René Kothe

11 papers C 9Journal 1Unranked 1
YearRankTypeTitle / Venue / Authors
2010 C conf
Test Data and Power Reductions for Transition Delay Tests for Massive-Parallel Scan Structures.
DSD
René Kothe, Heinrich Theodor Vierhaus
2008 J jnl
A Scan Controller Concept for Low Power Scan Tests.
J. Low Power Electron.
René Kothe, Heinrich Theodor Vierhaus
2008 C conf
Embedded Diagnostic Logic Test Exploiting Regularity.
DSD
Heinrich Theodor Vierhaus, René Kothe
2007 C conf
A Configurable Modular Test Processor and Scan Controller Architecture.
IOLTS
R. Frost, D. Rudolph, Christian Galke, René Kothe, Heinrich Theodor Vierhaus
2007 C conf
Flip-Flops and Scan-Path Elements for Nanoelectronics.
DDECS
René Kothe, Heinrich Theodor Vierhaus
2006 C conf
Built-in Self Repair by Reconfiguration of FPGAs.
IOLTS
S. Habermann, René Kothe, Heinrich Theodor Vierhaus
2006 C conf
Embedded Scan Test with Diagnostic Features for Self-Testing SoCs.
IOLTS
Christian Galke, René Kothe, Sabine Schultke, K. Winkler, Jeanette Honko, Heinrich Theodor Vierhaus
2006 C conf
Embedded Self Repair by Transistor and Gate Level Reconfiguration.
DDECS
René Kothe, Heinrich Theodor Vierhaus, Torsten Coym, Wolfgang Vermeiren, Bernd Straube
2006 C conf
Hardware/Software Based Hierarchical Self Test for SoCs.
DDECS
René Kothe, Christian Galke, Sabine Schultke, Henry Fröschke, Steffen Gaede, Heinrich Theodor Vierhaus
2006 — conf
Logic Self Repair.
ARCS Workshops
Christian Galke, René Kothe, Heinrich Theodor Vierhaus
2005 C conf
A Multi-Purpose Concept for SoC Self Test Including Diagnostic Features.
IOLTS
René Kothe, Christian Galke, Heinrich Theodor Vierhaus