R. Dean Adams

13 papers A 5Misc 2Journal 1Unranked 5
YearRankTypeTitle / Venue / Authors
2004 — conf
An Integrated Memory Self Test and EDA Solution.
MTDT
R. Dean Adams, Robert Abbott, Xiaoliang Bai, Dwayne Burek, Eric MacDonald
2002 — conf
Design and Test of a 9-port SRAM for a 100Gb/s STS-1 Switch.
MTDT
Robert Gibbins, R. Dean Adams, Thomas J. Eckenrode, Michael Ouellette, Yuejian Wu
2001 A conf
Bitline contacts in high density SRAMs: design for testability and stressability.
ITC
Harold Pilo, R. Dean Adams, Robert E. Busch, Eric A. Nelson, Geoerge E. Rudgers
2001 — conf
Defect Analysis and a New Fault Model for Multi-port SRAMs.
DFT
Pradeep Nagaraj, Shambhu Upadhaya, Kamran Zarrineh, R. Dean Adams
2000 — conf
Defect Analysis and Realistic Fault Model Extensions for Static Random Access Memories.
MTDT
Kamran Zarrineh, R. Dean Adams, Aneesha P. Deo
2000 A conf
Self test architecture for testing complex memory structures.
ITC
Kamran Zarrineh, R. Dean Adams, Thomas J. Eckenrode, Steven P. Gregor
2000 Misc conf
Silicon-on-Insulator Technology Impacts on SRAM Testing.
VTS
R. Dean Adams, Phil Shephard III
1999 Misc conf
The Limits of Digital Testing for Dynamic Circuits.
VTS
R. Dean Adams, Edmond S. Cooley
1998 A conf
Quad DCVS dynamic logic fault modeling and testing.
ITC
R. Dean Adams, Edmond S. Cooley, Patrick R. Hansen
1997 A conf
A Self-Test Circuit for Evaluating Memory Sense-Amplifier Signal.
ITC
R. Dean Adams, Edmond S. Cooley, Patrick R. Hansen
1995 — conf
A 370-MHz memory built-in self-test state machine.
ED&TC
R. Dean Adams, John Connor, Garret S. Koch, Luigi Ternullo Jr.
1995 A conf
Deterministic Self-Test of a High-Speed Embedded Memory and Logic Processor Subsystem.
ITC
Luigi Ternullo Jr., R. Dean Adams, John Connor, Garret S. Koch
1992 J jnl
A 576 K 3.5-ns access BiCMOS ECL static RAM with array built-in self-test.
IEEE J. Solid State Circuits
Henry A. Bonges III, R. Dean Adams, Archibald J. Allen, Roy Flaker, Kenneth S. Gray, Erik L. Hedberg, W. Timothy Holman, George M. Lattimore, David A. Lavalette, Kim Yen T. Nguyen, Alan L. Roberts