Reydezel Torres-Torres

15 papers Journal 6Unranked 9
YearRankTypeTitle / Venue / Authors
2025 — conf
Mixed Mode: More than Analog and Digital.
MIXDES
Roberto S. Murphy, Reydezel Torres-Torres
2025 — conf
Off-State TDDB Degradation of RC-Features and Threshold Voltage on Advanced FinFETs from RF Measurements for 5G Applications.
IRPS
Alan Y. Otero-Carrascal, Edmundo A. Gutiérrez-D., Reydezel Torres-Torres, Oscar Huerta-Gonzalez, P. Srinivasan, Héctor Uribe
2024 J jnl
An Improved Method to Measure, Characterize, and Model Microstrip Antennas in the W Band.
IEEE Instrum. Meas. Mag.
Roberto S. Murphy-Arteaga, Edgar Colín-Beltrán, María T. Serrano-Serrano, Chudy Nwachukwu, Svetlana Carsof Sejas Garcia, Reydezel Torres-Torres
2024 — conf
Assessing Non-Conducting Off-State Induced Hard Breakdown for PD-SOI MOSFETs using an RF Measurement Technique.
IRPS
Alan Y. Otero-Carrascal, Dora A. Chaparro-Ortiz, Edmundo A. Gutiérrez-D., Reydezel Torres-Torres, Oscar Huerta-Gonzalez, P. Srinivasan
2024 J jnl
Assessment of Performance of One-Turn Inductors in Series Configuration Through a Transmission-Line Modeling Approach.
IEEE Access
German A. Alvarez-Botero, Eduardo Moctezuma-Pascual, Miguel A. G. Laso, Reydezel Torres-Torres
2023 — conf
Impact of Non-Conducting HCI Degradation on Small-Signal Parameters in RF SOI MOSFET.
IRPS
Dora A. Chaparro-Ortiz, Alan Y. Otero-Carrascal, Edmundo A. Gutiérrez-D., Reydezel Torres-Torres, Oscar Huerta-Guevara, P. Srinivasan, Fernando Guarin
2021 — conf
Modeling Passive Devices for CMOS RF Circuits.
MIXDES
José Valdés, Reydezel Torres-Torres, Roberto S. Murphy
2020 J jnl
Characterization and modeling of on-chip via stacks for RF-CMOS applications.
IEICE Electron. Express
Carlos Alberto Sanabria Diaz, Mónico Linares Aranda, Reydezel Torres-Torres, Alejandro Díaz-Sánchez
2018 J jnl
Semiempirical Model for IC Interconnects Considering the Coupling Between the Signal Trace and the Ground Plane.
Circuits Syst. Signal Process.
Mónico Linares Aranda, Oscar González-Díaz, D. M. Cortes-Hernandez, Reydezel Torres-Torres
2017 J jnl
A review of DC extraction methods for MOSFET series resistance and mobility degradation model parameters.
Microelectron. Reliab.
Adelmo Ortiz-Conde, Andrea Sucre-González, Fabián Zárate-Rincón, Reydezel Torres-Torres, Roberto S. Murphy-Arteaga, Juin J. Liou, Francisco J. García-Sánchez
2016 — conf
Characterization of transmission lines in a novel high-frequency laminate.
LASCAS
Abel Perez-Fajardo, D. M. Cortes-Hernandez, Reydezel Torres-Torres, Alfonso Torres-Jácome
2015 — conf
Novel PCB fabrication process roughness free for high frequency applications.
CCE
Abel Perez-Fajardo, Alfonso Torres-Jácome, Reydezel Torres-Torres
2013 — conf
Analysis of the effects of coupling through substrate and the calculus of the Q factor.
LASCAS
Emmanuel Torres-Rios, Svetlana Carsof Sejas Garcia, Luiz Carlos Moreira, Reydezel Torres-Torres, Wilhelmus A. M. Van Noije
2011 J jnl
Using S-parameter measurements to determine the threshold voltage, gain factor, and mobility degradation factor for microwave bulk-MOSFETs.
Microelectron. Reliab.
German A. Alvarez-Botero, Reydezel Torres-Torres, Roberto S. Murphy-Arteaga
2010 — conf
Transmission line characterization for high frequency synchronization systems design.
CONIELECOMP
Oscar González-Díaz, Mónico Linares Aranda, Reydezel Torres-Torres