Richard Wong

26 papers C 2Journal 17Unranked 7
YearRankTypeTitle / Venue / Authors
2026 J jnl
Arc Detection and Severity Analysis for Plasma Etching Processes.
IEEE Access
Doochan Ko, Daniel Jin Hun Kim, Richard Wong, Inwhee Joe
2025 J jnl
Enhancing Maritime Data Integration for Platform Services With Sequence-to-Sequence Models and Statistical Refinement.
IEEE Access
Hyoseong Hwang, Richard Wong, Ducsun Lim, Jonggu Kang, Inwhee Joe
2023 J jnl
Dynamic access control method for SDP-based network environments.
EURASIP J. Wirel. Commun. Netw.
Hyunjin You, Doochan Ko, Daniel Kim, Richard Wong, Inwhee Joe
2020 J jnl
A Distributed Testbed for 5G Scenarios: An Experimental Study.
Sensors
Mohammad Kazem Chamran, Kok-Lim Alvin Yau, Rafidah Md. Noor, Richard Wong
2019 J jnl
A Fully Integrated Digital LDO With Built-In Adaptive Sampling and Active Voltage Positioning Using a Beat-Frequency Quantizer.
IEEE J. Solid State Circuits
Somnath Kundu, Muqing Liu, Shi-Jie Wen, Richard Wong, Chris H. Kim
2019 — conf
Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies.
IRPS
Jingchen Cao, Lyuan Xu, Bharat L. Bhuva, Shi-Jie Wen, Richard Wong, Balaji Narasimham, Lloyd W. Massengill
2019 — conf
Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology.
IRPS
Lyuan Xu, Jingchen Cao, Bharat L. Bhuva, Indranil Chatterjee, Shi-Jie Wen, Richard Wong, Lloyd W. Massengill
2018 — conf
A fully integrated 40pF output capacitor beat-frequency-quantizer-based digital LDO with built-in adaptive sampling and active voltage positioning.
ISSCC
Somnath Kundu, Muqing Liu, Richard Wong, Shi-Jie Wen, Chris H. Kim
2018 J jnl
Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree.
Microelectron. Reliab.
Yuanqing Li, Li Chen, Issam Nofal, Mo Chen, Haibin Wang, Rui Liu, Qingyu Chen, Milos Krstic, Shuting Shi, Gang Guo, Sang H. Baeg, Shi-Jie Wen, Richard Wong
2018 — conf
Single-event effects on optical transceiver.
IRPS
Kurt J. Lezon, Shi-Jie Wen, Y.-F. Dan, Richard Wong, Bharat L. Bhuva
2018 J jnl
Study of proton radiation effect to row hammer fault in DDR4 SDRAMs.
Microelectron. Reliab.
Chul Seung Lim, Kyungbae Park, GeunYong Bak, Donghyuk Yun, Myungsang Park, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong
2017 C conf
BPPT - Bulk potential protection technique for hardened sequentials.
IOLTS
Issam Nofal, Adrian Evans, Anlin He, Gang Guo, Yuanqing Li, Li Chen, Rui Liu, Haibin Wang, Mo Chen, Sang H. Baeg, Shi-Jie Wen, Richard Wong
2015 — conf
Logic soft error study with 800-MHz DDR3 SDRAMs in 3x nm using proton and neutron beams.
IRPS
GeunYong Bak, Soonyoung Lee, Hosung Lee, Kyungbae Park, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Charlie Slayman
2014 J jnl
Single Event Resilient Dynamic Logic Designs.
J. Electron. Test.
Haibin Wang, Mulong Li, Li Chen, Rui Liu, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Rita Fung, Jinshun Bi
2014 J jnl
Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser.
J. Electron. Test.
Yi Ren, Anlin He, Shuting Shi, Gang Guo, Li Chen, Shi-Jie Wen, Richard Wong, N. W. van Vonno, Bharat L. Bhuva
2013 J jnl
Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller.
J. Electron. Test.
Yi Ren, Shuting Shi, Li Chen, Haibin Wang, L.-J. Gao, Gang Guo, Shi-Jie Wen, Richard Wong, N. W. van Vonno
2013 — conf
Networking industry trends in ESD protection for high speed IOs.
ASICON
Richard Wong, Rita Fung, Shi-Jie Wen
2013 J jnl
Soft error tolerant Content Addressable Memories (CAMs) using error detection codes and duplication.
Microprocess. Microsystems
Juan Antonio Maestro, Pedro Reviriego, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong
2012 J jnl
Performance, Metastability, and Soft-Error Robustness Trade-offs for Flip-Flops in 40 nm CMOS.
IEEE Trans. Circuits Syst. I Regul. Pap.
David Rennie, David Li, Manoj Sachdev, Bharat L. Bhuva, Srikanth Jagannathan, Shi-Jie Wen, Richard Wong
2012 J jnl
Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter.
J. Electron. Test.
Yi Ren, L. Fan, Li Chen, Shi-Jie Wen, Richard Wong, N. W. van Vonno, Arthur F. Witulski, Bharat L. Bhuva
2011 J jnl
Design and Analysis of Low-Voltage Low-Parasitic ESD Protection for RF ICs in CMOS.
IEEE J. Solid State Circuits
Jian Liu, Xin Wang, Hui Zhao, Qiang Fang, Albert Z. Wang, Lin Lin, He Tang, Siqiang Fan, Bin Zhao, Shi-Jie Wen, Richard Wong
2011 — conf
Design method of NOR-type comparison circuit in CAM with ground bounce noise considerations.
ISQED
Changmin Jung, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong
2011 J jnl
Mitigating the effects of large multiple cell upsets (MCUs) in memories.
ACM Trans. Design Autom. Electr. Syst.
Juan Antonio Maestro, Pedro Reviriego, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong
2010 J jnl
Minimizing Soft Errors in TCAM Devices: A Probabilistic Approach to Determining Scrubbing Intervals.
IEEE Trans. Circuits Syst. I Regul. Pap.
Sanghyeon Baeg, Shi-Jie Wen, Richard Wong
2008 C conf
Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node.
IOLTS
Damien Leroy, Rémi Gaillard, Erwin Schäfer, Cyrille Beltrando, Shi-Jie Wen, Richard Wong
1998 J jnl
A parallel sort-balance mutual range-join algorithm on hypercube computers.
Microprocess. Microsystems
Richard Wong, Rodney W. Topor, Hong Shen