Rock-Hyun Baek

29 papers Journal 27Unranked 2

Year	Rank	Type	Title / Venue / Authors
2025	J	`jnl`	Analysis of Bias Temperature Instability in Peripheral CMOS Devices for Low-Temperature Memory Applications. IEEE Access Jung Rae Cho, Seungwon Go, Jingyu Park, Tae Jun Yang, Seonhaeng Lee, Namhyun Lee, Dong Keun Lee, Yoon Kim, Myounggon Kang, Rock-Hyun Baek, Changhyun Kim, Sangwan Kim, Dae Hwan Kim
2025	J	`jnl`	Machine Learning-Driven Extraction of Hybrid Compact Models Integrating Neural Networks and Berkeley Short-Channel Insulated-Gate Field-Effect Transistor Model-Common Multigate for Multidevice Applications. Adv. Intell. Syst. Seungjoon Eom, Seunghwan Lee, Hyeok Yun, Kyeongrae Cho, Soomin Kim, Rock-Hyun Baek
2025	J	`jnl`	Patterned Multi-Wall Nanosheet FETs for Sustainable Scaling: Zero Gate Extension With Minimal Gate Cut Width. IEEE Access Sanguk Lee, Jinsu Jeong, Jongseo Park, Seunghwan Lee, Junjong Lee, Yonghwan Ahn, Minchan Kim, Rock-Hyun Baek
2024	J	`jnl`	Cryogenic Body Bias Effect in DRAM Peripheral and Buried-Channel-Array Transistor for Quantum Computing Applications. IEEE Access Hyunseo You, Kihoon Nam, Jehyun An, Chanyang Park, Donghyun Kim, Seonhaeng Lee, Namhyun Lee, Rock-Hyun Baek
2024	J	`jnl`	Current-Voltage Modeling of DRAM Cell Transistor Using Genetic Algorithm and Deep Learning. IEEE Access Jun Hui Park, Jung Nam Kim, Seonhaeng Lee, Gang-Jun Kim, Namhyun Lee, Rock-Hyun Baek, Dae Hwan Kim, Changhyun Kim, Myounggon Kang, Yoon Kim
2024	J	`jnl`	FEOL Monolithic Co-Integration of FeFET and CMOS on 8-Inch Wafer Using Laser Spike Annealing With Implementation of an FeFET Inverter. IEEE Access Bohyeon Kang, Jehyun An, Jongseo Park, Giryun Hong, Beomjoo Ham, Jaeseong Pyo, Sung-Min Ahn, Rock-Hyun Baek
2024	J	`jnl`	Multi-Task Learning for Real-Time BSIM-CMG Parameter Extraction of NSFETs With Multiple Structural Variations. IEEE Access Seunghwan Lee, Seungjoon Eom, Jinsu Jeong, Junjong Lee, Sanguk Lee, Hyeok Yun, Yonghwan Ahn, Rock-Hyun Baek
2024	J	`jnl`	Neural Compact Modeling Framework for Flexible Model Parameter Selection with High Accuracy and Fast SPICE Simulation. Adv. Intell. Syst. Seungjoon Eom, Hyeok Yun, Hyundong Jang, Kyeongrae Cho, Seunghwan Lee, Jinsu Jeong, Rock-Hyun Baek
2024	J	`jnl`	Nonlinear Variation Decomposition of Neural Networks for Holistic Semiconductor Process Monitoring. Adv. Intell. Syst. Hyeok Yun, Hyundong Jang, Seunghwan Lee, Junjong Lee, Kyeongrae Cho, Seungjoon Eom, Soomin Kim, Choong-Ki Kim, Hong-Chul Byun, Seongjoo Han, Min-Soo Yoo, Rock-Hyun Baek
2023	J	`jnl`	Accurate Prediction and Reliable Parameter Optimization of Neural Network for Semiconductor Process Monitoring and Technology Development. Adv. Intell. Syst. Hyeok Yun, Chang-Hyeon An, Hyundong Jang, Kyeongrae Cho, Jeong-Sik Lee, Seungjoon Eom, Choong-Ki Kim, Min-Soo Yoo, Hyun-Chul Choi, Rock-Hyun Baek
2023	J	`jnl`	Curing Process on Passivation Layer for Backside-Illuminated CMOS Image Sensor Application. IEEE Access Jongseo Park, Kyeong-Keun Choi, Jehyun An, Bohyeon Kang, Hyeonseo You, Giryun Hong, Sung-Min Ahn, Rock-Hyun Baek
2023	—	`conf`	Front-side and Back-side Power Delivery Network Guidelines for 2nm node High Perf Computing and Mobile SoC applications. VLSI Technology and Circuits J. Lee, J. Jeong, S. Lee, J. Lim, S. C. Song, Shashank Ekbote, Nick Stevens-Yu, David Greenlaw, Rock-Hyun Baek
2023	J	`jnl`	Holistic Optimization of Trap Distribution for Performance/Reliability in 3-D NAND Flash Using Machine Learning. IEEE Access Kihoon Nam, Chanyang Park, Hyeok Yun, Jun-Sik Yoon, Hyundong Jang, Kyeongrae Cho, Min Sang Park, Hyun-Chul Choi, Rock-Hyun Baek
2023	J	`jnl`	Modeling of 3D NAND Characteristics for Cross-Temperature by Using Graph Neural Network and Its Application. Adv. Intell. Syst. Kyeongrae Cho, Jeong-Sik Lee, Chanyang Park, Hyeok Yun, Hyundong Jang, Seungjoon Eom, Min Sang Park, Hyun-Chul Choi, Rock-Hyun Baek
2022	J	`jnl`	A Review of Multi-Modal Learning from the Text-Guided Visual Processing Viewpoint. Sensors Ubaid Ullah, Jeong-Sik Lee, Chang-Hyeon An, Hyeonjin Lee, Su-Yeong Park, Rock-Hyun Baek, Hyun-Chul Choi
2022	J	`jnl`	Arbitrary Font Generation by Encoder Learning of Disentangled Features. Sensors Jeong-Sik Lee, Rock-Hyun Baek, Hyun-Chul Choi
2022	J	`jnl`	DC Performance Variations by Grain Boundary in Source/Drain Epitaxy of Sub-3-nm Nanosheet Field-Effect Transistors. IEEE Access Jun-Sik Yoon, Jinsu Jeong, Seunghwan Lee, Junjong Lee, Sanguk Lee, Jaewan Lim, Rock-Hyun Baek
2022	J	`jnl`	Extraction of Device Structural Parameters Through DC/AC Performance Using an MLP Neural Network Algorithm. IEEE Access Hyundong Jang, Hyeok Yun, Chanyang Park, Kyeongrae Cho, Kihoon Nam, Jun-Sik Yoon, Hyun-Chul Choi, Rock-Hyun Baek
2021	J	`jnl`	Analysis of TSV-Induced Mechanical Stress and Electrical Noise Coupling in Sub 5-nm Node Nanosheet FETs for Heterogeneous 3D-ICs. IEEE Access Jinsu Jeong, Jun-Sik Yoon, Rock-Hyun Baek
2021	J	`jnl`	Digital/Analog Performance Optimization of Vertical Nanowire FETs Using Machine Learning. IEEE Access Jun-Sik Yoon, Seunghwan Lee, Hyeok Yun, Rock-Hyun Baek
2021	J	`jnl`	Monolithic 3D 6T-SRAM Based on Newly Designed Gate and Source/Drain Bottom Contact Schemes. IEEE Access Junjong Lee, Jun-Sik Yoon, Jinsu Jeong, Seunghwan Lee, Sanguk Lee, Rock-Hyun Baek
2020	J	`jnl`	A Novel Sub-5-nm Node Dual-Workfunction Folded Cascode Nanosheet FETs for Low Power Mobile Applications. IEEE Access Jun-Sik Yoon, Rock-Hyun Baek
2020	J	`jnl`	Comprehensive Analysis of Source and Drain Recess Depth Variations on Silicon Nanosheet FETs for Sub 5-nm Node SoC Application. IEEE Access Jinsu Jeong, Jun-Sik Yoon, Seunghwan Lee, Rock-Hyun Baek
2020	J	`jnl`	Device Design Guideline of 5-nm-Node FinFETs and Nanosheet FETs for Analog/RF Applications. IEEE Access Jun-Sik Yoon, Rock-Hyun Baek
2020	J	`jnl`	Neural Approach for Modeling and Optimizing Si-MOSFET Manufacturing. IEEE Access Hyun-Chul Choi, Hyeok Yun, Jun-Sik Yoon, Rock-Hyun Baek
2019	J	`jnl`	Bottom Oxide Bulk FinFETs Without Punch-Through-Stopper for Extending Toward 5-nm Node. IEEE Access Jun-Sik Yoon, Jinsu Jeong, Seunghwan Lee, Rock-Hyun Baek
2019	J	`jnl`	Punch-Through-Stopper Free Nanosheet FETs With Crescent Inner-Spacer and Isolated Source/Drain. IEEE Access Jun-Sik Yoon, Jinsu Jeong, Seunghwan Lee, Rock-Hyun Baek
2019	J	`jnl`	Source/Drain Patterning FinFETs as Solution for Physical Area Scaling Toward 5-nm Node. IEEE Access Jun-Sik Yoon, Seunghwan Lee, Junjong Lee, Jinsu Jeong, Hyeok Yun, Bohyeon Kang, Rock-Hyun Baek
2018	—	`conf`	Experimental Verification of a Simple, Intuitive, and Accurate Closed-Form Transfer Function Model for Diverse High-Speed Interconnects. ISOCC Kyunghyun Lim, Minsoo Choi, Myat Thu Linn Aung, Kyunghwan Kim, Ji-Seong Kim, Rock-Hyun Baek, Ho-Jin Song, Tony Tae-Hyoung Kim, Byungsub Kim