Rui Liu - RankMe

12 papers C 2Journal 8Unranked 2

Year	Rank	Type	Title / Venue / Authors
2021	J	`jnl`	Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor. J. Electron. Test. Shuting Shi, Rui Chen, Rui Liu, Mo Chen, Chen Shen, Xuantian Li, Haonan Tian, Li Chen
2018	J	`jnl`	Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree. Microelectron. Reliab. Yuanqing Li, Li Chen, Issam Nofal, Mo Chen, Haibin Wang, Rui Liu, Qingyu Chen, Milos Krstic, Shuting Shi, Gang Guo, Sang H. Baeg, Shi-Jie Wen, Richard Wong
2017	C	`conf`	BPPT - Bulk potential protection technique for hardened sequentials. IOLTS Issam Nofal, Adrian Evans, Anlin He, Gang Guo, Yuanqing Li, Li Chen, Rui Liu, Haibin Wang, Mo Chen, Sang H. Baeg, Shi-Jie Wen, Richard Wong
2016	J	`jnl`	A 10-Transistor 65 nm SRAM Cell Tolerant to Single-Event Upsets. J. Electron. Test. Yuanqing Li, Lixiang Li, Yuan Ma, Li Chen, Rui Liu, Haibin Wang, Qiong Wu, Michael Newton, Mo Chen
2016	J	`jnl`	A Built-in Single Event Upsets Detector for Sequential Cells. J. Electron. Test. Yuanqing Li, Haibin Wang, Lixiang Li, Li Chen, Rui Liu, Mo Chen
2016	J	`jnl`	An SEU-Resilient SRAM Bitcell in 65-nm CMOS Technology. J. Electron. Test. Qingyu Chen, Haibin Wang, Li Chen, Lixiang Li, Xing Zhao, Rui Liu, Mo Chen, Xuantian Li
2016	—	`conf`	Total ionizing dose test facilities for micro-electronic circuits. CCECE Haibin Wang, Rui Liu, Xuantian Li, Li Chen, David M. Hiemstra, Valeri Kirischian
2015	J	`jnl`	A Novel Built-in Current Sensor for N-WELL SET Detection. J. Electron. Test. Haibin Wang, Rui Liu, Li Chen, Jinshun Bi, Mulong Li, Yuanqing Li
2015	—	`conf`	Analysis of advanced circuits for SET measurement. IRPS Rui Liu, Adrian Evans, Qiong Wu, Yuanqing Li, Li Chen, Shi-Jie Wen, Rick Wong, Rita Fung
2015	J	`jnl`	Simulation and Experimental Evaluation of a Soft Error Tolerant Layout for SRAM 6T Bitcell in 65nm Technology. J. Electron. Test. Lixiang Li, Yuanqing Li, Haibin Wang, Rui Liu, Qiong Wu, Michael Newton, Yuan Ma, Li Chen
2014	C	`conf`	New approaches for synthesis of redundant combinatorial logic for selective fault tolerance. IOLTS Hao Xie, Li Chen, Rui Liu, Adrian Evans, Dan Alexandrescu, Shi-Jie Wen, Rick Wong
2014	J	`jnl`	Single Event Resilient Dynamic Logic Designs. J. Electron. Test. Haibin Wang, Mulong Li, Li Chen, Rui Liu, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Rita Fung, Jinshun Bi