Rita Fung

11 papers Journal 1Unranked 10
YearRankTypeTitle / Venue / Authors
2024 — conf
Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems.
IRPS
Nicholas J. Pieper, M. Chun, Yoni Xiong, H. M. Dattilo, Jenna B. Kronenberg, Sanghyeon Baeg, Shi-Jie Wen, Rita Fung, D. Chan, C. Escobar, Bharat L. Bhuva
2022 — conf
Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment.
IRPS
Yoni Xiong, Alexandra Feeley, Nicholas J. Pieper, Dennis R. Ball, Balaji Narasimham, John Brockman, N. A. Dodds, S. A. Wender, Shi-Jie Wen, Rita Fung, Bharat L. Bhuva
2021 — conf
Effects of Temperature and Supply Voltage on Soft Errors for 7-nm Bulk FinFET Technology.
IRPS
Alexandra Feeley, Yoni Xiong, Bharat L. Bhuva, Balaji Narasimham, Shi-Ji Wen, Rita Fung
2021 — conf
Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node.
IRPS
Yoni Xiong, Alexandra Feeley, Lloyd W. Massengill, Bharat L. Bhuva, Shi-Jie Wen, Rita Fung
2020 — conf
High-Current State triggered by Operating-Frequency Change.
IRPS
Lyuan Xu, Jingchen Cao, Shi-Jie Wen, Rita Fung, Jamie Markevitch, Dennis R. Ball, Bharat L. Bhuva
2020 — conf
Temperature Dependence of Single-Event Transient Pulse Widths for 7-nm Bulk FinFET Technology.
IRPS
Jingchen Cao, Lyuan Xu, Shi-Jie Wen, Rita Fung, Balaji Narasimham, Lloyd W. Massengill, Bharat L. Bhuva
2020 — conf
Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node.
IRPS
Lyuan Xu, Jingchen Cao, John Brockman, Carlo Cazzaniga, Christopher Frost, Shi-Jie Wen, Rita Fung, Bharat L. Bhuva
2020 — conf
Using Partial Duplication With Compare to Detect Radiation-Induced Failure in a Commercial FPGA-Based Networking System.
IRPS
Andrew M. Keller, Jared Anderson, Michael J. Wirthlin, Shi-Jie Wen, Rita Fung, Conner Chambers
2015 — conf
Analysis of advanced circuits for SET measurement.
IRPS
Rui Liu, Adrian Evans, Qiong Wu, Yuanqing Li, Li Chen, Shi-Jie Wen, Rick Wong, Rita Fung
2014 J jnl
Single Event Resilient Dynamic Logic Designs.
J. Electron. Test.
Haibin Wang, Mulong Li, Li Chen, Rui Liu, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Rita Fung, Jinshun Bi
2013 — conf
Networking industry trends in ESD protection for high speed IOs.
ASICON
Richard Wong, Rita Fung, Shi-Jie Wen