Randolph E. Elmquist

18 papers Journal 18
YearRankTypeTitle / Venue / Authors
2025 J jnl
Implementation of a 1 GΩ Star-Mesh Graphene Quantized Hall Array Resistance Standard Network for High Resistance Calibration.
IEEE Trans. Instrum. Meas.
Marta Musso, Wei-Chen Lin, Yanfei Yang, Ngoc Thanh Mai Tran, Alireza R. Panna, Cheng-Hsueh Yang, Randolph E. Elmquist, David B. Newell, Chi-Te Liang, Massimo Ortolano, Albert F. Rigosi, Dean G. Jarrett
2023 J jnl
Graphene-Based Star-Mesh Resistance Networks.
IEEE Trans. Instrum. Meas.
Dean G. Jarrett, Ching-Chen Yeh, Shamith U. Payagala, Alireza R. Panna, Yanfei Yang, Linli Meng, Swapnil M. Mhatre, Ngoc Thanh Mai Tran, Heather M. Hill, Dipanjan Saha, Randolph E. Elmquist, David B. Newell, Albert F. Rigosi
2020 J jnl
Comparison Between Graphene and GaAs Quantized Hall Devices With a Dual Probe.
IEEE Trans. Instrum. Meas.
Shamith U. Payagala, Albert F. Rigosi, Alireza R. Panna, Alessio Pollarolo, Mattias Kruskopf, Stephan Schlamminger, Dean G. Jarrett, Ryan Brown, Randolph E. Elmquist, Duane Brown, David B. Newell
2020 J jnl
Comparison Between NIST Graphene and AIST GaAs Quantized Hall Devices.
IEEE Trans. Instrum. Meas.
Takehiko Oe, Albert F. Rigosi, Mattias Kruskopf, Bi-Yi Wu, Hsin-Yen Lee, Yanfei Yang, Randolph E. Elmquist, Nobu-hisa Kaneko, Dean G. Jarrett
2019 J jnl
Graphene Devices for Tabletop and High-Current Quantized Hall Resistance Standards.
IEEE Trans. Instrum. Meas.
Albert F. Rigosi, Alireza R. Panna, Shamith U. Payagala, Mattias Kruskopf, Marlin Kraft, George R. Jones, Bi-Yi Wu, Hsin-Yen Lee, Yanfei Yang, Jiuning Hu, Dean G. Jarrett, David B. Newell, Randolph E. Elmquist
2019 J jnl
The units for mass, voltage, resistance, and electrical current in the SI.
IEEE Instrum. Meas. Mag.
Stephan Schlamminger, Patrick Abbott, Zeina Kubarych, Dean G. Jarrett, Randolph E. Elmquist
2015 J jnl
Controlling the Fermi Level in a Single-Layer Graphene QHE Device for Resistance Standard.
IEEE Trans. Instrum. Meas.
Yasuhiro Fukuyama, Randolph E. Elmquist, Lung-I Huang, Yanfei Yang, Fan-Hung Liu, Nobu-hisa Kaneko
2015 J jnl
Transportation Effect and Basic Characteristics of Metal-Foil Resistors Examined in an International Trilateral Pilot Study.
IEEE Trans. Instrum. Meas.
Nobu-hisa Kaneko, Takehiko Oe, Wan-Seop Kim, Dong-Hun Chae, Randolph E. Elmquist, Marlin Kraft
2013 J jnl
Graphene Epitaxial Growth on SiC(0001) for Resistance Standards.
IEEE Trans. Instrum. Meas.
Mariano A. Real, Eric A. Lass, Fan-Hung Liu, Tian Shen, George R. Jones, Johannes A. Soons, David B. Newell, Albert V. Davydov, Randolph E. Elmquist
2013 J jnl
Low-Ohmic Resistance Comparison: Measurement Capabilities and Resistor Traveling Behavior.
IEEE Trans. Instrum. Meas.
Gert Rietveld, Jan H. N. van der Beek, Marlin Kraft, Randolph E. Elmquist, Alessandro Mortara, Beat Jeckelmann
2009 J jnl
SIM Comparison of DC Resistance Standards at 1Ω, 1MΩ, and 1GΩ.
IEEE Trans. Instrum. Meas.
Dean G. Jarrett, Randolph E. Elmquist, Nien Fan Zhang, Alejandra Tonina, Marta Porfiri, Janice de Brito Fernandes, Helio Schechter, Daniel Izquierdo, Carlos Faverio, Daniel Slomovitz, David Inglis, Kai Wendler, Felipe Hernandez Marquez, Benjamín Rodríguez Medina
2009 J jnl
Uncertainty Evaluation in a Two-Terminal Cryogenic Current Comparator.
IEEE Trans. Instrum. Meas.
M. E. Bierzychudek, Randolph E. Elmquist
2005 J jnl
Direct resistance comparisons from the QHR to100 MΩ using a cryogenic current comparator.
IEEE Trans. Instrum. Meas.
Randolph E. Elmquist, Emmanouel Hourdakis, Dean G. Jarrett, Neil M. Zimmerman
2003 J jnl
Using a high-value resistor in triangle comparisons of electrical standards.
IEEE Trans. Instrum. Meas.
Randolph E. Elmquist, Neil M. Zimmerman, William H. Huber
2001 J jnl
Characterization of four-terminal-pair resistance standards: a comparison of measurements and theory.
IEEE Trans. Instrum. Meas.
Randolph E. Elmquist, Anne-Marie Jeffery, Dean G. Jarrett
2001 J jnl
Transport behavior of commercially available 100-Ω standard resistors.
IEEE Trans. Instrum. Meas.
Bernd Schumacher, Peter Warnecke, Wilfrid Poirier, I. Delgado, Z. Msimang, Giorgio Boella, Per-Otto Hetland, Randolph E. Elmquist, Jonathan M. Williams, David Inglis, Beat Jeckelmann, Ove Gunnarsson, Alexandre Satrapinski
2000 J jnl
Calculable coaxial resistors for precision measurements.
IEEE Trans. Instrum. Meas.
Randolph E. Elmquist
1999 J jnl
Cryogenic current comparator measurements at 77 K using thallium-2223 thick-film shields.
IEEE Trans. Instrum. Meas.
Randolph E. Elmquist