Robert C. Aitken

91 papers A* 1A 43C 3Misc 6Journal 19Unranked 18

Year	Rank	Type	Title / Venue / Authors
2022	—	`conf`	Towards efficient processing of latency-sensitive serverless DAGs at the edge. EdgeSys@EuroSys Xiaosu Lyu, Ludmila Cherkasova, Robert C. Aitken, Gabriel Parmer, Timothy Wood
2019	J	`jnl`	56th Design Automation Conference Report. IEEE Des. Test Robert C. Aitken
2016	—	`conf`	A 400mV active VMIN, 200mV retention VMIN, 2.8 GHz 64Kb SRAM with a 0.09 um VLSI Circuits Azeez Bhavnagarwala, Imran Iqbal, An Nguyen, David Ondricek, Vikas Chandra, Robert C. Aitken
2016	J	`jnl`	Predicting future complementary metal-oxide-semiconductor technology - challenges and approaches. IET Comput. Digit. Tech. Robert C. Aitken, Vikas Chandra, Brian Cline, Shidhartha Das, David Pietromonaco, Lucian Shifren, Saurabh Sinha, Greg Yeric
2015	—	`conf`	Circuit design perspectives for Ge FinFET at 10nm and beyond. ISQED Saurabh Sinha, Lucian Shifren, Vikas Chandra, Brian Cline, Greg Yeric, Robert C. Aitken, Bingjie Cheng, Andrew R. Brown, Craig Riddet, C. Alexandar, Campbell Millar, Asen Asenov
2015	—	`conf`	Session 12 - Tutorial - beyond CMOS: Large area electronics-concepts and prospects. CICC Robert C. Aitken, Tetsuya Iizuka
2014	J	`jnl`	BTI-Gater: An Aging-Resilient Clock Gating Methodology. IEEE J. Emerg. Sel. Topics Circuits Syst. Liangzhen Lai, Vikas Chandra, Robert C. Aitken, Puneet Gupta
2014	C	`conf`	DFM is dead - Long live DFM. ICCD Robert C. Aitken, David Pietromonaco, Brian Cline
2014	—	`conf`	Modeling SRAM dynamic VMIN. ICICDT James Boley, Benton H. Calhoun, Vikas Chandra, Robert C. Aitken
2014	—	`conf`	Physical design and FinFETs. ISPD Robert C. Aitken, Greg Yeric, Brian Cline, Saurabh Sinha, Lucian Shifren, Imran Iqbal, Vikas Chandra
2014	J	`jnl`	SlackProbe: A Flexible and Efficient In Situ Timing Slack Monitoring Methodology. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Liangzhen Lai, Vikas Chandra, Robert C. Aitken, Puneet Gupta
2014	J	`jnl`	Time-Borrowing Circuit Designs and Hardware Prototyping for Timing Error Resilience. IEEE Trans. Computers Mihir R. Choudhury, Vikas Chandra, Robert C. Aitken, Kartik Mohanram
2013	A	`conf`	Leveraging sensitivity analysis for fast, accurate estimation of SRAM dynamic write V DATE James Boley, Vikas Chandra, Robert C. Aitken, Benton H. Calhoun
2013	A	`conf`	Reliability analysis reloaded: how will we survive? DATE Robert C. Aitken, Görschwin Fey, Zbigniew T. Kalbarczyk, Frank Reichenbach, Matteo Sonza Reorda
2013	A	`conf`	SlackProbe: a low overhead in situ on-line timing slack monitoring methodology. DATE Liangzhen Lai, Vikas Chandra, Robert C. Aitken, Puneet Gupta
2012	A	`conf`	An adaptive write word-line pulse width and voltage modulation architecture for bit-interleaved 8T SRAMs. ISLPED Daeyeon Kim, Vikas Chandra, Robert C. Aitken, David T. Blaauw, Dennis Sylvester
2012	A	`conf`	Panel: going green across communications and storage systems: control of power in non-mobile devices. ISLPED Kenneth Wagner, Martin St. Laurent, Robert C. Aitken, Hugh Barrass, Randall Robinson
2011	A	`conf`	Analytical model for SRAM dynamic write-ability degradation due to gate oxide breakdown. DATE Vikas Chandra, Robert C. Aitken
2011	A	`conf`	Dynamic write limited minimum operating voltage for nanoscale SRAMs. DATE Satyanand Nalam, Vikas Chandra, Robert C. Aitken, Benton H. Calhoun
2011	—	`conf`	On the impact of gate oxide degradation on SRAM dynamic and static write-ability. ASP-DAC Vikas Chandra, Robert C. Aitken
2011	A	`conf`	Variation-aware static and dynamic writability analysis for voltage-scaled bit-interleaved 8-T SRAMs. ISLPED Daeyeon Kim, Vikas Chandra, Robert C. Aitken, David T. Blaauw, Dennis Sylvester
2010	A	`conf`	A black box method for stability analysis of arbitrary SRAM cell structures. DATE Michael Wieckowski, Dennis Sylvester, David T. Blaauw, Vikas Chandra, Sachin Idgunji, Cezary Pietrzyk, Robert C. Aitken
2010	A	`conf`	Analytical model for TDDB-based performance degradation in combinational logic. DATE Mihir R. Choudhury, Vikas Chandra, Kartik Mohanram, Robert C. Aitken
2010	—	`conf`	Asymmetric 6T SRAM with two-phase write and split bitline differential sensing for low voltage operation. ISQED Satyanand Nalam, Vikas Chandra, Cezary Pietrzyk, Robert C. Aitken, Benton H. Calhoun
2010	A	`conf`	Modeling the impact of process variation on resistive bridge defects. ITC S. Saqib Khursheed, Shida Zhong, Robert C. Aitken, Bashir M. Al-Hashimi, Sandip Kundu
2010	A	`conf`	On the efficacy of write-assist techniques in low voltage nanoscale SRAMs. DATE Vikas Chandra, Cezary Pietrzyk, Robert C. Aitken
2010	A	`conf`	TIMBER: Time borrowing and error relaying for online timing error resilience. DATE Mihir R. Choudhury, Vikas Chandra, Kartik Mohanram, Robert C. Aitken
2010	A*	`conf`	Who solves the variability problem? DAC Nagaraj Ns, Juan C. Rey, Jamil Kawa, Robert C. Aitken, Christian Lütkemeyer, Vijay Pitchumani, Andrzej J. Strojwas, Steve Trimberger
2009	Misc	`conf`	DFX and Productivity. VLSI Design Robert C. Aitken
2009	A	`conf`	Impact of voltage scaling on nanoscale SRAM reliability. DATE Vikas Chandra, Robert C. Aitken
2009	—	`conf`	The challenges of correlating silicon and models in high variability CMOS processes. ISPD Robert C. Aitken
2008	—	`conf`	Impact of Technology and Voltage Scaling on the Soft Error Susceptibility in Nanoscale CMOS. DFT Vikas Chandra, Robert C. Aitken
2008	A	`conf`	Panel Session - Caution Ahead: The Road to Design and Manufacturing at 32 and 22 nm. DATE S. Turnoy, Peter Wintermayr, Robert C. Aitken, Rudy Lauwereins, J. Tracy Weed, V. Kiefer, J. Hartmann
2007	A	`conf`	DFM/DFY: should you trust the surgeon or the family doctor? DATE Marco Casale-Rossi, Andrzej J. Strojwas, Robert C. Aitken, Antun Domic, Carlo Guardiani, Philippe Magarshack, Douglas Pattullo, Joseph Sawicki
2007	—	`conf`	Defect or Variation? Characterizing Standard Cell Behavior at 90nm and below. ISQED Robert C. Aitken
2007	J	`jnl`	Guest Editorial: Special Section on "Autonomous Silicon Validation and Testing of Microprocessors and Microprocessor-Based Systems". IEEE Trans. Very Large Scale Integr. Syst. Dimitris Gizopoulos, Robert C. Aitken, Sandip Kundu
2007	—	`book`	Low Power Methodology Manual - for System-on-Chip Design. Michael Keating, David Flynn, Robert C. Aitken, Alan Gibbons, Kaijian Shi
2007	—	`conf`	Test Roles in Diagnosis and Silicon Debug. ATS Anis Uzzaman, Fidel Muradali, Takashi Aikyo, Robert C. Aitken, Tom Jackson, Rajesh Galivanche, Takeshi Onodera
2007	A	`conf`	Worst-case design and margin for embedded SRAM. DATE Robert C. Aitken, Sachin Idgunji
2006	—	`conf`	DFM Metrics for Standard Cells. ISQED Robert C. Aitken
2006	A	`conf`	Low-power design tools: are EDA vendors taking this matter seriously? DATE Enrico Macii, Massoud Pedram, Dirk Friebel, Robert C. Aitken, Antun Domic, Roberto Zafalon
2006	C	`conf`	Reliability Issues for Embedded SRAM at 90nm and Below. IOLTS Robert C. Aitken
2006	A	`conf`	The Design and Validation of IP for DFM/DFY Assurance. ITC Robert C. Aitken
2005	—	`conf`	ESD implementation strategies. CICC Mike Zachariah, Robert C. Aitken
2005	J	`jnl`	ITC is Cool. IEEE Des. Test Comput. Robert C. Aitken
2005	C	`conf`	Modeling Soft-Error Susceptibility for IP Blocks. IOLTS Robert C. Aitken, Betina Hold
2005	—	`conf`	Noise and reliability containment approaches. CICC Gordon W. Roberts, Robert C. Aitken
2004	A	`conf`	A Modular Wrapper Enabling High Speed BIST and Repair for Small Wide Memories. ITC Robert C. Aitken
2004	A	`conf`	From Working Design Flow to Working Chips: Dependencies and Impacts of Methodology Decisions. DATE Robert C. Aitken, Fidel Muradali
2004	—	`conf`	Redundancy & It's Not Just for Defects Anymore. MTDT Robert C. Aitken
2003	—	`conf`	Applying Defect-Based Test to Embedded Memories in a COT Model. MTDT Robert C. Aitken
2003	A	`conf`	DFM: The Real 90nm Hurdle. ITC Robert C. Aitken
2003	J	`jnl`	Guest editorial - testing and verification of communication system-on-chip devices. IEEE Commun. Mag. Dimitris Gizopoulos, Robert C. Aitken
2003	J	`jnl`	ITC 2003: Breaking Test Interface Bottlenecks. IEEE Des. Test Comput. Robert C. Aitken, Gordon W. Roberts
2003	J	`jnl`	ITC Highlights. IEEE Des. Test Comput. Gordon W. Roberts, Robert C. Aitken
2003	A	`conf`	Silicon IP And Successful DFM. ITC Robert C. Aitken
2002	J	`jnl`	Guest Editors' Introduction: Stressing the Fundamentals. IEEE Des. Test Comput. Robert C. Aitken, Donald L. Wheater
2002	—	`conf`	Test Generation and Fault Modeling for Stress Testing (invited). ISQED Robert C. Aitken
2002	Misc	`conf`	Wireless Test. VTS Robert C. Aitken, Mustapha Slamani, H. Ding, William R. Eisenstadt, Sanghoon Choi, John McLaughlin
2000	A	`conf`	Current ratios: a self-scaling technique for production IDDQ testing. ITC Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman
1999	A	`conf`	Current ratios: a self-scaling technique for production I_DDQ testing. ITC Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman
1999	Misc	`conf`	Extending the Pseudo-Stuck-At Fault Model to Provide Complete IDDQ Coverage. VTS Robert C. Aitken
1999	A	`conf`	It Makes Sense to Combine DFT and DFR/DFY. ITC Robert C. Aitken
1999	J	`jnl`	Nanometer Technology Effects on Fault Models for IC Testing. Computer Robert C. Aitken
1999	A	`conf`	Trends in SLI design and their effect on test. ITC Robert C. Aitken, Fidel Muradali
1998	A	`conf`	How will CAD handle billion-transistor systems? (panel). ICCAD Robert C. Aitken, Jason Cong, Randy Harr, Kenneth L. Shepard, Wayne H. Wolf
1998	A	`conf`	On-chip versus off-chip test: an artificial dichotomy. ITC Robert C. Aitken
1997	Misc	`conf`	An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. VTS Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken
1997	J	`jnl`	Modeling the Unmodelable: Algorithmic Fault Diagnosis. IEEE Des. Test Comput. Robert C. Aitken
1997	Misc	`conf`	Power Dissipation During Testing: Should We Worry About it? VTS Vishwani D. Agrawal, Robert C. Aitken, J. Braden, Joan Figueras, S. Kumar, Hans-Joachim Wunderlich, Yervant Zorian
1997	A	`conf`	So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. ITC Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly
1996	A	`conf`	I ITC Peter C. Maxwell, Robert C. Aitken, Kathleen R. Kollitz, Allen C. Brown
1996	A	`conf`	Modelling the Unmodellable: Algorithmic Fault Diagnosis. ITC Robert C. Aitken
1996	Misc	`conf`	Volume Manufacturing - ICs and Boards: DFT to the Rescue? VTS Robert C. Aitken, J. Hutcheson, N. Murthy, Phil Nigh, Nicholas Sporck
1996	J	`jnl`	When tools cry wolf: Testability pitfalls of synthesized designs. IEEE Des. Test Comput. Robert C. Aitken
1995	J	`jnl`	An Overview of Test Synthesis Tools. IEEE Des. Test Comput. Robert C. Aitken
1995	A	`conf`	Finding Defects with Fault Models. ITC Robert C. Aitken
1994	A	`conf`	The Effect on Quality of Non-Uniform Fault Coverage and Fault Probability. ITC Peter C. Maxwell, Robert C. Aitken, Leendert M. Huisman
1993	A	`conf`	BP-1992 A Comparison of Defect Models for Fault Location with I ITC Robert C. Aitken
1993	A	`conf`	Biased Voting: A Method for Simulating CMOS Bridging Faults in the Presence of Variable Gate Logic. ITC Peter C. Maxwell, Robert C. Aitken
1993	J	`jnl`	Test Sets and Reject Rates: All Fault Coverages are Not Created Equal. IEEE Des. Test Comput. Peter C. Maxwell, Robert C. Aitken
1992	A	`conf`	A Comparison of Defect Models for Fault Location with I ITC Robert C. Aitken
1992	J	`jnl`	Diagnosis of leakage faults with IDDQ. J. Electron. Test. Robert C. Aitken
1992	J	`jnl`	IDDQ testing as a component of a test suite: The need for several fault coverage metrics. J. Electron. Test. Peter C. Maxwell, Robert C. Aitken
1992	A	`conf`	The Effectiveness of I ITC Peter C. Maxwell, Robert C. Aitken, Vic Johansen, Inshen Chiang
1992	J	`jnl`	Using an asymmetric error model to study aliasing in signature analysis registers. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Dhiren Xavier, Robert C. Aitken, André Ivanov, Vinod K. Agarwal
1991	A	`conf`	Fault Location with Current Monitoring. ITC Robert C. Aitken
1991	A	`conf`	The Effect of Different Test Sets on Quality Level Prediction: When is 80% better than 90%? ITC Peter C. Maxwell, Robert C. Aitken, Vic Johansen, Inshen Chiang
1989	A	`conf`	: Experiments on Aliasing in Signature Analysis Registers. ITC Dhiren Xavier, Robert C. Aitken, André Ivanov, Vinod K. Agarwal
1989	A	`conf`	A diagnosis method using pseudo-random vectors without intermediate signatures. ICCAD Robert C. Aitken, Vinod K. Agarwal
1988	A	`conf`	Aliasing probability of non-exhaustive randomized syndrome tests. ICCAD Robert C. Aitken, Vinod K. Agarwal