Rene Krenz-Baath

20 papers A 6B 3C 5Journal 2Unranked 3
YearRankTypeTitle / Venue / Authors
2024 J jnl
Human-heart-model for hardware-in-the-loop testing of pacemakers.
Comput. Biol. Medicine
Joseline Heuer, Rene Krenz-Baath, Roman Obermaisser
2023 C conf
Verifying Bio-Electronic Systems.
DDECS
Joseline Heuer, Rene Krenz-Baath, Roman Obermaisser
2017 A conf
BASTION: Board and SoC test instrumentation for ageing and no failure found.
DATE
Artur Jutman, Christophe Lotz, Erik Larsson, Matteo Sonza Reorda, Maksim Jenihhin, Jaan Raik, Hans G. Kerkhoff, Rene Krenz-Baath, Piet Engelke
2016 A conf
A suite of IEEE 1687 benchmark networks.
ITC
Anton Tsertov, Artur Jutman, Sergei Devadze, Matteo Sonza Reorda, Erik Larsson, Farrokh Ghani Zadegan, Riccardo Cantoro, Mehrdad Montazeri, Rene Krenz-Baath
2016 — conf
Computing optimal communication schedules for time-triggered networks using an SMT solver.
SIES
Christian Scholer, Rene Krenz-Baath, Ayman Murshed, Roman Obermaisser
2016 J jnl
On Optimization-Based ATPG and Its Application for Highly Compacted Test Sets.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Stephan Eggersglüß, Kenneth Schmitz, Rene Krenz-Baath, Rolf Drechsler
2016 A conf
Upper-bound computation for optimal retargeting in IEEE1687 networks.
ITC
Farrokh Ghani Zadegan, Rene Krenz-Baath, Erik Larsson
2015 A conf
Access time minimization in IEEE 1687 networks.
ITC
Rene Krenz-Baath, Farrokh Ghani Zadegan, Erik Larsson
2015 — conf
Optimal SAT-based scheduler for time-triggered networks-on-a-chip.
SIES
Christian Scholer, Rene Krenz-Baath, Ayman Murshed, Roman Obermaisser
2014 — conf
Design, Verification, and Application of IEEE 1687.
ATS
Farrokh Ghani Zadegan, Erik Larsson, Artur Jutman, Sergei Devadze, Rene Krenz-Baath
2014 B conf
Optimization-based multiple target test generation for highly compacted test sets.
ETS
Stephan Eggersglüß, Kenneth Schmitz, Rene Krenz-Baath, Rolf Drechsler
2013 C conf
Fault collapsing of multi-conditional faults.
DDECS
Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke
2013 C conf
Industrial Application of IEEE P1687 for an Automotive Product.
DSD
Martin Keim, Tom Waayers, Richard Morren, Friedrich Hapke, Rene Krenz-Baath
2012 C conf
A new SAT-based ATPG for generating highly compacted test sets.
DDECS
Stephan Eggersglüß, Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke, Rolf Drechsler
2012 C conf
Robust Evaluation of Weighted Random Logic BIST Structures in Industrial Designs.
DSD
Rene Krenz-Baath, Friedrich Hapke, Rolf Hinze, Reinhard Meier, Maija Ryynaenen, Andreas Glowatz
2010 A conf
Defect-oriented cell-internal testing.
ITC
Friedrich Hapke, Wilfried Redemund, Jürgen Schlöffel, Rene Krenz-Baath, Andreas Glowatz, Michael Wittke, Hamidreza Hashempour, Stefan Eichenberger
2010 B conf
Improving CNF representations in SAT-based ATPG for industrial circuits using BDDs.
ETS
Daniel Tille, Stephan Eggersglüß, Rene Krenz-Baath, Jürgen Schlöffel, Rolf Drechsler
2009 A conf
Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs.
ITC
Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, Dan Adolfsson
2007 B conf
Computation and Application of Absolute Dominators in Industrial Designs.
ETS
Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel
2007 — —
Dominator-based Algorithms in Logic Synthesis and Verification.
Rene Krenz-Baath