Rafael Perez Martinez

11 papers Journal 5Unranked 6
YearRankTypeTitle / Venue / Authors
2025 J jnl
Robust Pareto Transistor Sizing of GaN HEMTs for Millimeter-Wave Applications.
IEEE Access
Rafael Perez Martinez, Stephen P. Boyd, Srabanti Chowdhury
2024 — conf
A Hybrid Physical ASM-HEMT Model Using a Neural Network-Based Methodology.
BCICTS
Rafael Perez Martinez, Masaya Iwamoto, Ana M. Banzer Morgado, Yiao Li, Roberto Tinti, Jianjun Xu, Chad Gillease, Steven Cochran, Bhawani Shankar, Else-Marie Schmidt, Zijian Song, Natalie Wagner, Philipp Pahl, Alexander Petr, Srabanti Chowdhury
2024 J jnl
Compact Model Parameter Extraction via Derivative-Free Optimization.
IEEE Access
Rafael Perez Martinez, Masaya Iwamoto, Kelly Woo, Zhengliang Bian, Roberto Tinti, Stephen P. Boyd, Srabanti Chowdhury
2024 J jnl
Compact Model Parameter Extraction via Derivative-Free Optimization.
CoRR
Rafael Perez Martinez, Masaya Iwamoto, Kelly Woo, Zhengliang Bian, Roberto Tinti, Stephen P. Boyd, Srabanti Chowdhury
2024 J jnl
Robust Pareto Design of GaN HEMTs for Millimeter-Wave Applications.
CoRR
Rafael Perez Martinez, Stephen P. Boyd, Srabanti Chowdhury
2022 — conf
Movement of Current Filaments and its Impact on Avalanche Robustness in Vertical GaN P-N diode Under UIS stress.
DRC
Bhawani Shankar, Ke Zeng, Brendan Gunning, Rafael Perez Martinez, Chuanzhe Meng, Jack Flicker, Andrew Binder, Jeramy Ray Dickerson, Robert Kaplar, Srabanti Chowdhury
2022 — conf
Study of Avalanche Behavior in 3 kV GaN Vertical P-N Diode Under UIS Stress for Edge-termination Optimization.
IRPS
Bhawani Shankar, Zhengliang Bian, Ke Zeng, Chuanzhe Meng, Rafael Perez Martinez, Srabanti Chowdhury, Brendan Gunning, Jack Flicker, Andrew Binder, Jeramy Ray Dickerson, Robert Kaplar
2022 J jnl
Visual anomaly detection in video by variational autoencoder.
CoRR
Faraz Waseem, Rafael Perez Martinez, Chris Wu
2020 — conf
Circuit-Level Safe-Operating-Area of a High-Speed SiGe BiCMOS Wireline Driver.
BCICTS
Arya Moradinia, Rafael Perez Martinez, Jeffrey W. Teng, Nelson Sepúlveda-Ramos, Harrison Lee, John D. Cressler
2019 — conf
Reliability Differences Between SiGe HBTs Optimized for High-Performance and Medium-Breakdown.
BCICTS
Rafael Perez Martinez, Uppili S. Raghunathan, Brian R. Wier, Harrison P. Lee, John D. Cressler
2018 — conf
Revisiting Safe Operating Area: SiGe HBT Aging Models for Reliability-Aware Circuit Design.
BCICTS
Brian R. Wier, Rafael Perez Martinez, Uppili S. Raghunathan, Hanbin Ying, Saeed Zeinolabedinzadeh, John D. Cressler