| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2018 | J | jnl |
Proc. IEEE
|
| 2009 | — | conf |
NanoNet
|
| 2006 | J | jnl |
J. Electron. Test.
|
| 2004 | — | conf |
DELTA
|
| 2002 | A | conf |
DATE
|
| 2002 | — | conf |
DELTA
|
| 2000 | J | jnl |
J. Electron. Test.
|
| 1998 | — | conf |
Asian Test Symposium
|
| 1998 | — | conf |
Asian Test Symposium
|
| 1997 | J | jnl |
VLSI Design
|
| 1997 | J | jnl |
VLSI Design
|
| 1995 | — | conf |
Asian Test Symposium
|
| 1995 | A | conf |
ITC
|
| 1995 | J | jnl |
J. Electron. Test.
|
| 1994 | J | jnl |
VLSI Design
|
| 1994 | J | jnl |
VLSI Design
|
| 1992 | Misc | conf |
VTS
|
| 1992 | J | jnl |
J. Electron. Test.
|
| 1991 | J | jnl |
IEEE Trans. Computers
|
| 1991 | A | conf |
ITC
|
| 1990 | A | conf |
ITC
|
| 1990 | — | conf |
Compcon
|
| 1986 | A | conf |
ITC
|