| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2017 | J | jnl |
IEEE Trans. Computers
|
| 2017 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2016 | J | jnl |
Low-Cost and High-Reduction Approaches for Power Droop during Launch-On-Shift Scan-Based Logic BIST.
IEEE Trans. Computers
|
| 2014 | — | conf |
DFT
|
| 2013 | J | jnl |
J. Electron. Test.
|
| 2012 | J | jnl |
IEEE Trans. Computers
|
| 2011 | J | jnl |
IEEE Trans. Computers
|
| 2010 | A* | conf |
DAC
|
| 2010 | — | conf |
Conf. Computing Frontiers
|
| 2010 | A | conf |
ITC
|
| 2009 | J | jnl |
IEEE Des. Test Comput.
|
| 2008 | A | conf |
DATE
|
| 2008 | B | conf |
ETS
|
| 2007 | — | conf |
ATS
|
| 2007 | A | conf |
DATE
|
| 2006 | Misc | conf |
VTS
|
| 2005 | A | conf |
ITC
|
| 2004 | A | conf |
ITC
|
| 2003 | A | conf |
DATE
|
| 2001 | J | jnl |
J. Electron. Test.
|
| 2000 | — | conf |
ETW
|
| 1989 | C | conf |
ICCD
|