Yang, Taizhi Liu, Rui Zhang, Linda Milor
2018 Misc conf
Circuit-level reliability simulator for front-end-of-line and middle-of-line time-dependent dielectric breakdown in FinFET technology.
VTS
Kexin Yang, Taizhi Liu, Rui Zhang, Linda Milor
2018 — conf
Estimation of the Optimal Accelerated Test Region for FinFET SRAMs Degraded by Front-End and Back-End Wearout Mechanisms.
DCIS
Rui Zhang, Kexin Yang, Taizhi Liu, Linda Milor
2018 — conf
Optimal Accelerated Test Regions for Time- Dependent Dielectric Breakdown Lifetime Parameters Estimation in FinFET Technology.
DCIS
Kexin Yang, Rui Zhang, Taizhi Liu, Dae Hyun Kim, Linda Milor
2017 J jnl
Analysis of time-dependent dielectric breakdown induced aging of SRAM cache with different configurations.
Microelectron. Reliab.
Rui Zhang, Taizhi Liu, Kexin Yang, Linda Milor
2017 J jnl
Front-end of line and middle-of-line time-dependent dielectric breakdown reliability simulator for logic circuits.
Microelectron. Reliab.
Kexin Yang, Taizhi Liu, Rui Zhang, Dae Hyun Kim, Linda Milor