Robert Madge

24 papers A* 1A 16Misc 4Journal 3
YearRankTypeTitle / Venue / Authors
2007 A* conf
Making Manufacturing Work For You.
DAC
Srikanth Venkataraman, Ruchir Puri, Steve Griffith, Ankush Oberai, Robert Madge, Greg Yeric, Walter Ng, Yervant Zorian
2005 A conf
Data-driven models for statistical testing: measurements, estimates and residuals.
ITC
W. Robert Daasch, Robert Madge
2005 Misc conf
Defect Screening Using Independent Component Analysis on I_DDQ.
VTS
Ritesh P. Turakhia, Brady Benware, Robert Madge, Thaddeus T. Shannon, W. Robert Daasch
2005 A conf
Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis.
ITC
Chris Schuermyer, Kevin Cota, Robert Madge, Brady Benware
2005 J jnl
New test paradigms for yield and manufacturability.
IEEE Des. Test Comput.
Robert Madge
2005 A conf
The value of statistical testing for quality, yield and test cost improvement.
ITC
Robert Madge, Brady Benware, Mark Ward, W. Robert Daasch
2005 A conf
Variance reduction and outliers: statistical analysis of semiconductor test data.
ITC
W. Robert Daasch, Robert Madge
2004 A conf
ATE Data Collection - A comprehensive requirements proposal to maximize ROI of test.
ITC
Manu Rehani, David Abercrombie, Robert Madge, Jim Teisher, Jason Saw
2004 A conf
ATE Value Add through Open Data Collection.
ITC
Robert Madge
2004 A conf
Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model.
ITC
Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski
2004 Misc conf
Detection of Temperature Sensitive Defects Using ZTC.
VTS
Ethan Long, W. Robert Daasch, Robert Madge, Brady Benware
2004 A conf
In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost.
ITC
Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler
2004 A conf
New Test Paradigms for Yield and Manufacturability.
ITC
Robert Madge
2003 A conf
Creating Value Through Test.
DATE
Erik Jan Marinissen, Bart Vermeulen, Robert Madge, Michael Kessler, Michael Müller
2003 Misc conf
Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs.
VTS
Brady Benware, Robert Madge, Cam Lu, W. Robert Daasch
2003 A conf
Impact of Multiple-Detect Test Patterns on Product Quality.
ITC
Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski
2003 J jnl
Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs.
IEEE Des. Test Comput.
Robert Madge, Brady Benware, W. Robert Daasch
2003 A conf
Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ.
ITC
Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning
2002 A conf
Isolating and Removing Sources of Variation in Test Data.
ITC
David Turner, David Abercrombie, James McNames, W. Robert Daasch, Robert Madge
2002 A conf
Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data.
ITC
W. Robert Daasch, Kevin Cota, James McNames, Robert Madge
2002 J jnl
Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort.
IEEE Des. Test Comput.
W. Robert Daasch, James McNames, Robert Madge, Kevin Cota
2002 A conf
Screening MinVDD Outliers Using Feed-Forward Voltage Testing.
ITC
Robert Madge, B. H. Goh, V. Rajagopalan, C. Macchietto, W. Robert Daasch, Chris Schuermyer, C. Taylor, David Turner
2002 Misc conf
Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies.
VTS
Robert Madge, Manu Rehani, Kevin Cota, W. Robert Daasch
2001 A conf
Neighbor selection for variance reduction in I_DDQ and other parametric data.
ITC
W. Robert Daasch, Kevin Cota, James McNames, Robert Madge