Richard Perdriau

21 papers A 1C 1Misc 1Journal 12Unranked 6
YearRankTypeTitle / Venue / Authors
2026 J jnl
A Comprehensive Review of Multiband Electromagnetic Metasurface Structures for Absorption and Wave Manipulation Applications.
IEEE Access
Abhishek Arya, Mohsen Koohestani, Thomas Schlinquer, Richard Perdriau
2025 J jnl
Evaluating formal model verification tools in an industrial context: the case of a smart device life cycle management system.
Softw. Syst. Model.
Maxime Méré, Frédéric Jouault, Loïc Pallardy, Richard Perdriau
2025 J jnl
Relaxation Parameter Optimization in Electrical-to-Mechanical Co-Simulation Based on Time Windowing WR Technique.
IEEE Access
Md. Moktarul Alam, Richard Perdriau, Mohammed Ramdani, Mohsen Koohestani
2024 — conf
A Case Study for the EMC Co-Simulation of Injection Path Model Using WR Method.
EMC Compo
Md. Moktarul Alam, Richard Perdriau, Mohammed Ramdani, Mohsen Koohestani
2024 J jnl
Improvements proposed to noisy-OR derivatives for multi-causal analysis: A case study of simultaneous electromagnetic disturbances.
Int. J. Approx. Reason.
Lokesh Devaraj, Qazi Mashaal Khan, Alastair R. Ruddle, Alistair P. Duffy, Richard Perdriau, Mohsen Koohestani
2022 J jnl
Experimental Characterization of Multitone EM Immunity of Integrated Oscillators Under Thermal Stress.
IEEE Access
Qazi Mashaal Khan, Lokesh Devaraj, Richard Perdriau, Alastair R. Ruddle, Tim Claeys, Mohamed Ramdani, Mohsen Koohestani
2022 A conf
Feedback on the formal verification of UML models in an industrial context: the case of a smart device life cycle management system.
MoDELS
Maxime Méré, Frédéric Jouault, Loïc Pallardy, Richard Perdriau
2022 — conf
Modeling Trust Relationships in Blockchain Applications: The Case of Reconfigurable Systems-on-Chip.
QRS Companion
Maxime Méré, Frédéric Jouault, Loïc Pallardy, Richard Perdriau
2022 — conf
Trustworthy SoC Reconfiguration Aimed at Product-Service Systems: a Literature Review.
COINS
Maxime Méré, Frédéric Jouault, Loïc Pallardy, Richard Perdriau
2020 J jnl
Impact of Field Polarization on Radiated Emission Characterization in an Open TEM Cell.
IEEE Trans. Instrum. Meas.
Mohsen Koohestani, Mohamed Ramdani, Frédéric Lafon, Antonio A. Moreira, Richard Perdriau
2015 — conf
Direct power injection on functional and non-functional signals of SPI EEPROM memories.
EMC Compo
Mohammed Amellall, Sjoerd Op't Land, Richard Perdriau, Mohammed Ramdani, Ali Ahaitouf, M'hamed Drissi
2013 — conf
Kron simulation of field-to-line coupling using a meshed and a modified Taylor cell.
EMC Compo
Sjoerd Op't Land, Richard Perdriau, Mohammed Ramdani, Olivier Maurice, M'hamed Drissi
2012 J jnl
Electrical modeling of the sensitivity to misalignments of a class-E based inductive transcutaneous link.
Microelectron. J.
Mondher Chaoui, Richard Perdriau, Hamadi Ghariani, Mongi Lahiani
2010 J jnl
Immunity Modeling of Integrated Circuits: An Industrial Case.
IEICE Trans. Commun.
Frédéric Lafon, François de Daran, Mohammed Ramdani, Richard Perdriau, M'hamed Drissi
2009 J jnl
A comprehensive simulation model for immunity prediction in integrated circuits with respect to substrate injection.
Microelectron. J.
Ali Alaeldine, Richard Perdriau, Ali Haidar
2008 J jnl
Comparison among emission and susceptibility reduction techniques for electromagnetic interference in digital integrated circuits.
Microelectron. J.
Ali Alaeldine, Nicolas Lacrampe, Alexandre Boyer, Richard Perdriau, Fabrice Caignet, Mohammed Ramdani, Etienne Sicard, M'hamed Drissi
2005 — conf
Electrical modeling of inductive links for high-efficiency energy transmission.
ICECS
Mondher Chaoui, Hamadi Ghariani, Mongi Lahiani, Richard Perdriau, Mohammed Ramdani, Fayçal Sellami
2004 J jnl
An EMC-oriented VHDL-AMS simulation methodology for dynamic current activity assessment.
Microelectron. J.
Richard Perdriau, Mohammed Ramdani, Jean-Luc Levant, Eric Tinlot, Anne-Marie Trullemans-Anckaert
2004 C conf
Early Prediction of Conducted-Mode Emission of complex IC's.
FDL
Anne-Marie Trullemans-Anckaert, Richard Perdriau, Mohammed Ramdani, Jean-Luc Levant
2004 J jnl
ICEM modelling of microcontroller current activity.
Microelectron. J.
Jean-Luc Levant, Mohammed Ramdani, Richard Perdriau
2002 Misc conf
Acoustic velocity measurements in the air by means of Laser Doppler Velocimetry: Cramér-Rao Bounds and Maximum Likelihood Estimation.
ICASSP
Alain Le Duff, Guy Plantier, Jean-Christophe Valière, Richard Perdriau