Ronny Vanhooren

27 papers A 8B 8C 3Misc 2Journal 6
YearRankTypeTitle / Venue / Authors
2025 B conf
European Test Symposium Teams: an Anniversary Snapshot.
ETS
Maksim Jenihhin, Jaan Raik, Artur Jutman, Natalia Cherezova, Raimund Ubar, Liviu Miclea, Szilárd Enyedi, I. Stefan, Ovidiu Stan, Cosmina Corches, Z. Peng, Petru Eles, Rolf Drechsler, S. Eggersglüß, Görschwin Fey, Andreas Glowatz, Daniel Tille, Georges G. E. Gielen, Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, P.-Y. Chuang, Erik Jan Marinissen, Giorgio Di Natale, M. Barragan, Paolo Maistri, S. Mir, Vatajelu I. Vatajelu, Paolo Bernardi, S. Di Carlo, Paolo Prinetto, Matteo Sonza Reorda, Massimo Violante, Haralampos-G. Stratigopoulos, M. K. Michael, Stelios Neophytou, Stavros Hadjitheophanous, Kyriakos Christou, M. Skitsas, Alberto Bosio, Bastien Deveautour, P. Girard, Marcello Traiola, Arnaud Virazel, F. Fernandes Dos Santos, Angeliki Kritikakou, Gioele Casagranda, Marzio Vallero, Flavio Vella, Paolo Rech, Letícia Maria Bolzani Poehls, Milos Krstic, Marko S. Andjelkovic, F. Vargas, Grigor Tshagharyan, Gurgen Harutyunyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Mottaqiallah Taouil, Moritz Fieback, Anteneh Gebregiorgis, Rajendra Bishnoi, Said Hamdioui, Abhijit Chatterjee, A. Saha, Suhasini Komarraju, K. Ma, Chandramouli N. Amarnath, Mehdi Baradaran Tahoori, Mahta Mayahinia, Maryam Rajabalipanah, Katayoon Basharkhah, N. Nosrati, Zahra Jahanpeima, Zain Navabi, Hans-Joachim Wunderlich, Sybille Hellebrand
2023 J jnl
Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Nektar Xama, Jhon Gomez, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen
2023 B conf
High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis.
ETS
Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen
2022 J jnl
DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using the Difference in Distance to Mean Value.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen
2022 C conf
Recent Trends and Perspectives on Defect-Oriented Testing.
IOLTS
Paolo Bernardi, Riccardo Cantoro, Anthony Coyette, W. Dobbeleare, Moritz Fieback, Andrea Floridia, G. Gielenk, Jhon Gomez, Michelangelo Grosso, Andrea Guerriero, Iacopo Guglielminetti, Said Hamdioui, Giorgio Insinga, N. Mautone, Nunzio Mirabella, Sandro Sartoni, Matteo Sonza Reorda, Rudolf Ullmann, Ronny Vanhooren, N. Xamak, Lizhou Wu
2020 B conf
Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate Statistics.
ETS
Nektar Xama, Jakob Raymaekers, Martin Andraud, Jhon Gomez, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen
2020 B conf
Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing.
ETS
Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen
2020 J jnl
Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations.
ACM Trans. Design Autom. Electr. Syst.
Nektar Xama, Martin Andraud, Jhon Gomez, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen
2020 Misc conf
Pinhole Latent Defect Modeling and Simulation for Defect-Oriented Analog/Mixed-Signal Testing.
VTS
Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen
2020 A conf
Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs.
ITC
Stephen Sunter, Michal Wolinski, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Nektar Xama, Jhon Gomez, Georges G. E. Gielen
2019 A conf
Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs.
ITC
Wim Dobbelaere, Frederik Colle, Anthony Coyette, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen
2018 J jnl
ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal Integrated Circuits.
IEEE Des. Test
Anthony Coyette, Baris Esen, Nektar Xama, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren
2018 J jnl
An Automated Low-Cost Analog and Mixed-Signal DfT Method Using Testing Diodes.
IEEE Des. Test
Baris Esen, Anthony Coyette, Nektar Xama, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren
2018 C conf
Methodology Towards Sub-ppm Testing of Analog and Mixed-Signal ICs for Cyber-Physical Systems.
ISCAS
Georges G. E. Gielen, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Nektar Xama
2017 B conf
A very low cost and highly parallel DfT method for analog and mixed-signal circuits.
ETS
Baris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen
2017 B conf
Automatic testing of analog ICs for latent defects using topology modification.
ETS
Nektar Xama, Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen
2017 A conf
Non-intrusive detection of defects in mixed-signal integrated circuits using light activation.
ITC
Baris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen
2016 A conf
Analog fault coverage improvement using final-test dynamic part average testing.
ITC
Wim Dobbelaere, Ronny Vanhooren, Willy De Man, Koen Matthijs, Anthony Coyette, Baris Esen, Georges G. E. Gielen
2016 J jnl
Automatic generation of test infrastructures for analog integrated circuits by controllability and observability co-optimization.
Integr.
Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen
2016 A conf
Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis.
ITC
Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen
2016 A conf
Effective DC fault models and testing approach for open defects in analog circuits.
ITC
Baris Esen, Anthony Coyette, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren
2015 Misc conf
Automated testing of mixed-signal integrated circuits by topology modification.
VTS
Anthony Coyette, Baris Esen, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen
2015 B conf
Automatic generation of autonomous built-in observability structures for analog circuits.
ETS
Anthony Coyette, Baris Esen, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen
2014 A conf
Design and test of analog circuits towards sub-ppm level.
ITC
Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Baris Esen
2014 B conf
Optimization of analog fault coverage by exploiting defect-specific masking.
ETS
Anthony Coyette, Georges G. E. Gielen, Ronny Vanhooren, Wim Dobbelaere
2014 A conf
Practical random sampling of potential defects for analog fault simulation.
ITC
Stephen Sunter, Krzysztof Jurga, Peter Dingenen, Ronny Vanhooren
2009 C conf
Comparison of different test strategies on a mixed-signal circuit.
DDECS
Juraj Brenkus, Viera Stopjaková, Ronny Vanhooren, Anton Chichkov