Ran Wang

27 papers A 3B 2C 1Misc 3Journal 13Unranked 4
YearRankTypeTitle / Venue / Authors
2021 J jnl
GACDN: generative adversarial feature completion and diagnosis network for COVID-19.
BMC Medical Imaging
Qi Zhu, Haizhou Ye, Liang Sun, Zhongnian Li, Ran Wang, Feng Shi, Dinggang Shen, Daoqiang Zhang
2020 J jnl
Cross-spectral palmprint recognition with low-rank canonical correlation analysis.
Multim. Tools Appl.
Qi Zhu, Nuoya Xu, Zheng Zhang, Donghai Guan, Ran Wang, Daoqiang Zhang
2018 — conf
A Collective Computing Architecture Supporting Heterogeneous Tasks and Computing Devices.
ICCCS (1)
Yang Li, Yunlong Zhao, Zhenhua Zhang, Qian Geng, Ran Wang
2018 B conf
A Flexible Network Utility Optimization Approach for Energy Harvesting Sensor Networks.
GLOBECOM
Jie Hao, Ran Wang, Yi Zhuang, Baoxian Zhang
2018 J jnl
Multicast Testing of Interposer-Based 2.5D ICs: Test-Architecture Design and Test Scheduling.
ACM Trans. Design Autom. Electr. Syst.
Shengcheng Wang, Ran Wang, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
2018 J jnl
Visible Light Based Occupancy Inference Using Ensemble Learning.
IEEE Access
Jie Hao, Xiaoming Yuan, Yanbing Yang, Ran Wang, Yi Zhuang, Jun Luo
2017 J jnl
ExTest Scheduling and Optimization for 2.5-D SoCs With Wrapped Tiles.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Ran Wang, Guoliang Li, Rui Li, Jun Qian, Krishnendu Chakrabarty
2017 J jnl
Prebond Testing and Test-Path Design for the Silicon Interposer in 2.5-D ICs.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Ran Wang, Zipeng Li, Sukeshwar Kannan, Krishnendu Chakrabarty
2017 J jnl
Tackling Test Challenges for Interposer-Based 2.5-D Integrated Circuits.
IEEE Des. Test
Ran Wang, Krishnendu Chakrabarty
2016 B conf
A design-for-test solution for monolithic 3D integrated circuits.
ETS
Ran Wang, Krishnendu Chakrabarty
2016 Misc conf
A programmable method for low-power scan shift in SoC integrated circuits.
VTS
Ran Wang, Bonita Bhaskaran, Karthikeyan Natarajan, Ayub Abdollahian, Kaushik Narayanun, Krishnendu Chakrabarty, Amit Sanghani
2016 — conf
Multicast Test Architecture and Test Scheduling for Interposer-Based 2.5D ICs.
ATS
Shengcheng Wang, Ran Wang, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
2016 A conf
Pre-bond testing of the silicon interposer in 2.5D ICs.
DATE
Ran Wang, Zipeng Li, Sukeshwar Kannan, Krishnendu Chakrabarty
2016 — —
Testing of Interposer-Based 2.5D Integrated Circuits.
Ran Wang
2016 — conf
Testing of Interposer-Based 2.5D Integrated Circuits: Challenges and Solutions.
ATS
Ran Wang, Krishnendu Chakrabarty
2016 A conf
Testing of interposer-based 2.5D integrated circuits.
ITC
Ran Wang, Krishnendu Chakrabarty
2016 A conf
The hype, myths, and realities of testing 3D integrated circuits.
ICCAD
Ran Wang, Sergej Deutsch, Mukesh Agrawal, Krishnendu Chakrabarty
2015 J jnl
Built-In Self-Test and Test Scheduling for Interposer-Based 2.5D IC.
ACM Trans. Design Autom. Electr. Syst.
Ran Wang, Krishnendu Chakrabarty, Sudipta Bhawmik
2015 Misc conf
ExTest scheduling for 2.5D system-on-chip integrated circuits.
VTS
Ran Wang, Guoliang Li, Rui Li, Jun Qian, Krishnendu Chakrabarty
2015 J jnl
Interconnect Testing and Test-Path Scheduling for Interposer-Based 2.5-D ICs.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Ran Wang, Krishnendu Chakrabarty, Sudipta Bhawmik
2014 Misc conf
At-speed interconnect testing and test-path optimization for 2.5D ICs.
VTS
Ran Wang, Krishnendu Chakrabarty, Sudipta Bhawmik
2014 J jnl
Built-In Self-Test, Diagnosis, and Repair of MultiMode Power Switches.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Ran Wang, Zhaobo Zhang, Xrysovalantis Kavousianos, Yiorgos Tsiatouhas, Krishnendu Chakrabarty
2014 C conf
Built-in self-test for interposer-based 2.5D ICs.
ICCD
Ran Wang, Krishnendu Chakrabarty, Sudipta Bhawmik
2014 J jnl
Scan-Based Testing of Post-Bond Silicon Interposer Interconnects in 2.5-D ICs.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Ran Wang, Krishnendu Chakrabarty, Bill Eklow
2014 J jnl
Test and Design-for-Testability Solutions for 3D Integrated Circuits.
Inf. Media Technol.
Krishnendu Chakrabarty, Mukesh Agrawal, Sergej Deutsch, Brandon Noia, Ran Wang, Fangming Ye
2014 J jnl
Test and Design-for-Testability Solutions for 3D Integrated Circuits.
IPSJ Trans. Syst. LSI Des. Methodol.
Krishnendu Chakrabarty, Mukesh Agrawal, Sergej Deutsch, Brandon Noia, Ran Wang, Fangming Ye
2013 — conf
Post-bond Testing of the Silicon Interposer and Micro-bumps in 2.5D ICs.
Asian Test Symposium
Ran Wang, Krishnendu Chakrabarty, Bill Eklow