Ricardo A. Maronna

15 papers Journal 14
YearRankTypeTitle / Venue / Authors
2022 J jnl
Robust Model-Based Clustering.
J. Data Sci. Stat. Vis.
Juan Domingo Gonzalez, Ricardo A. Maronna, Victor J. Yohai, Ruben H. Zamar
2018 J jnl
Discussion of "The power of monitoring: how to make the most of a contaminated multivariate sample" by Andrea Cerioli, Marco Riani, Anthony C. Atkinson and Aldo Corbellini.
Stat. Methods Appl.
Ricardo A. Maronna, Victor J. Yohai
2017 J jnl
Robust and efficient estimation of multivariate scatter and location.
Comput. Stat. Data Anal.
Ricardo A. Maronna, Victor J. Yohai
2015 J jnl
High finite-sample efficiency and robustness based on distance-constrained maximum likelihood.
Comput. Stat. Data Anal.
Ricardo A. Maronna, Victor J. Yohai
2015 J jnl
Robust nonlinear principal components.
Stat. Comput.
Ricardo A. Maronna, Fernanda Méndez, Victor J. Yohai
2013 J jnl
Robust functional linear regression based on splines.
Comput. Stat. Data Anal.
Ricardo A. Maronna, Victor J. Yohai
2011 J jnl
Estimates of MM type for the multivariate linear model.
J. Multivar. Anal.
Nadia L. Kudraszow, Ricardo A. Maronna
2011 J jnl
Robust Ridge Regression for High-Dimensional Data.
Technometrics
Ricardo A. Maronna
2011 — ch.
Robust Statistical Methods.
International Encyclopedia of Statistical Science
Ricardo A. Maronna
2010 J jnl
Correcting MM estimates for "fat" data sets.
Comput. Stat. Data Anal.
Ricardo A. Maronna, Victor J. Yohai
2009 J jnl
Data reconciliation and gross error diagnosis based on regression.
Comput. Chem. Eng.
Ricardo A. Maronna, Jorge Arcas
2008 J jnl
Outlier identification in high dimensions.
Comput. Stat. Data Anal.
Peter Filzmoser, Ricardo A. Maronna, Mark Werner
2008 J jnl
Robust Low-Rank Approximation of Data Matrices With Elementwise Contamination.
Technometrics
Ricardo A. Maronna, Victor J. Yohai
2005 J jnl
Principal Components and Orthogonal Regression Based on Robust Scales.
Technometrics
Ricardo A. Maronna
2002 J jnl
Robust Estimates of Location and Dispersion for High-Dimensional Datasets.
Technometrics
Ricardo A. Maronna, Ruben H. Zamar