Rafic Z. Makki

23 papers A 5Misc 1Journal 10Unranked 7
YearRankTypeTitle / Venue / Authors
2018 J jnl
Nurturing the Growth of a National Infrastructure in Emerging Technologies.
Proc. IEEE
Rafic Z. Makki, Victor V. Zhirnov, Ralph K. Cavin III, Sami Issa, Marco Iansiti
2009 — conf
On Wires Holding a Handful of Electrons.
NanoNet
Valeriu Beiu, Walid Ibrahim, Rafic Z. Makki
2006 J jnl
Scaling of i
J. Electron. Test.
Ali Chehab, Saurabh Patel, Rafic Z. Makki
2004 — conf
Measurement and Analysis of Physical Defects for Dynamic Supply Current Testing.
DELTA
Scott Thomas, Rafic Z. Makki, Sai Kishore Vavilala
2002 A conf
I
DATE
Suriya Ashok Kumar, Rafic Z. Makki, David M. Binkley
2002 — conf
IDDT Test Methodologies for Very Deep Sub-micron CMOS Circuits.
DELTA
Ali Chehab, Rafic Z. Makki, Michael Spica, David Wu
2000 J jnl
Dynamic Power Supply Current Testing of CMOS SRAMs.
J. Electron. Test.
Jian Liu, Rafic Z. Makki, Ayman I. Kayssi
1998 — conf
Dynamic Power Supply Current Testing of SRAMs.
Asian Test Symposium
Jian Liu, Rafic Z. Makki, Ayman I. Kayssi
1998 — conf
Testing of Embedded Memories - The Aggregate.
Asian Test Symposium
Rafic Z. Makki
1997 J jnl
Advancements in Power Supply Current Testing.
VLSI Design
Rafic Z. Makki
1997 J jnl
I
VLSI Design
Abdulnour Y. Toukmaji, Ronald Helms, Rafic Z. Makki, Wadie Mikhail, Patrick Toole
1995 — conf
Power supply current detectability of SRAM defects.
Asian Test Symposium
Jian Liu, Rafic Z. Makki
1995 A conf
Transient Power Supply Current Testing of Digital CMOS Circuits.
ITC
Rafic Z. Makki, Shyang-Tai Su, H. Troy Nagle
1995 J jnl
Transient power supply current monitoring - A new test method for CMOS VLSI circuits.
J. Electron. Test.
Shyang-Tai Su, Rafic Z. Makki, H. Troy Nagle
1994 J jnl
Analysis and Characterization of State Assignment Techniques for Sequential Machines.
VLSI Design
Rafic Z. Makki, Shyang-Tai Su
1994 J jnl
Pioneer: A New Tool for Coding of Multi-Level Finite State Machines Based on Evolution Programming.
VLSI Design
Subbu Muddappa, Rafic Z. Makki, Zbigniew Michalewicz, Sridhar Isukapalli
1992 Misc conf
A testable static RAM structure for efficient coverage of pattern sensitive faults.
VTS
Shyang-Tai Su, Rafic Z. Makki
1992 J jnl
Testing of static random access memories by monitoring dynamic power supply current.
J. Electron. Test.
Shyang-Tai Su, Rafic Z. Makki
1991 J jnl
Automatic Test Pattern Generation with Branch Testing.
IEEE Trans. Computers
Rafic Z. Makki, Silvio Bou-Ghazale, Chen Tianshang
1991 A conf
On the Integration of Design and Manufacturing for Improved Testability.
ITC
Rafic Z. Makki, Kasra Daneshvar, Farid Tranjan, Richard Greene
1990 A conf
Practical partitioning for testability with time-shared boundary scan.
ITC
Rafic Z. Makki, Krisbnm Palaniswami
1990 — conf
SSC-a tool for the synthesis of testable sequential machines.
Compcon
Rafic Z. Makki, J. Muha, Silvio Bou-Ghazale, T. Kaylani
1986 A conf
Designing Testable Control Paths with Multiple and Feedback Scan-Paths.
ITC
Rafic Z. Makki, C. Tiansheng