Randy W. Mann

18 papers A 1C 2Journal 10Unranked 5
YearRankTypeTitle / Venue / Authors
2020 J jnl
Bias-Dependent Variation in FinFET SRAM.
IEEE Trans. Very Large Scale Integr. Syst.
Randy W. Mann, Meixiong Zhao, Oh Sung Kwon, Xi Cao, Sanjay Parihar, Muhammed Ahosan Ul Karim, Jack M. Higman, Joseph Versaggi, Rick Carter
2019 J jnl
An Extrinsic Device and Leakage Mechanism in Advanced Bulk FinFET SRAM.
IEEE Trans. Very Large Scale Integr. Syst.
Randy W. Mann, Meixiong Zhao, Sanjay Parihar, Qun Gao, Ankur Arya, Carl Radens, Shesh Mani Pandey, Joseph Versaggi, Jack M. Higman, Rick Carter
2018 J jnl
A Retrospective View on the Technology Evolution to Support Low Power Mobile Application.
J. Low Power Electron.
Bipul C. Paul, Ajey P. Jacob, William Taylor, Randy W. Mann, Joseph Versaggi, Edward J. Nowak, Lars W. Liebmann
2017 J jnl
Array Termination Impacts in Advanced SRAM.
IEEE Trans. Very Large Scale Integr. Syst.
Randy W. Mann, Sandeep Puri, Sheng Xie, Daniel Marienfeld, Joseph Versaggi, Bianzhu Fu, Michael Gribelyuk, Ratheesh R. Thankalekshmi, Xiaoqiang Zhang, Hui Zang, Chad E. Weintraub
2017 J jnl
Bias-Induced Healing of $V_{\text {min}}$ Failures in Advanced SRAM Arrays.
IEEE Trans. Very Large Scale Integr. Syst.
Randy W. Mann, William McMahon, Yoann Mamy Randriamihaja, Yuncheng Song, Ajay Anand Kallianpur, Sheng Xie, Akhilesh Gautam, Joseph Versaggi, Biju Parameshwaran, Chad E. Weintraub
2017 C conf
Soft errors: Reliability challenges in energy-constrained ULP body sensor networks applications.
IOLTS
Harsh N. Patel, Benton H. Calhoun, Randy W. Mann
2015 — conf
Assessing intrinsic and extrinsic end-of-life risk using functional SRAM wafer level testing.
IRPS
Yoann Mamy Randriamihaja, William McMahon, S. Balasubramanian, Tanya Nigam, Biju Parameshwaran, Randy W. Mann, Torsten Klick, T. Schaefer, A. Kumar, Y. Song, Vivek Joshi, Rakesh Ranjan, F. Chen
2014 — conf
HTOL SRAM Vmin shift considerations in scaled HKMG technologies.
CICC
S. Balasubramanian, Vivek Joshi, Torsten Klick, Randy W. Mann, Joseph Versaggi, Akhilesh Gautam, C. Weintraub, G. Kurz, G. Krause, Andreas Kerber, Biju Parameshwaran, Tanya Nigam
2012 J jnl
Nonrandom Device Mismatch Considerations in Nanoscale SRAM.
IEEE Trans. Very Large Scale Integr. Syst.
Randy W. Mann, Terry B. Hook, Phung T. Nguyen, Benton H. Calhoun
2012 J jnl
Tracking On-Chip Age Using Distributed, Embedded Sensors.
IEEE Trans. Very Large Scale Integr. Syst.
Stuart N. Wooters, Adam C. Cabe, Zhenyu Qi, Jiajing Wang, Randy W. Mann, Benton H. Calhoun, Mircea R. Stan, Travis N. Blalock
2011 — conf
New category of ultra-thin notchless 6T SRAM cell layout topologies for sub-22nm.
ISQED
Randy W. Mann, Benton H. Calhoun
2010 — conf
Improving SRAM Vmin and yield by using variation-aware BTI stress.
CICC
Jiajing Wang, Satyanand Nalam, Zhenyu Qi, Randy W. Mann, Mircea R. Stan, Benton H. Calhoun
2010 — conf
Limits of bias based assist methods in nano-scale 6T SRAM.
ISQED
Randy W. Mann, Satyanand Nalam, Jiajing Wang, Benton H. Calhoun
2009 C conf
Sub-threshold Circuit Design with Shrinking CMOS Devices.
ISCAS
Benton H. Calhoun, Sudhanshu Khanna, Randy W. Mann, Jiajing Wang
2003 J jnl
Ultralow-power SRAM technology.
IBM J. Res. Dev.
Randy W. Mann, W. W. (Bill) Abadeer, Matthew J. Breitwisch, O. Bula, Jeff S. Brown, Bryant C. Colwill, Peter E. Cottrell, William T. Crocco Jr., Stephen S. Furkay, Michael J. Hauser, Terence B. Hook, Dennis Hoyniak, James M. Johnson, Chung Hon Lam, Rebecca D. Mih, J. Rivard, Atsushi Moriwaki, E. Phipps, Christopher S. Putnam, BethAnn Rainey, James J. Toomey, Mohammad Imran Younus
2001 A conf
Enchanced multi-threshold (MTCMOS) circuits using variable well bias.
ISLPED
Stephen V. Kosonocky, Michael Immediato, Peter E. Cottrell, Terence B. Hook, Randy W. Mann, Jeff Brown
1995 J jnl
A half-micron CMOS logic generation.
IBM J. Res. Dev.
Charles W. Koburger III, William F. Clark, James W. Adkisson, Eric Adler, Paul E. Bakeman, Albert S. Bergendahl, Alan B. Botula, W. Chang, Bijan Davari, John H. Givens, Howard H. Hansen, Steven J. Holmes, David V. Horak, Chung Hon Lam, Jerome B. Lasky, Stephen E. Luce, Randy W. Mann, Glen L. Miles, James S. Nakos, Edward J. Nowak, Ghavam G. Shahidi, Yuan Taur, Francis R. White, Matthew R. Wordeman
1995 J jnl
Silicides and local interconnections for high-performance VLSI applications.
IBM J. Res. Dev.
Randy W. Mann, Larry A. Clevenger, Paul D. Agnello, Francis R. White