Robbert van Herpen

12 papers C 5Journal 4Unranked 3
YearRankTypeTitle / Venue / Authors
2016 J jnl
Bi-Orthonormal Polynomial Basis Function Framework With Applications in System Identification.
IEEE Trans. Autom. Control.
Robbert van Herpen, Okko H. Bosgra, Tom Oomen
2014 J jnl
Connecting System Identification and Robust Control for Next-Generation Motion Control of a Wafer Stage.
IEEE Trans. Control. Syst. Technol.
Tom Oomen, Robbert van Herpen, Sander Quist, Marc M. J. van de Wal, Okko H. Bosgra, Maarten Steinbuch
2014 C conf
Exploiting additional actuators and sensors for nano-positioning robust motion control.
ACC
Robbert van Herpen, Tom Oomen, Edward Kikken, Marc M. J. van de Wal, Wouter H. T. M. Aangenent, Maarten Steinbuch
2014 J jnl
Optimally conditioned instrumental variable approach for frequency-domain system identification.
Autom.
Robbert van Herpen, Tom Oomen, Maarten Steinbuch
2013 C conf
Enhancing performance through multivariable weighting function design in ℋ- loop-shaping: with application to a motion system.
ACC
Frank Boeren, Robbert van Herpen, Tom Oomen, Marc M. J. van de Wal, Okko H. Bosgra
2012 — conf
Bi-orthonormal basis functions for improved frequency-domain system identification.
CDC
Robbert van Herpen, Tom Oomen, Okko H. Bosgra
2012 C conf
Next-generation wafer stage motion control: Connecting system identification and robust control.
ACC
Tom Oomen, Robbert van Herpen, Sander Quist, Marc M. J. van de Wal, Okko H. Bosgra, Maarten Steinbuch
2011 C conf
A robust-control-relevant perspective on model order selection.
ACC
Robbert van Herpen, Tom Oomen, Okko H. Bosgra
2011 — conf
Inferential motion control: Identification and robust control with unmeasured performance variables.
CDC/ECC
Tom Oomen, Erik Grassens, Ferdinand Hendriks, Robbert van Herpen, Okko H. Bosgra
2010 C conf
Experimental evaluation of robust-control-relevance: A confrontation with a next-generation wafer stage.
ACC
Robbert van Herpen, Tom Oomen, Marc M. J. van de Wal, Okko H. Bosgra
2010 — conf
Identification and visualization of robust-control-relevant model sets with application to an industrial wafer stage.
CDC
Tom Oomen, Sander Quist, Robbert van Herpen, Okko H. Bosgra
2009 J jnl
SISO-Closed-Loop Identifikation: Eine Toolbox für den Einsatz in der industriellen Praxis (SISO-Closed-Loop Identification: A Toolbox Ready-to-Use in Industrial Practice).
Autom.
Markus Koitka, Olaf Kahrs, Robbert van Herpen, Veit Hagenmeyer