Rosa Rodríguez-Montañés

46 papers A 7B 6C 2Misc 6Journal 15Unranked 10
YearRankTypeTitle / Venue / Authors
2023 J jnl
True Random Number Generator Based on the Variability of the High Resistance State of RRAMs.
IEEE Access
Maryam Akbari, Sattar Mirzakuchaki, Daniel Arumí, Salvador Manich, Álvaro Gómez-Pau, Francesca Campabadal, Mireia Bargallo González, Rosa Rodríguez-Montañés
2022 — conf
On the Fitting and Improvement of RRAM Stanford-Based Model Parameters Using TiN/Ti/HfO2/W Experimental Data.
DCIS
Vahab Mahboubi, Daniel Arumí, Álvaro Gómez-Pau, Rosa Rodríguez-Montañés, Salvador Manich
2021 — conf
Low Cost AES Protection Against DPA Using Rolling Codes.
DCIS
P. Albiol, Salvador Manich, Daniel Arumí, Rosa Rodríguez-Montañés, Álvaro Gómez-Pau
2021 — conf
Simulation of serial RRAM cell based on a Verilog-A compact model.
DCIS
Binbin Yang, Daniel Arumí, Salvador Manich, Álvaro Gómez-Pau, Rosa Rodríguez-Montañés, Juan Bautista Roldán, Mireia Bargallo González, Francesca Campabadal, Liang Fang
2019 J jnl
Postbond Test of Through-Silicon Vias With Resistive Open Defects.
IEEE Trans. Very Large Scale Integr. Syst.
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras
2018 J jnl
The Low Area Probing Detector as a Countermeasure Against Invasive Attacks.
IEEE Trans. Very Large Scale Integr. Syst.
Michael Weiner, Salvador Manich, Rosa Rodríguez-Montañés, Georg Sigl
2017 B conf
Mitigating read & write errors in STT-MRAM memories under DVS.
ETS
Elena-Ioana Vatajelu, Rosa Rodríguez-Montañés, Michel Renovell, Joan Figueras
2016 J jnl
Prebond Testing of Weak Defects in TSVs.
IEEE Trans. Very Large Scale Integr. Syst.
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras
2016 — conf
RRAM based cell for hardware security applications.
IVSW
Daniel Arumí, Salvador Manich, Rosa Rodríguez-Montañés
2016 J jnl
Test Escapes of Stuck-Open Faults Caused by Parasitic Capacitances and Leakage Currents.
IEEE Trans. Very Large Scale Integr. Syst.
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras
2015 B conf
Power-aware voltage tuning for STT-MRAM reliability.
ETS
Elena I. Vatajelu, Rosa Rodríguez-Montañés, Stefano Di Carlo, Marco Indaco, Michel Renovell, Paolo Prinetto, Joan Figueras
2015 A conf
Read/write robustness estimation metrics for spin transfer torque (STT) MRAM cell.
DATE
Elena I. Vatajelu, Rosa Rodríguez-Montañés, Marco Indaco, Michel Renovell, Paolo Prinetto, Joan Figueras
2015 — conf
STT-MRAM cell reliability evaluation under process, voltage and temperature (PVT) variations.
DTIS
Elena I. Vatajelu, Rosa Rodríguez-Montañés, Marco Indaco, Paolo Prinetto, Joan Figueras
2014 B conf
Post-bond test of Through-Silicon Vias with open defects.
ETS
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras
2014 C conf
Pre-bond testing of weak defects in TSVs.
IOLTS
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras
2014 — conf
Reliability estimation at block-level granularity of spin-transfer-torque MRAMs.
DFT
Stefano Di Carlo, Marco Indaco, Paolo Prinetto, Elena I. Vatajelu, Rosa Rodríguez-Montañés, Joan Figueras
2013 B conf
BIST architecture to detect defects in tsvs during pre-bond testing.
ETS
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras
2013 J jnl
Diagnosis of Interconnect Full Open Defects in the Presence of Gate Leakage Currents.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2011 J jnl
Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2011 J jnl
Gate Leakage Impact on Full Open Defects in Interconnect Lines.
IEEE Trans. Very Large Scale Integr. Syst.
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2010 B conf
Diagnosis of full open defects in interconnect lines with fan-out.
ETS
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2009 J jnl
Delay caused by resistive opens in interconnecting lines.
Integr.
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras
2008 J jnl
Experimental Characterization of CMOS Interconnect Open Defects.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras
2008 Misc conf
Full Open Defects in Nanometric CMOS.
VTS
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2008 A conf
Time-dependent Behaviour of Full Open Defects in Interconnect Lines.
ITC
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2007 Misc conf
Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages.
VTS
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
2007 Misc conf
Diagnosis of Full Open Defects in Interconnecting Lines.
VTS
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
2006 C conf
Lissajous Based Mixed-Signal Testing for N-Observable Signals.
DDECS
Luz Balado, Emili Lupon, L. García, Rosa Rodríguez-Montañés, Joan Figueras
2005 B conf
Defective behaviours of resistive opens in interconnect lines.
ETS
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras
2004 J jnl
Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours.
J. Electron. Test.
Rosa Rodríguez-Montañés, D. Muñoz, Luz Balado, Joan Figueras
2004 Misc conf
BIST Technique by Equally Spaced Test Vector Sequences.
VTS
Salvador Manich, L. García, Luz Balado, Emili Lupon, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras
2003 A conf
A Combinatorial Method for the Evaluation of Yield of Fault-Tolerant Systems-on-Chip.
DSN
Doru P. Munteanu, Víctor Suñé, Rosa Rodríguez-Montañés, Juan A. Carrasco
2003 — conf
On the selection of efficient arithmetic additive test pattern generators [logic test].
ETW
Salvador Manich, L. García, Luz Balado, Emili Lupon, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras
2003 — conf
Process-variability aware delay fault testing of ΔV
ETW
Daniel Arumí-Delgado, Rosa Rodríguez-Montañés, José Pineda de Gyvez, Guido Gronthoud
2003 Misc conf
Threshold Voltage Mismatch (DeltaVT) Fault Modeling.
VTS
José Pineda de Gyvez, Rosa Rodríguez-Montañés
2002 — conf
Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours.
IOLTW
Rosa Rodríguez-Montañés, D. Muñoz, Luz Balado, Joan Figueras
2002 A conf
RTL Level Preparation of High-Quality/Low-Energy/Low-Power BIST.
ITC
Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, Rosa Rodríguez-Montañés, Joan Figueras
2002 J jnl
Resistance Characterization for Weak Open Defects.
IEEE Des. Test Comput.
Rosa Rodríguez-Montañés, Paul Volf, José Pineda de Gyvez
1998 A conf
Estimation of the Defective IDDQ Caused by Shorts in Deep-Submicron CMOS ICs.
DATE
Rosa Rodríguez-Montañés, Joan Figueras
1998 J jnl
IDDQ testing: state of the art and future trends.
Integr.
Antoni Ferré, Eugeni Isern, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras
1997 Misc conf
Bridges in sequential CMOS circuits: current-voltage signatur.
VTS
Rosa Rodríguez-Montañés, Joan Figueras
1996 J jnl
Bridging defects resistance in the metal layer of a CMOS process.
J. Electron. Test.
Rosa Rodríguez-Montañés, E. M. J. G. Bruls, Joan Figueras
1994 — conf
Analysis of Bridging Defects in Sequential CMOS Circuits and their Current Testability.
EDAC-ETC-EUROASIC
Rosa Rodríguez-Montañés, Joan Figueras
1992 A conf
Bridging Defects Resistance Measurements in a CMOS Process.
ITC
Rosa Rodríguez-Montañés, Joan Figueras, Eric Bruls
1992 J jnl
Quiescent current analysis and experimentation of defective CMOS circuits.
J. Electron. Test.
Jaume A. Segura, Víctor H. Champac, Rosa Rodríguez-Montañés, Joan Figueras, J. A. Rubio
1991 A conf
Current vs. Logic Testing of Gate Oxide Short, Floating Gate and Bridging Failures in CMOS.
ITC
Rosa Rodríguez-Montañés, Jaume A. Segura, Víctor H. Champac, Joan Figueras, J. A. Rubio