R. D. Shawn Blanton

29 papers A* 1A 6B 2C 2Misc 7Journal 3Unranked 8

Year	Rank	Type	Title / Venue / Authors
2025	Misc	`conf`	CHEF: CHaracterizing Elusive Logic Circuit Failures. VTS Ruben Purdy, Chris Nigh, Wei Li, R. D. Shawn Blanton
2025	A	`conf`	Tempus Core: Area-Power Efficient Temporal-Unary Convolution Core for Low-Precision Edge DLAs. DATE Prabhu Vellaisamy, Harideep Nair, Thomas Kang, Yichen Ni, Haoyang Fan, Bin Qi, Jeff Chen, R. D. Shawn Blanton, John Paul Shen
2024	—	`conf`	Exploration of Unary Arithmetic-Based Matrix Multiply Units for Low Precision DL Accelerators. ISVLSI Prabhu Vellaisamy, Harideep Nair, Di Wu, R. D. Shawn Blanton, John Paul Shen
2024	B	`conf`	Faulty Function Extraction for Defective Circuits. ETS Chris Nigh, Ruben Purdy, Wei Li, Subhasish Mitra, R. D. Shawn Blanton
2024	J	`jnl`	Tempus Core: Area-Power Efficient Temporal-Unary Convolution Core for Low-Precision Edge DLAs. CoRR Prabhu Vellaisamy, Harideep Nair, Thomas Kang, Yichen Ni, Haoyang Fan, Bin Qi, Jeff Chen, R. D. Shawn Blanton, John Paul Shen
2023	—	`conf`	Characterize the ability of GNNs in attacking logic locking. MLCAD Wei Li, Ruben Purdy, José M. F. Moura, R. D. Shawn Blanton
2022	—	`conf`	Large-Scale Logic-Locking Attacks via Simulation. ISQED Ruben Purdy, R. D. Shawn Blanton
2022	—	`conf`	Secuirty Metrics for Logic Circuits. HOST Ruben Purdy, Danielle Duvalsaint, R. D. Shawn Blanton
2021	A	`conf`	Characterizing Corruptibility of Logic Locks using ATPG. ITC Danielle Duvalsaint, R. D. Shawn Blanton
2021	Misc	`conf`	Memory-Efficient Adaptive Test Pattern Reordering for Accurate Diagnosis. VTS Chenlei Fang, Qicheng Huang, R. D. Shawn Blanton
2021	J	`jnl`	Split-Chip Design to Prevent IP Reverse Engineering. IEEE Des. Test Samuel Pagliarini, Joseph Sweeney, Ken Mai, R. D. Shawn Blanton, Larry T. Pileggi, Subhasish Mitra
2020	Misc	`conf`	A Deterministic-Statistical Multiple-Defect Diagnosis Methodology. VTS Soumya Mittal, R. D. Shawn Blanton
2020	—	`conf`	Adaptive Test Pattern Reordering for Diagnosis using k-Nearest Neighbors. ITC-Asia Chenlei Fang, Qicheng Huang, R. D. Shawn Blanton
2020	A*	`conf`	DECOY: DEflection-Driven HLS-Based Computation Partitioning for Obfuscating Intellectual PropertY. DAC Jianqi Chen, Monir Zaman, Yiorgos Makris, R. D. Shawn Blanton, Subhasish Mitra, Benjamin Carrión Schäfer
2020	—	`conf`	Diagnosis Outcome Prediction on Limited Data via Transferred Random Forest. ITC-Asia Qicheng Huang, Chenlei Fang, R. D. Shawn Blanton
2020	C	`conf`	Efficient Classification via Partial Co-Training for Virtual Metrology. ETFA Cuong Nguyen, Xin Li, R. D. Shawn Blanton, Xiang Li
2020	A	`conf`	High Defect-Density Yield Learning using Three-Dimensional Logic Test Chips. ITC Zeye Liu, R. D. Shawn Blanton
2020	A	`conf`	Knowledge Transfer for Diagnosis Outcome Preview with Limited Data. ITC Qicheng Huang, Chenlei Fang, R. D. Shawn Blanton
2020	A	`conf`	LAIDAR: Learning for Accuracy and Ideal Diagnostic Resolution. ITC Qicheng Huang, Chenlei Fang, R. D. Shawn Blanton
2020	Misc	`conf`	Special Session: Novel Attacks on Logic-Locking. VTS Ayush Jain, Ujjwal Guin, M. Tanjidur Rahman, Navid Asadizanjani, Danielle Duvalsaint, R. D. Shawn Blanton
2019	Misc	`conf`	Diagnosis Outcome Preview through Learning. VTS Chenlei Fang, Qicheng Huang, Soumya Mittal, R. D. Shawn Blanton
2019	C	`conf`	IPSA: Integer Programming via Sparse Approximation for Efficient Test-Chip Design. ICCD Qicheng Huang, Chenlei Fang, Zeye Liu, Ruizhou Ding, R. D. Shawn Blanton
2019	B	`conf`	LearnX: A Hybrid Deterministic-Statistical Defect Diagnosis Methodology. ETS Soumya Mittal, R. D. Shawn Blanton
2019	Misc	`conf`	Path Delay Test of the Carnegie Mellon Logic Characterization Vehicle. VTS Ben Niewenhuis, Balaji Ravikumar, Zeye Liu, R. D. Shawn Blanton
2018	A	`conf`	Improving Diagnosis Efficiency via Machine Learning. ITC Qicheng Huang, Chenlei Fang, Soumya Mittal, R. D. Shawn Blanton
2017	—	`conf`	GPU-accelerated fault dictionary generation for the TRAX fault model. ITC-Asia Matthew Beckler, R. D. Shawn Blanton
2016	J	`jnl`	Test: Wisdom From the Giants, Visions for the Future - Part 2. IEEE Des. Test R. D. Shawn Blanton, David Yeh
2001	—	`conf`	Designing and Implementing Efficient BISR Techniques for Embedded RAMs. LATW Michael Nicolaidis, Slimane Boutobza, Nadir Achouri, R. D. Shawn Blanton, Julie Segal, David Y. Lepejian, Ben Chu, Tony Singh, Harvey Berman
1998	Misc	`conf`	Testing MEMS. VTS Jean-Michel Karam, Marcelo Lubaszewski, R. D. Shawn Blanton, Andrew Richardson