| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2025 | J | jnl |
IEEE J. Solid State Circuits
|
| 2025 | — | conf |
A 224Gb/s 3pJ/bit 42dB Insertion Loss Post-FEC Error Free Transceiver in 3-nm FinFET CMOS (Invited).
CICC
|
| 2024 | — | conf |
ISSCC
|
| 2020 | J | jnl |
IEEE J. Solid State Circuits
|
| 2014 | C | conf |
ISCAS
|
| 2013 | — | conf |
SBCCI
|
| 2012 | — | conf |
RWS
|
| 2011 | — | conf |
CICC
|
| 2008 | — | conf |
ESSCIRC
|
| 2006 | — | conf |
CCECE
|
| 2006 | C | conf |
ISCAS
|
| 2004 | — | conf |
ISCAS (4)
|
| 2004 | — | conf |
ISCAS (1)
|
| 2003 | — | conf |
ESSCIRC
|
| 2003 | — | conf |
ISCAS (1)
|
| 2002 | — | conf |
CICC
|
| 2001 | — | conf |
CICC
|
| 1999 | — | conf |
ISCAS (2)
|
| 1999 | Misc | conf |
PDPTA
|
| 1999 | J | jnl |
Artif. Intell. Eng.
|
| 1999 | J | jnl |
IEEE Des. Test Comput.
|
| 1999 | — | conf |
ISCAS (4)
|
| 1999 | — | conf |
CICC
|
| 1999 | J | jnl |
J. Electron. Test.
|
| 1999 | J | jnl |
J. Intell. Transp. Syst.
|
| 1998 | Misc | conf |
VTS
|
| 1998 | A | conf |
ACSAC
|
| 1992 | J | jnl |
IEEE J. Solid State Circuits
|