Rihito Kuroda - RankMe

37 papers Journal 12Unranked 25

Year	Rank	Type	Title / Venue / Authors
2024	J	`jnl`	A 134×132 4-Tap CMOS Indirect Time-of-Flight Range Imager Using In-Pixel Memory Array With 10 Kfps High-Speed Mode and High Precision Mode. IEEE J. Solid State Circuits Chia-Chi Kuo, Rihito Kuroda
2022	—	`conf`	A 4-Tap CMOS Time-of-Flight Image Sensor with In-pixel Analog Memory Array Achieving 10Kfps High-Speed Range Imaging and Depth Precision Enhancement. VLSI Technology and Circuits Chia-Chi Kuo, Rihito Kuroda
2022	J	`jnl`	Two High-Precision Proximity Capacitance CMOS Image Sensors with Large Format and High Resolution. Sensors Yuki Sugama, Yoshiaki Watanabe, Rihito Kuroda, Masahiro Yamamoto, Tetsuya Goto, Toshiro Yasuda, Hiroshi Hamori, Naoya Kuriyama, Shigetoshi Sugawa
2021	—	`conf`	A Proposal of Analog Correlated Multiple Sampling with High Density Capacitors for Low Noise CMOS Image Sensors. Imaging Sensors and Systems Shunta Kamoshita, Manabu Suzuki, Rihito Kuroda, Shigetoshi Sugawa
2020	J	`jnl`	An Optical Filter-Less CMOS Image Sensor with Differential Spectral Response Pixels for Simultaneous UV-Selective and Visible Imaging. Sensors Yhang Ricardo Sipauba Carvalho da Silva, Rihito Kuroda, Shigetoshi Sugawa
2020	—	`conf`	An Over 120dB Dynamic Range Linear Response Single Exposure CMOS Image Sensor with Two-stage Lateral Overflow Integration Trench Capacitors. Imaging Sensors and Systems Yasuyuki Fujihara, Maasa Murata, Shota Nakayama, Rihito Kuroda, Shigetoshi Sugawa
2020	—	`conf`	Effect of Drain-to-Source Voltage on Random Telegraph Noise Based on Statistical Analysis of MOSFETs with Various Gate Shapes. IRPS Ryo Akimoto, Rihito Kuroda, Akinobu Teramoto, Takezo Mawaki, Shinya Ichino, Tomoyuki Suwa, Shigetoshi Sugawa
2020	J	`jnl`	Over 100 Million Frames per Second 368 Frames Global Shutter Burst CMOS Image Sensor with Pixel-wise Trench Capacitor Memory Array. Sensors Manabu Suzuki, Yuki Sugama, Rihito Kuroda, Shigetoshi Sugawa
2019	J	`jnl`	A Highly Robust Silicon Ultraviolet Selective Radiation Sensor Using Differential Spectral Response Method. Sensors Yhang Ricardo Sipauba Carvalho da Silva, Rihito Kuroda, Shigetoshi Sugawa
2018	—	`conf`	A Preliminary Chip Evaluation toward Over 50Mfps Burst Global Shutter Stacked CMOS Image Sensor. IMSE Manabu Suzuki, Masashi Suzuki, Rihito Kuroda, Shigetoshi Sugawa
2018	J	`jnl`	High Speed and Narrow-Bandpass Liquid Crystal Filter for Real-Time Multi Spectral Imaging Systems. IEICE Trans. Electron. Kohei Terashima, Kazuhiro Wako, Yasuyuki Fujihara, Yusuke Aoyagi, Maasa Murata, Yosei Shibata, Shigetoshi Sugawa, Takahiro Ishinabe, Rihito Kuroda, Hideo Fujikake
2017	—	`conf`	High Sensitivity and High Readout Speed Electron Beam Detector using Steep pn Junction Si diode for Low Acceleration Voltage. IMSE Yasumasa Koda, Rihito Kuroda, Masaya Hara, Hiroyuki Tsunoda, Shigetoshi Sugawa
2016	—	`conf`	190-1100 nm Waveband multispectral imaging system using high light resistance wide dynamic range CMOS image sensor. IEEE SENSORS Yasuyuki Fujihara, Satoshi Nasuno, Shunichi Wakashima, Yusuke Aoyagi, Rihito Kuroda, Shigetoshi Sugawa
2016	—	`conf`	A dead-time free global shutter CMOS image sensor with in-pixel LOFIC and ADC using pixel-wis e connections. VLSI Circuits Hidetake Sugo, Shunichi Wakashima, Rihito Kuroda, Yuichiro Yamashita, Hirofumi Sumi, Tzu-Jui Wang, Po-Sheng Chou, Ming-Chieh Hsu, Shigetoshi Sugawa
2016	—	`conf`	A high sensitivity compact gas concentration sensor using UV light and charge amplifier circuit. IEEE SENSORS Hidekazu Ishii, Masaaki Nagase, Nobukazu Ikeda, Yoshinobu Shiba, Yasuyuki Shirai, Rihito Kuroda, Shigetoshi Sugawa
2015	—	`conf`	A linear response single exposure CMOS image sensor with 0.5e VLSIC Shunichi Wakashima, Fumiaki Kusuhara, Rihito Kuroda, Shigetoshi Sugawa
2015	—	`conf`	Analysis of pixel gain and linearity of CMOS image sensor using floating capacitor load readout operation. IMSE Shunichi Wakashima, Fumiaki Kusuhara, Rihito Kuroda, Shigetoshi Sugawa
2014	—	`conf`	A 1024×1 linear photodiode array sensor with fast readout speed flexible pixel-level integration time and high stability to UV light exposure. IMSE Takahiro Akutsu, Shun Kawada, Yasumasa Koda, Taiki Nakazawa, Rihito Kuroda, Shigetoshi Sugawa
2014	—	`conf`	A statistical evaluation of effective time constants of random telegraph noise with various operation timings of in-pixel source follower transistors. IMSE A. Yonezawa, Rihito Kuroda, Akinobu Teramoto, T. Obara, Shigetoshi Sugawa
2014	—	`conf`	Pixel structure with 10 nsec fully charge transfer time for the 20m frame per second burst CMOS image sensor. IMSE Ken Miyauchi, Tohru Takeda, K. Hanzawa, Yasuhisa Tochigi, S. Sakai, Rihito Kuroda, H. Tominaga, R. Hirose, K. Takubo, Y. Kondo, Shigetoshi Sugawa
2014	J	`jnl`	Si image sensors with wide spectral response and high robustness to ultraviolet light exposure. IEICE Electron. Express Rihito Kuroda, Shigetoshi Sugawa
2014	—	`conf`	Ultra-high speed video capturing of time dependent dielectric breakdown of metal-oxide-silicon capacitor up to 10M frame per second. IMSE Fan Shao, Daiki Kimoto, Kiichi Furukawa, Hidetake Sugo, Tohru Takeda, Ken Miyauchi, Yasuhisa Tochigi, Rihito Kuroda, Shigetoshi Sugawa
2013	—	`conf`	A CMOS image sensor using floating capacitor load readout operation. Sensors, Cameras, and Systems for Industrial and Scientific Applications Shunichi Wakashima, Y. Goda, T. L. Li, Rihito Kuroda, Shigetoshi Sugawa
2013	J	`jnl`	A Global-Shutter CMOS Image Sensor With Readout Speed of 1-Tpixel/s Burst and 780-Mpixel/s Continuous. IEEE J. Solid State Circuits Yasuhisa Tochigi, Katsuhiko Hanzawa, Yuri Kato, Rihito Kuroda, Hideki Mutoh, Ryuta Hirose, Hideki Tominaga, Kenji Takubo, Yasushi Kondo, Shigetoshi Sugawa
2013	—	`conf`	A UV Si-photodiode with almost 100% internal Q.E. and high transmittance on-chip multilayer dielectric stack. Sensors, Cameras, and Systems for Industrial and Scientific Applications Yasumasa Koda, Rihito Kuroda, Taiki Nakazawa, Y. Nakao, Shigetoshi Sugawa
2013	—	`conf`	A statistical evaluation of low frequency noise of in-pixel source follower-equivalent transistors with various channel types and body bias. Sensors, Cameras, and Systems for Industrial and Scientific Applications Rihito Kuroda, A. Yonezawa, Akinobu Teramoto, T. L. Li, Yasuhisa Tochigi, Shigetoshi Sugawa
2013	—	`conf`	Color reproductivity improvement with additional virtual color filters for WRGB image sensor. Color Imaging: Displaying, Processing, Hardcopy, and Applications Shun Kawada, Rihito Kuroda, Shigetoshi Sugawa
2013	—	`conf`	New analog readout architecture for low noise CMOS image sensors using column-parallel forward noise-canceling circuitry. Sensors, Cameras, and Systems for Industrial and Scientific Applications Tsung-Ling Li, Yasuyuki Goda, Shunichi Wakashima, Rihito Kuroda, Shigetoshi Sugawa
2012	—	`conf`	A global-shutter CMOS image sensor with readout speed of 1Tpixel/s burst and 780Mpixel/s continuous. ISSCC Yasuhisa Tochigi, Katsuhiko Hanzawa, Yuri Kato, Rihito Kuroda, Hideki Mutoh, Ryuta Hirose, Hideki Tominaga, Kenji Takubo, Yasushi Kondo, Shigetoshi Sugawa
2012	—	`conf`	Photodiode dopant structure with atomically flat Si surface for high-sensitivity and stability to UV light. Sensors, Cameras, and Systems for Industrial and Scientific Applications Taiki Nakazawa, Rihito Kuroda, Yasumasa Koda, Shigetoshi Sugawa
2011	—	`conf`	A prototype high-speed CMOS image sensor with 10, 000, 000 fps burst-frame rate and 10, 000 fps continuous-frame rate. Digital Photography Yasuhisa Tochigi, Katsuhiko Hanzawa, Yuri Kato, Nana Akahane, Rihito Kuroda, Shigetoshi Sugawa
2011	—	`conf`	A robust color signal processing with wide dynamic range WRGB CMOS image sensor. Digital Photography Shun Kawada, Rihito Kuroda, Shigetoshi Sugawa
2009	—	`conf`	A pixel-shared CMOS image sensor using lateral overflow gate. ESSCIRC Shin Sakai, Yoshiaki Tashiro, Nana Akahane, Rihito Kuroda, Koichi Mizobuchi, Shigetoshi Sugawa
2009	J	`jnl`	Data Analysis Technique of Atomic Force Microscopy for Atomically Flat Silicon Surfaces. IEICE Trans. Electron. Masahiro Konda, Akinobu Teramoto, Tomoyuki Suwa, Rihito Kuroda, Tadahiro Ohmi
2008	J	`jnl`	Accurate negative bias temperature instability lifetime prediction based on hole injection. Microelectron. Reliab. Akinobu Teramoto, Rihito Kuroda, Shigetoshi Sugawa, Tadahiro Ohmi
2007	J	`jnl`	Circuit level prediction of device performance degradation due to negative bias temperature stress. Microelectron. Reliab. Rihito Kuroda, Akinobu Teramoto, Kazufumi Watanabe, Michihiko Mifuji, Takahisa Yamaha, Shigetoshi Sugawa, Tadahiro Ohmi
2007	J	`jnl`	Examination of degradation mechanism due to negative bias temperature stress from a perspective of hole energy for accurate lifetime prediction. Microelectron. Reliab. Kazufumi Watanabe, Akinobu Teramoto, Rihito Kuroda, Shigetoshi Sugawa, Tadahiro Ohmi