| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2018 | J | jnl |
IEEE Access
|
| 2018 | C | conf |
CoDIT
|
| 2014 | J | jnl |
Ind. Manag. Data Syst.
|
| 2014 | B | conf |
SMC
|
| 2013 | B | conf |
SMC
|
| 2012 | Misc | conf |
Identifying ill tool combinations via Gibbs sampler for semiconductor manufacturing yield diagnosis.
WSC
|
| 2012 | Misc | conf |
WSC
|
| 2012 | — | conf |
CASE
|
| 2011 | B | conf |
SMC
|
| 2011 | J | jnl |
Ind. Manag. Data Syst.
|
| 2010 | J | jnl |
Ind. Manag. Data Syst.
|
| 2007 | J | jnl |
Ind. Manag. Data Syst.
|