Riaz-ul-haque Mian

14 papers A 1Misc 1Journal 10Unranked 2
YearRankTypeTitle / Venue / Authors
2026 J jnl
A progressive self-training semi-supervised model to enhance discontinuous change detection.
Integr.
Souma Yamane, Sakai Yuwa, Riaz-ul-haque Mian
2026 J jnl
Enhanced Detection of Recycled FPGAs Using Gaussian Process Regression with LHS and Active Sampling.
ACM Trans. Design Autom. Electr. Syst.
Yoshito Hagihara, Foisal Ahmed, Yamane Shoma, Riaz-ul-haque Mian
2025 J jnl
Accelerating HDC-CNN Hybrid Models Using Custom Instructions on RISC-V GPUs.
CoRR
Wakuto Matsumi, Riaz-ul-haque Mian
2025 J jnl
Approach to Visual Attractiveness of Event Space Through Data-Driven Environment and Spatial Perception.
CoRR
Aliffi Majiid, Riaz-ul-haque Mian, Kouki Kurohara, Yen-Khang Nguyen-Tran
2025 J jnl
Custom-Adaptive Kernel Strategies for Gaussian Process Regression in Wafer-Level Modeling and FPGA Delay Analysis.
J. Electron. Test.
Riaz-ul-haque Mian, Foisal Ahmed, Yoshito Hagihara, Souma Yamane
2025 — conf
Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning.
ICECET
Wang WeiQuan, Riaz-ul-haque Mian
2025 J jnl
Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning.
CoRR
Wang WeiQuan, Riaz-ul-haque Mian
2024 J jnl
Efficient Wafer-Level Spatial Variation Modeling for Multi-Site RF IC Testing.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
Riaz-ul-haque Mian, Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki, Michihiro Shintani
2024 Misc conf
Hierarchical Active Learning for Efficient Semi-Supervised Seagrass Image Classification.
DICTA
Farah Afifah Binti Mohd Nawayai, Md Kislu Noman, Syed Mohammed Shamsul Islam, Riaz-ul-haque Mian
2021 J jnl
Hardware-Software Co-Design for Decimal Multiplication.
Comput.
Riaz-ul-haque Mian, Michihiro Shintani, Michiko Inoue
2021 A conf
Wafer-level Variation Modeling for Multi-site RF IC Testing via Hierarchical Gaussian Process.
ITC
Michihiro Shintani, Riaz-ul-haque Mian, Michiko Inoue, Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki
2021 J jnl
Wafer-level Variation Modeling for Multi-site RF IC Testing via Hierarchical Gaussian Process.
CoRR
Michihiro Shintani, Riaz-ul-haque Mian, Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki, Michiko Inoue
2020 J jnl
Cycle-Accurate Evaluation of Software-Hardware Co-Design of Decimal Computation in RISC-V Ecosystem.
CoRR
Riaz-ul-haque Mian, Michihiro Shintani, Michiko Inoue
2019 — conf
Cycle-Accurate Evaluation of Software-Hardware Co-Design of Decimal Computation in RISC-V Ecosystem.
SoCC
Riaz-ul-haque Mian, Michihiro Shintani, Michiko Inoue