| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
CoRR
|
| 2026 | J | jnl |
J. Syst. Sci. Complex.
|
| 2025 | J | jnl |
J. Syst. Sci. Complex.
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
IEEE Trans. Reliab.
|
| 2024 | J | jnl |
Bayesian Analysis of Lifetime Delayed Degradation Process for Destructive/Nondestructive Inspection.
IEEE Trans. Reliab.
|
| 2024 | A* | conf |
NeurIPS
|
| 2024 | J | jnl |
CoRR
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
Optimal Acceptance Sampling Testing Plan With Pivotal Quantity for Log-Location-Scale Distributions.
IEEE Trans. Reliab.
|
| 2022 | J | jnl |
CoRR
|
| 2022 | A* | conf |
NeurIPS
|
| 2022 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2021 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2020 | J | jnl |
IISE Trans.
|
| 2019 | J | jnl |
Eur. J. Oper. Res.
|
| 2017 | J | jnl |
IEEE Robotics Autom. Lett.
|
| 2017 | J | jnl |
IEEE Trans. Reliab.
|
| 2016 | J | jnl |
Softw. Test. Verification Reliab.
|
| 2015 | C | conf |
PRDC
|
| 2015 | — | conf |
IEEM
|
| 2014 | J | jnl |
Comput. Stat. Data Anal.
|
| 2011 | — | conf |
IEEM
|
| 2007 | J | jnl |
Qual. Reliab. Eng. Int.
|