| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2022 | J | jnl |
Trans. Inst. Meas. Control
|
| 2021 | J | jnl |
J. Syst. Control. Eng.
|
| 2021 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2020 | J | jnl |
Int. J. Model. Identif. Control.
|
| 2019 | — | conf |
ISSPIT
|
| 2019 | J | jnl |
Trans. Inst. Meas. Control
|
| 2019 | J | jnl |
Int. J. Autom. Control.
|
| 2016 | J | jnl |
J. Syst. Control. Eng.
|
| 2016 | J | jnl |
Int. J. Syst. Sci.
|
| 2011 | J | jnl |
Signal Process.
|
| 2010 | J | jnl |
Math. Comput. Model.
|
| 2010 | J | jnl |
Comput. Math. Appl.
|
| 2008 | J | jnl |
Int. J. Model. Identif. Control.
|
| 2008 | J | jnl |
Appl. Math. Comput.
|
| 2008 | J | jnl |
Appl. Math. Comput.
|
| 2006 | J | jnl |
J. Adv. Comput. Intell. Intell. Informatics
|