Romain Laffont

12 papers C 1Journal 4Unranked 7
YearRankTypeTitle / Venue / Authors
2014 — conf
Effect of AC stress on oxide TDDB and trapped charge in interface states.
ISIC
Benjamin Rebuffat, Pascal Masson, Jean-Luc Ogier, Marc Mantelli, Romain Laffont
2013 — conf
DCG-FGT transistor: Retention study of Floating Gate charge.
MWSCAS
Abderrezak Marzaki, V. Bidal, Romain Laffont, Wenceslas Rahajandraibe, Jean-Michel Portal, Rachid Bouchakour
2013 — conf
Effect of ions presence in the SiOCH inter metal dielectric structure.
ESSDERC
Benjamin Rebuffat, Vincenzo Della Marca, Pascal Masson, Jean-Luc Ogier, Marc Mantelli, Olivier Paulet, Laurent Lopez, Romain Laffont
2012 — conf
A new adustable Schmitt Trigger based on Dual Control Gate-Floating Gate Transistor (DCG-FGT).
MWSCAS
Abderrezak Marzaki, V. Bidal, Romain Laffont, Wenceslas Rahajandraibe, Jean-Michel Portal, Rachid Bouchakour
2012 J jnl
Investigation of the effects of constant voltage stress on thin SiO
Microelectron. Reliab.
Philippe Chiquet, Pascal Masson, Romain Laffont, Gilles Micolau, Jérémy Postel-Pellerin, Frédéric Lalande, Bernard Bouteille, Jean-Luc Ogier
2012 — conf
PSP based DCG-FGT transistor Model: Full characterization procedure.
ISCIT
Abderrezak Marzaki, V. Bidal, Romain Laffont, Wenceslas Rahajandraibe, Jean-Michel Portal, Rachid Bouchakour
2011 — conf
PSP based DCG-FGT transistor model including characterization procedure.
ICECS
Abderrezak Marzaki, V. Bidal, Romain Laffont, Wenceslas Rahajandraibe, Jean-Michel Portal, Rachid Bouchakour
2010 J jnl
Leakage paths identification in NVM using biased data retention.
Microelectron. Reliab.
Jérémy Postel-Pellerin, Romain Laffont, Gilles Micolau, Frédéric Lalande, Arnaud Régnier, Bernard Bouteille
2009 J jnl
A Modelisation of the temperature dependence of the Fowler-Nordheim current in EEPROM memories.
Microelectron. Reliab.
M. Roca, Romain Laffont, Gilles Micolau, Frédéric Lalande, O. Pizzuto
2007 J jnl
A new method to quantify retention-failed cells of an EEPROM CAST.
Microelectron. Reliab.
Claire Le Roux, Laurent Lopez, Abdellatif Firiti, Jean-Luc Ogier, Frédéric Lalande, Romain Laffont, Gilles Micolau
2006 C conf
MM11 based flash memory cell model including characterization procedure.
ISCAS
B. Saillet, Arnaud Régnier, Jean-Michel Portal, B. Delsuc, Romain Laffont, Pascal Masson, Rachid Bouchakour
2002 — conf
Decreasing EEPROM Programming Bias With Negative Voltage, Reliability Impact.
MTDT
Romain Laffont, J. Razafindramora, Pierre Canet, Rachid Bouchakour, Jean-Michel Mirabel