Q. Peter He

24 papers C 17Journal 7
YearRankTypeTitle / Venue / Authors
2025 C conf
Statistical Process Monitoring of Cryogenic Air Separation Unit Startups.
ACC
Bahareh Hassani, Yajun Wang, Ankur Kumar, Jesus Flores-Cerrillo, Jin Wang, Q. Peter He
2022 C conf
Improving Linear Separability of Pulse Wave Laser Additive Manufacturing Classifiers with Rational Feature Engineering and Selection
ACC
Alexander J. Summers, Houshang Yin, Ralf D. Fischer, Barton C. Prorok, Xiaoyuan Lou, Q. Peter He
2022 C conf
Model-based Irrigation Control using Model Predictive Control and DSSAT Crop Simulator.
ACC
Jisung Jang, Di Tian, Q. Peter He
2022 C conf
Understanding the evolution of interspecies metabolic interactions using dynamic genome-scale metabolic modeling
ACC
Kiumars Badr, Q. Peter He, Jin Wang
2021 J jnl
Multiclass moisture classification in woodchips using IIoT Wi-Fi and machine learning techniques.
Comput. Chem. Eng.
Kerul Suthar, Q. Peter He
2020 C conf
A Variable Selection Method for Improving Variable Selection Consistency and Soft Sensor Performance.
ACC
Jangwon Lee, Jesus Flores-Cerrillo, Jin Wang, Q. Peter He
2020 J jnl
Feature engineering in big data analytics for IoT-enabled smart manufacturing - Comparison between deep learning and statistical learning.
Comput. Chem. Eng.
Devarshi Shah, Jin Wang, Q. Peter He
2020 C conf
Using Channel State Information for Estimating Moisture Content in Woodchips via 5 GHz Wi-Fi.
ACC
Kerul Suthar, Jin Wang, Zhihua Jiang, Q. Peter He
2019 J jnl
A novel process monitoring approach based on variational recurrent autoencoder.
Comput. Chem. Eng.
Feifan Cheng, Q. Peter He, Jinsong Zhao
2019 J jnl
Feature space monitoring for smart manufacturing via statistics pattern analysis.
Comput. Chem. Eng.
Q. Peter He, Jin Wang, Devarshi Shah
2019 J jnl
Next-generation virtual metrology for semiconductor manufacturing: A feature-based framework.
Comput. Chem. Eng.
Kerul Suthar, Devarshi Shah, Jin Wang, Q. Peter He
2019 J jnl
Understanding the effect of specialization on hospital performance through knowledge-guided machine learning.
Comput. Chem. Eng.
Jangwon Lee, Q. Peter He
2017 C conf
A new application of data-driven soft sensor: Estimating individual biomass in mixed cultures.
ACC
Kyle A. Stone, Devarshi Shah, Q. Peter He, Jin Wang
2017 C conf
Statistical process monitoring in the era of smart manufacturing.
ACC
Q. Peter He, Jin Wang
2013 C conf
Elucidating xylose metabolism of scheffersomyces stipitis by integrating principal component analysis with flux balance analysis.
ACC
Meng Liang, Q. Peter He, Thomas W. Jeffries, Jin Wang
2013 C conf
Improved state estimation for high-mix semiconductor manufacturing.
ACC
Jin Wang, Q. Peter He, Thomas F. Edgar
2013 C conf
Quantification of valve stiction based on a semi-physical model.
ACC
Q. Peter He, Jin Wang
2012 C conf
Statistics pattern analysis based virtual metrology for plasma etch processes.
ACC
Q. Peter He, Jin Wang, Hector E. Gilicia, John D. Stuber, Bhalinder S. Gill
2010 C conf
Comparison of a new spectrum alignment algorithm with other methods.
ACC
Q. Peter He, Jin Wang
2010 C conf
Control performance assessment and diagnosis for semiconductor processes.
ACC
Jin Wang, Q. Peter He, Thomas F. Edgar
2008 C conf
EWMA run-to-run controllers with gain updating: Stability and sensitivity analysis.
ACC
Jin Wang, Q. Peter He
2008 C conf
Principal component based k-nearest-neighbor rule for semiconductor process fault detection.
ACC
Q. Peter He, Jin Wang
2007 C conf
A General Framework for State Estimation in High-Mix Semiconductor Manufacturing.
ACC
Jin Wang, Q. Peter He, Thomas F. Edgar
2007 J jnl
Run-to-run control and state estimation in high-mix semiconductor manufacturing.
Annu. Rev. Control.
Christopher A. Bode, Jin Wang, Q. Peter He, Thomas F. Edgar