Romain Desplats

28 papers A 1Journal 27
YearRankTypeTitle / Venue / Authors
2006 J jnl
Descrambling and data reading techniques for flash-EEPROM memories. Application to smart cards.
Microelectron. Reliab.
Christophe De Nardi, Romain Desplats, Philippe Perdu, Jean-Luc Gauffier, Christophe Guérin
2005 J jnl
Dynamic Laser Stimulation Case Studies.
Microelectron. Reliab.
Felix Beaudoin, Kevin Sanchez, Romain Desplats, Philippe Perdu, Jean Marc Nicot, J. P. Roux, M. Otte
2005 J jnl
Failure analysis of micro-heating elements suspended on thin membranes.
Microelectron. Reliab.
Danick Briand, Felix Beaudoin, Jérôme Courbat, Nico F. de Rooij, Romain Desplats, Philippe Perdu
2005 J jnl
Light Emission to Time Resolved Emission For IC Debug and Failure Analysis.
Microelectron. Reliab.
Mustapha Remmach, A. Pigozzi, Romain Desplats, Philippe Perdu, Dean Lewis, J. Noel, Sylvain Dudit
2005 J jnl
NIR laser stimulation for dynamic timing analysis.
Microelectron. Reliab.
Kevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, Dean Lewis
2005 J jnl
Oxide charge measurements in EEPROM devices.
Microelectron. Reliab.
C. De Nardi, Romain Desplats, Philippe Perdu, Felix Beaudoin, J.-L. Gauffier
2004 J jnl
Automated Diagnosis and Probing Flow for Fast Fault Localization in IC.
Microelectron. Reliab.
D. Martin, Romain Desplats, Gérald Haller, Pascal Nouet, Florence Azaïs
2004 J jnl
Femtosecond Laser Ablation for Backside Silicon Thinning.
Microelectron. Reliab.
Felix Beaudoin, J. López, M. Faucon, Romain Desplats, Philippe Perdu
2004 J jnl
Implementation of TRE systems into Emission Microscopes.
Microelectron. Reliab.
Alberto Tosi, Mustapha Remmach, Romain Desplats, Franco Zappa, Philippe Perdu
2004 J jnl
Investigation of SEU sensitivity of Xilinx Virtex II FPGA by pulsed laser fault injections.
Microelectron. Reliab.
Romain Desplats, S. Petit, Sana Rezgui, Carl Carmichael, Pascal Fouillat, Dean Lewis
2004 J jnl
Light Emission From Small Technologies. Are Silicon Based Detectors Reaching Their Limits?
Microelectron. Reliab.
Mustapha Remmach, Romain Desplats, Philippe Perdu, J. P. Roux, Michel Vallet, Sylvain Dudit, P. Sardin, Dean Lewis
2004 J jnl
Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems.
Microelectron. Reliab.
Olivier Crépel, Patrick Poirier, Philippe Descamps, Romain Desplats, Philippe Perdu, Gérald Haller, Abdellatif Firiti
2004 J jnl
Time Resolved Photon Emission Processing Flow for IC Analysis.
Microelectron. Reliab.
Romain Desplats, Gaël Faggion, Mustapha Remmach, Felix Beaudoin, Philippe Perdu, Dean Lewis
2003 J jnl
Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling.
Microelectron. Reliab.
Romain Desplats, A. Eral, Felix Beaudoin, Philippe Perdu, Alan J. Weger, Moyra K. McManus, Peilin Song, Franco Stellari
2003 A conf
Fault Localization using Time Resolved Photon Emission and STIL Waveforms.
ITC
Romain Desplats, Felix Beaudoin, Philippe Perdu, Nagamani Nataraj, Ted R. Lundquist, Ketan Shah
2003 J jnl
From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing.
Microelectron. Reliab.
Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, Gérald Haller, Vincent Pouget, Dean Lewis
2003 J jnl
Magnetic emission mapping for passive integrated components characterisation.
Microelectron. Reliab.
Olivier Crépel, Romain Desplats, Y. Bouttement, Philippe Perdu, C. Goupil, Philippe Descamps, Felix Beaudoin, L. Marina
2003 J jnl
Solar Cell Analysis with Light Emission and OBIC Techniques.
Microelectron. Reliab.
Kevin Sanchez, Romain Desplats, Guy Perez, V. Pichetto, Felix Beaudoin, Philippe Perdu
2003 J jnl
Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization.
Microelectron. Reliab.
Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, Marise Bafleur, David Trémouilles
2003 J jnl
Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations.
Microelectron. Reliab.
Mustapha Remmach, Romain Desplats, Felix Beaudoin, E. Frances, Philippe Perdu, Dean Lewis
2002 J jnl
Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices.
Microelectron. Reliab.
Felix Beaudoin, D. Carisetti, Romain Desplats, Philippe Perdu, Dean Lewis, J. C. Clement
2002 J jnl
Backside Hot Spot Detection Using Liquid Crystal Microscopy.
Microelectron. Reliab.
Olivier Crépel, Felix Beaudoin, Lionel Dantas de Morais, Gérald Haller, C. Goupil, Philippe Perdu, Romain Desplats, Dean Lewis
2002 J jnl
IR confocal laser microscopy for MEMS Technological Evaluation.
Microelectron. Reliab.
Djemel Lellouchi, Felix Beaudoin, Christophe Le Touze, Philippe Perdu, Romain Desplats
2002 J jnl
Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased.
Microelectron. Reliab.
Felix Beaudoin, Gérald Haller, Philippe Perdu, Romain Desplats, Thomas Beauchêne, Dean Lewis
2001 J jnl
A New Versatile Testing Interface for Failure Analysis in Integrated Circuits.
Microelectron. Reliab.
Romain Desplats, Philippe Perdu, Felix Beaudoin
2001 J jnl
Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation.
Microelectron. Reliab.
Romain Desplats, Felix Beaudoin, Philippe Perdu, Patrick Poirier, David Trémouilles, Marise Bafleur, Dean Lewis
2001 J jnl
Modeling Thermal Laser Stimulation.
Microelectron. Reliab.
Felix Beaudoin, X. Chauffleur, Jean-Pierre Fradin, Philippe Perdu, Romain Desplats, Dean Lewis
2001 J jnl
Silicon Thinning and Polishing on Packaged Devices.
Microelectron. Reliab.
Felix Beaudoin, Philippe Perdu, Romain Desplats, Sebastien Rigo, Dean Lewis