| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | — | conf |
ICECS
|
| 2024 | J | jnl |
IEEE Access
|
| 2023 | J | jnl |
Microprocess. Microsystems
|
| 2022 | — | conf |
IEEE SENSORS
|
| 2022 | J | jnl |
IEEE Internet Things J.
|
| 2022 | — | conf |
CCECE
|
| 2021 | — | conf |
MWSCAS
|
| 2021 | J | jnl |
IEEE Instrum. Meas. Mag.
|
| 2020 | — | conf |
IEEE SENSORS
|
| 2020 | — | conf |
CCECE
|
| 2019 | — | conf |
DTIS
|
| 2019 | — | conf |
DTIS
|
| 2019 | J | jnl |
IET Wirel. Sens. Syst.
|
| 2018 | — | conf |
EIT
|
| 2018 | J | jnl |
Microelectron. J.
|
| 2018 | — | conf |
MWSCAS
|
| 2018 | C | conf |
ISCAS
|
| 2017 | — | conf |
ECCTD
|
| 2017 | C | conf |
ISCAS
|
| 2017 | J | jnl |
Microelectron. J.
|
| 2017 | B | conf |
ETS
|
| 2017 | — | conf |
CCECE
|
| 2017 | C | conf |
ISCAS
|
| 2017 | C | conf |
ISCAS
|
| 2017 | — | conf |
CCECE
|
| 2017 | — | conf |
CCECE
|
| 2016 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2016 | J | jnl |
IEEE Trans. Veh. Technol.
|
| 2016 | C | conf |
ISCAS
|
| 2016 | C | conf |
IPIN
|
| 2016 | J | jnl |
IEEE Internet Things J.
|
| 2016 | — | conf |
ICM
|
| 2016 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2016 | — | conf |
CCECE
|
| 2016 | J | jnl |
Comput. Commun.
|
| 2016 | — | conf |
ICECS
|
| 2016 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2015 | A | conf |
ITC
|
| 2015 | — | conf |
MWSCAS
|
| 2015 | C | conf |
ISCAS
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2015 | C | conf |
ISCAS
|
| 2015 | — | conf |
MWSCAS
|
| 2015 | C | conf |
ISCAS
|
| 2015 | C | conf |
IPIN
|
| 2014 | A | conf |
ITC
|
| 2014 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2014 | — | conf |
ICECS
|
| 2013 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2013 | Misc | conf |
VTS
|
| 2013 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2012 | — | conf |
NEWCAS
|
| 2012 | — | conf |
ICECS
|
| 2012 | J | jnl |
J. Circuits Syst. Comput.
|
| 2012 | J | jnl |
IET Circuits Devices Syst.
|
| 2011 | — | conf |
CCECE
|
| 2011 | — | conf |
ICECS
|
| 2010 | A | conf |
ITC
|
| 2010 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2010 | — | conf |
Asian Test Symposium
|
| 2010 | C | conf |
ISCAS
|
| 2010 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2009 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2009 | — | conf |
EIT
|
| 2007 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2003 | — | conf |
ISCAS (5)
|