Ramin Rajaei

25 papers A 5C 3Journal 16Unranked 1
YearRankTypeTitle / Venue / Authors
2023 J jnl
A Hybrid Optical-Electrical Analog Deep Learning Accelerator Using Incoherent Optical Signals.
ACM J. Emerg. Technol. Comput. Syst.
Mingdai Yang, Qiuwen Lou, Ramin Rajaei, Mohammad Reza Jokar, Junyi Qiu, Yuming Liu, Aditi Udupa, Frederic T. Chong, John M. Dallesasse, Milton Feng, Lynford L. Goddard, X. Sharon Hu, Yanjing Li
2023 J jnl
A Reconfigurable FeFET Content Addressable Memory for Multi-State Hamming Distance.
IEEE Trans. Circuits Syst. I Regul. Pap.
Liu Liu, Ann Franchesca Laguna, Ramin Rajaei, Mohammad Mehdi Sharifi, Arman Kazemi, Xunzhao Yin, Michael T. Niemier, Xiaobo Sharon Hu
2023 J jnl
Addressing Benign and Malicious Crosstalk in Modern System-on-Chips.
IEEE Access
Ahmad Patooghy, Mehdi Elahi, Maral Filvan Torkaman, Sara Sezavar Dokhtfaroughi, Ramin Rajaei
2022 J jnl
A process variation resilient spintronic true random number generator for highly reliable hardware security applications.
Microelectron. J.
Mehrdad Morsali, Mohammad Hossein Moaiyeri, Ramin Rajaei
2022 A conf
Eva-CAM: A Circuit/Architecture-Level Evaluation Tool for General Content Addressable Memories.
DATE
Liu Liu, Mohammad Mehdi Sharifi, Ramin Rajaei, Arman Kazemi, Kai Ni, Xunzhao Yin, Michael T. Niemier, Xiaobo Sharon Hu
2021 A conf
Application-driven Design Exploration for Dense Ferroelectric Embedded Non-volatile Memories.
ISLPED
Mohammad Mehdi Sharifi, Lillian Pentecost, Ramin Rajaei, Arman Kazemi, Qiuwen Lou, Gu-Yeon Wei, David M. Brooks, Kai Ni, X. Sharon Hu, Michael T. Niemier, Marco Donato
2021 J jnl
Application-driven Design Exploration for Dense Ferroelectric Embedded Non-volatile Memories.
CoRR
Mohammad Mehdi Sharifi, Lillian Pentecost, Ramin Rajaei, Arman Kazemi, Qiuwen Lou, Gu-Yeon Wei, David Brooks, Kai Ni, X. Sharon Hu, Michael T. Niemier, Marco Donato
2021 A conf
In-Memory Nearest Neighbor Search with FeFET Multi-Bit Content-Addressable Memories.
DATE
Arman Kazemi, Mohammad Mehdi Sharifi, Ann Franchesca Laguna, Franz Müller, Ramin Rajaei, Ricardo Olivo, Thomas Kämpfe, Michael T. Niemier, X. Sharon Hu
2021 C conf
Low-Cost Sequential Logic Circuit Design Considering Single Event Double-Node Upsets and Single Event Transients.
ICCD
Ramin Rajaei, Michael T. Niemier, Xiaobo Sharon Hu
2020 C conf
A Hybrid FeMFET-CMOS Analog Synapse Circuit for Neural Network Training and Inference.
ISCAS
Arman Kazemi, Ramin Rajaei, Kai Ni, Suman Datta, Michael T. Niemier, Xiaobo Sharon Hu
2020 J jnl
A Hybrid FeMFET-CMOS Analog Synapse Circuit for Neural Network Training and Inference.
CoRR
Arman Kazemi, Ramin Rajaei, Kai Ni, Suman Datta, Michael T. Niemier, Xiaobo Sharon Hu
2020 A conf
A Novel TIGFET-based DFF Design for Improved Resilience to Power Side-Channel Attacks.
DATE
Mohammad Mehdi Sharifi, Ramin Rajaei, Patsy Cadareanu, Pierre-Emmanuel Gaillardon, Yier Jin, Michael T. Niemier, Xiaobo Sharon Hu
2020 C conf
Dynamic Memory and Sequential Logic Design using Negative Capacitance FinFETs.
ISCAS
Ramin Rajaei, Yen-Kai Lin, Sayeef S. Salahuddin, Michael T. Niemier, Xiaobo Sharon Hu
2020 A conf
GC-eDRAM design using hybrid FinFET/NC-FinFET.
ISLPED
Ramin Rajaei, Yen-Kai Lin, Sayeef S. Salahuddin, Michael T. Niemier, Xiaobo Sharon Hu
2020 J jnl
In-Memory Nearest Neighbor Search with FeFET Multi-Bit Content-Addressable Memories.
CoRR
Arman Kazemi, Mohammad Mehdi Sharifi, Ann Franchesca Laguna, Franz Müller, Ramin Rajaei, Ricardo Olivo, Thomas Kämpfe, Michael T. Niemier, Xiaobo Sharon Hu
2018 J jnl
A Reliable, Low Power and Nonvolatile MTJ-Based Flip-Flop for Advanced Nanoelectronics.
J. Circuits Syst. Comput.
Ramin Rajaei
2017 J jnl
A soft error tolerant register file for highly reliable microprocessor design.
Int. J. High Perform. Syst. Archit.
Nastaran Rajaei, Ramin Rajaei, Mahmoud Tabandeh
2017 J jnl
Highly reliable and low-power magnetic full-adder designs for nanoscale technologies.
Microelectron. Reliab.
Ramin Rajaei
2017 J jnl
Single event double node upset tolerance in MOS/spintronic sequential and combinational logic circuits.
Microelectron. Reliab.
Ramin Rajaei
2017 J jnl
Single event multiple upset-tolerant SRAM cell designs for nano-scale CMOS technology.
Turkish J. Electr. Eng. Comput. Sci.
Ramin Rajaei, Bahar Asgari, Mahmoud Tabandeh, Mahdi Fazeli
2015 J jnl
Single Event Multiple Upset (SEMU) Tolerant Latch Designs in Presence of Process and Temperature Variations.
J. Circuits Syst. Comput.
Ramin Rajaei, Mahmoud Tabandeh, Mahdi Fazeli
2014 J jnl
Soft error rate estimation for Combinational Logic in Presence of Single Event Multiple Transients.
J. Circuits Syst. Comput.
Ramin Rajaei, Mahmoud Tabandeh, Mahdi Fazeli
2013 J jnl
Low cost soft error hardened latch designs for nano-scale CMOS technology in presence of process variation.
Microelectron. Reliab.
Ramin Rajaei, Mahmoud Tabandeh, Mahdi Fazeli
2011 — conf
Single event upset immune latch circuit design using C-element.
ASICON
Ramin Rajaei, Mahmoud Tabandeh, Bizhan Rashidian
2009 J jnl
A novel hybrid algorithm for creating self-organizing fuzzy neural networks.
Neurocomputing
Omid Khayat, Mohammad Mehdi Ebadzadeh, Hamid Reza Shahdoosti, Ramin Rajaei, Iman Khajehnasiri