| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Trans. Cogn. Commun. Netw.
|
| 2025 | J | jnl |
IEEE Trans. Veh. Technol.
|
| 2025 | J | jnl |
Neural Comput. Appl.
|
| 2025 | J | jnl |
Neural Networks
|
| 2023 | — | conf |
ADMIT
|
| 2007 | Misc | conf |
VLSI Design
|
| 2007 | C | conf |
DDECS
|
| 2006 | — | conf |
ISQED
|
| 2006 | A | conf |
ISLPED
|
| 2006 | A | conf |
DATE
|
| 2006 | — | conf |
CICC
|
| 2005 | C | conf |
ICCD
|
| 2005 | A* | conf |
DAC
|
| 2005 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2005 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2005 | Misc | conf |
Modeling and Testing of SRAM for New Failure Mechanisms Due to Process Variations in Nanoscale CMOS.
VTS
|
| 2005 | C | conf |
IOLTS
|