Rani S. Ghaida

13 papers A 4C 1Misc 1Journal 3Unranked 3
YearRankTypeTitle / Venue / Authors
2014 — conf
Comprehensive die-level assessment of design rules and layouts.
ASP-DAC
Rani S. Ghaida, Yasmine Badr, Mukul Gupta, Ning Jin, Puneet Gupta
2014 C conf
Pattern-restricted design at 10nm and beyond.
ICCD
Rani S. Ghaida, Yasmine Badr, Puneet Gupta
2013 J jnl
Layout Decomposition and Legalization for Double-Patterning Technology.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Rani S. Ghaida, Kanak B. Agarwal, Sani R. Nassif, Xin Yuan, Lars Liebmann, Puneet Gupta
2013 A conf
Role of design in multiple patterning: technology development, design enablement and process control.
DATE
Rani S. Ghaida, Puneet Gupta
2012 A conf
A methodology for the early exploration of design rules for multiple-patterning technologies.
ICCAD
Rani S. Ghaida, Tanaya Sahu, Parag Kulkarni, Puneet Gupta
2012 J jnl
DRE: A Framework for Early Co-Evaluation of Design Rules, Technology Choices, and Layout Methodologies.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Rani S. Ghaida, Puneet Gupta
2012 — —
Design Enablement and Design-Centric Assessment of Future Semiconductor Technologies
Rani S. Ghaida
2012 — conf
O(n) layout-coloring for multiple-patterning lithography and conflict-removal using compaction.
ICICDT
Rani S. Ghaida, Kanak B. Agarwal, Sani R. Nassif, Xin Yuan, Lars W. Liebmann, Puneet Gupta
2011 A conf
A framework for double patterning-enabled design.
ICCAD
Rani S. Ghaida, Kanak B. Agarwal, Sani R. Nassif, Xin Yuan, Lars Liebmann, Puneet Gupta
2010 Misc conf
Electrical Modeling of Lithographic Imperfections.
VLSI Design
Tuck-Boon Chan, Rani S. Ghaida, Puneet Gupta
2009 J jnl
A Layout Sensitivity Model for Estimating Electromigration-vulnerable Narrow Interconnects.
J. Electron. Test.
Rani S. Ghaida, Payman Zarkesh-Ha
2009 A conf
A framework for early and systematic evaluation of design rules.
ICCAD
Rani S. Ghaida, Puneet Gupta
2007 — conf
Estimation of Electromigration-Aggravating Narrow Interconnects Using a Layout Sensitivity Model.
DFT
Rani S. Ghaida, Payman Zarkesh-Ha