Ronald J. W. T. Tangelder

11 papers A 1Journal 5Unranked 5
YearRankTypeTitle / Venue / Authors
2002 J jnl
An Implementation for Test-Time Reduction in VLIW Transport-Triggered Architectures.
J. Electron. Test.
V. A. Zivkovic, Ronald J. W. T. Tangelder, Hans G. Kerkhoff
2001 — conf
An implementation for test-time reduction in VLIW transport-triggered architectures.
ETW
V. A. Zivkovic, Ronald J. W. T. Tangelder, Hans G. Kerkhoff
2001 J jnl
Modeling a Verification Test System for Mixed-Signal Circuits.
IEEE Des. Test Comput.
David San Segundo Bello, Ronald J. W. T. Tangelder, Hans G. Kerkhoff
2000 A conf
Design and Test Space Exploration of Transport-Triggered Architectures.
DATE
V. A. Zivkovic, Ronald J. W. T. Tangelder, Hans G. Kerkhoff
2000 — conf
The Test-Cycle Minimization in Parameterized Bus-Oriented Datapath Designs.
LATW
V. A. Zivkovic, Ronald J. W. T. Tangelder, H. G. Herkhoff
1999 J jnl
Integrated Design and Test of Mixed-Signal Circuits.
J. Electron. Test.
Nur Engin, Hans G. Kerkhoff, Ronald J. W. T. Tangelder, Han Speek
1999 J jnl
Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach.
J. Electron. Test.
Chris Feige, Jan Ten Pierick, Clemens Wouters, Ronald J. W. T. Tangelder, Hans G. Kerkhoff
1999 J jnl
Off-Chip Diagnosis of Aperture Jitter in Full-Flash Analog-to-Digital Converters.
J. Electron. Test.
Richard Rosing, Hans G. Kerkhoff, Ronald J. W. T. Tangelder, Manoj Sachdev
1999 — conf
Practical implementation of defect-oriented testing for a mixed-signal class-D amplifier.
ETW
R. H. Beurze, Y. Xing, R. van Kleef, Ronald J. W. T. Tangelder, Nur Engin
1997 — conf
Smart sensor system application: an integrated compass.
ED&TC
Ronald J. W. T. Tangelder, G. Diemel, Hans G. Kerkhoff
1996 — conf
MISMATCH: a basis for semi-automatic functional mixed-signal test-pattern generation.
ICECS
Hans G. Kerkhoff, Ronald J. W. T. Tangelder, Han Speek, Nur Engin