Ron Press

13 papers A 3C 1Misc 1Journal 4Unranked 4
YearRankTypeTitle / Venue / Authors
2024 A conf
Short Paper: Bus-based Packetized Scan Architecture Trade-offs for Heterogeneous Multi-Core SoCs.
ITC
Hiroyuki Iwata, Mahmoud AbdAlwahab, Ron Press, Ohki Sugiura
2017 — conf
Automotive IC On-line Test Techniques and the Application of Deterministic ATPG-Based Runtime Test.
ATS
Yoichi Maeda, Jun Matsushima, Ron Press
2016 J jnl
ITC and the Future of Test - We've Won.
IEEE Des. Test
Ron Press, Li-C. Wang
2010 A ed.
2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010
ITC
Ron Press, Erik H. Volkerink
2010 J jnl
The ABCs of ITC.
IEEE Des. Test Comput.
Ron Press, Erik H. Volkerink
2009 — conf
Scan Compression Implementation in Industrial Design - Case Study.
Asian Test Symposium
Dragon Hsu, Ron Press
2007 J jnl
Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality
CoRR
Matthias Beck, Olivier Barondeau, Martin Kaibel, Frank Poehl, Xijiang Lin, Ron Press
2006 — conf
Mentor Graphics DFT to Navigate Nanometer Test Challenges.
ATS
Greg Aldrich, Ron Press, Takeo Kobayashi, Tatsuo Sakajiri
2006 C conf
The Demand and Practical Approach for 100x Test Compression.
VLSI-SoC
Ron Press, Jay Jahangiri
2005 — conf
Achieving High Test Quality with Reduced Pin Count Testing.
Asian Test Symposium
Jay Jahangiri, Nilanjan Mukherjee, Wu-Tung Cheng, Subramanian Mahadevan, Ron Press
2005 A conf
Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality.
DATE
Matthias Beck, Olivier Barondeau, Martin Kaibel, Frank Poehl, Xijiang Lin, Ron Press
2005 Misc conf
Measures to Improve Delay Fault Testing on Low-Cost Testers - A Case Study.
VTS
Matthias Beck, Olivier Barondeau, Frank Poehl, Xijiang Lin, Ron Press
2003 J jnl
High-Frequency, At-Speed Scan Testing.
IEEE Des. Test Comput.
Xijiang Lin, Ron Press, Janusz Rajski, Paul Reuter, Thomas Rinderknecht, Bruce Swanson, Nagesh Tamarapalli