Rongfen Gong

12 papers Journal 12
YearRankTypeTitle / Venue / Authors
2025 J jnl
FS-SSDD: A Few-shot Steel Surface Defect Detection Network.
Signal Image Video Process.
Guanghu Liu, Maoxiang Chu, Rongfen Gong, Peinan Zong
2025 J jnl
Global attention module and cascade fusion network for steel surface defect detection.
Pattern Recognit.
Guanghu Liu, Maoxiang Chu, Rongfen Gong, Zehao Zheng
2025 J jnl
HRC-Deeplab: Improved Deeplabv3+ for Semantic Segmentation of Road Traffic Markings.
Signal Image Video Process.
Haiyang Sun, Rongfen Gong, Maoxiang Chu, Yaobang Wang
2025 J jnl
Semi-SSDDet: An adaptive semi-supervised steel surface defect detection.
Signal Image Video Process.
Guanghu Liu, Maoxiang Chu, Rongfen Gong
2025 J jnl
TSAFM-Net: template-based spatial deformation perception alignment and feature vector matching network for PCB component detection.
Signal Image Video Process.
Zhihan Sun, Rongfen Gong, Maoxiang Chu, Guanghu Liu
2024 J jnl
Simpler large margin distribution machine via weighted linear loss for large-scale classification.
Int. J. Mach. Learn. Cybern.
Maoxiang Chu, Liming Liu, Ling Liu, Rongfen Gong
2023 J jnl
Nonparallel Support Vector Machine with L2-norm Loss and its DCD-type Solver.
Neural Process. Lett.
Liming Liu, Ping Li, Maoxiang Chu, Rongfen Gong
2021 J jnl
An Improved Nonparallel Support Vector Machine.
IEEE Trans. Neural Networks Learn. Syst.
Liming Liu, Maoxiang Chu, Rongfen Gong, Li Zhang
2020 J jnl
A nonparallel support vector machine with pinball loss for pattern classification.
J. Intell. Fuzzy Syst.
Liming Liu, Maoxiang Chu, Rongfen Gong, Xinyu Qi
2020 J jnl
Nonparallel support vector machine with large margin distribution for pattern classification.
Pattern Recognit.
Liming Liu, Maoxiang Chu, Rongfen Gong, Yongcheng Peng
2020 J jnl
Twin support vector machine based on adjustable large margin distribution for pattern classification.
Int. J. Mach. Learn. Cybern.
Liming Liu, Maoxiang Chu, Yonghui Yang, Rongfen Gong
2018 J jnl
Twin Support Vector Machine With Local Structural Information for Pattern Classification.
IEEE Access
Maoxiang Chu, Liming Liu, Yonghui Yang, Rongfen Gong