Rainer Dorsch

28 papers A 8C 3Misc 1Journal 5Unranked 11
YearRankTypeTitle / Venue / Authors
2025 J jnl
Toward Fast Heterogeneous Virtual Prototypes: Increasing the Solver Efficiency in SystemC AMS.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Alexandra Küster, Rainer Dorsch, Christian Haubelt
2024 A conf
Adaptive ODE Solvers for Timed Data Flow Models in SystemC-AMS.
DATE
Alexandra Küster, Rainer Dorsch, Christian Haubelt
2023 A conf
Structural Generation of Virtual Prototypes for Smart Sensor Development in SystemC-AMS from Simulink Models.
DATE
Alexandra Küster, Rainer Dorsch, Christian Haubelt
2022 C conf
Virtual Prototyping in SystemC AMS for Validation of Tight Sensor/Firmware Interaction in Smart Sensors.
FDL
Alexandra Küster, Rainer Dorsch, Christian Haubelt, Karsten Einwich
2019 — conf
SystemC Power Profiling for IoT Device Firmware using Runtime Configurable Models.
MECO
Jens Rudolf, Daniel Gis, Sebastian Stieber, Christian Haubelt, Rainer Dorsch
2018 — conf
Energy Efficient On-Sensor Processing for Online Activity Recognition.
PECCS
Florian Grützmacher, Albert Hein, Benjamin Beichler, Polichronis Lepidis, Rainer Dorsch, Thomas Kirste, Christian Haubelt
2017 J jnl
Accurate Sample Time Reconstruction of Inertial FIFO Data.
Sensors
Sebastian Stieber, Rainer Dorsch, Christian Haubelt
2017 C conf
Towards energy efficient sensor nodes for online activity recognition.
IECON
Florian Grützmacher, Johann-Peter Wolff, Albert Hein, Polichronis Lepidis, Rainer Dorsch, Thomas Kirste, Christian Haubelt
2016 — conf
Accurate Sample Time Reconstruction for Sensor Data Synchronization.
ARCS
Sebastian Stieber, Rainer Dorsch, Christian Haubelt
2016 — conf
Improving Always-On Gesture Recognition Power Efficiency for Android Devices Using Sensor Hubs.
CSE/EUC/DCABES
Johann-Peter Wolff, Sebastian Stieber, Tobias Rankl, Rainer Dorsch
2016 Misc conf
Statistical analysis and improvement of the repeatability and reproducibility of an evaluation method for IMUs on a smartphone.
EICS
Nils Büscher, Lars Middendorf, Christian Haubelt, Rainer Dorsch, Frederik Wegelin
2015 — conf
A Mobile Camera-Based Evaluation Method of Inertial Measurement Units on Smartphones.
IoT 360 (2)
Lars Middendorf, Rainer Dorsch, Rudolf Bichler, Christina Strohrmann, Christian Haubelt
2014 — conf
Hybride Prototypisierung eines Sensorsubsystems.
MBMV
Sebastian Stieber, Johann-Peter Wolff, Christian Haubelt, Rainer Dorsch
2012 C conf
A scalable model based RTL framework zamiaCAD for static analysis.
VLSI-SoC
Anton Tsepurov, Gunter Bartsch, Rainer Dorsch, Maksim Jenihhin, Jaan Raik, Valentin Tihhomirov
2012 J jnl
IBM Parallel Sysplex design for the IBM z196 system.
IBM J. Res. Dev.
Rainer Dorsch, Richard K. Errickson, Markus M. Helms, G. Crew, Thomas A. Gregg, Welela Haileselassie, L. W. Helmer, Andreas Kohler, Kulwant M. Pandey, Susanne Roscher, E. S. Rotter, Christian Haubelt
2010 A conf
Efficient High-Level modeling in the networking domain.
DATE
Christian Zebelein, Joachim Falk, Christian Haubelt, Jürgen Teich, Rainer Dorsch
2010 — conf
Integrating Hardware/Firmware Verification Efforts Using SystemC High-Level Models.
MBMV
Joachim Falk, Christian Zebelein, Christian Haubelt, Jürgen Teich, Rainer Dorsch
2009 J jnl
Design and verification of the IBM System z10 I/O subsystem chips.
IBM J. Res. Dev.
Thomas Schlipf, Markus M. Helms, Jürgen Ruf, M. Klein, Rainer Dorsch, B. Hoppe, Walter Lipponer, S. Boekholt, T. Rower, Manfred H. Walz, S. Junghans
2007 — conf
Transaction Modeling and RTL Simulation Analysis.
MBMV
Rainer Dorsch, Jürgen Ruf
2006 A conf
Task-accurate performance modeling in SystemC for real-time multi-processor architectures.
DATE
Martin Streubühr, Joachim Falk, Christian Haubelt, Jürgen Teich, Rainer Dorsch, Thomas Schlipf
2005 — conf
Development of an audio player as system-on-a-chip using an open source platform.
ISCAS (3)
Pattara Kiatisevi, Luis Leonardo Azuara-Gomez, Rainer Dorsch, Hans-Joachim Wunderlich
2002 A conf
Adapting an SoC to ATE Concurrent Test Capabilities.
ITC
Rainer Dorsch, Ramón Huerta Rivera, Hans-Joachim Wunderlich, Martin Fischer
2002 — conf
RESPIN++ - deterministic embedded test.
ETW
Lars Schäfer, Rainer Dorsch, Hans-Joachim Wunderlich
2002 J jnl
Reusing Scan Chains for Test Pattern Decompression.
J. Electron. Test.
Rainer Dorsch, Hans-Joachim Wunderlich
2001 — conf
Reusing scan chains for test pattern decompression.
ETW
Rainer Dorsch, Hans-Joachim Wunderlich
2001 A conf
Tailoring ATPG for embedded testing.
ITC
Rainer Dorsch, Hans-Joachim Wunderlich
2001 A conf
Using mission logic for embedded testing.
DATE
Rainer Dorsch, Hans-Joachim Wunderlich
1998 A conf
Accumulator based deterministic BIST.
ITC
Rainer Dorsch, Hans-Joachim Wunderlich