| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2023 | J | jnl |
IEEE Access
|
| 2019 | C | conf |
IECON
|
| 2018 | C | conf |
IECON
|
| 2016 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2016 | C | conf |
IECON
|
| 2015 | C | conf |
IECON
|
| 2015 | C | conf |
IECON
|
| 2014 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2014 | C | conf |
IECON
|
| 2014 | C | conf |
IECON
|
| 2014 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2014 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2014 | — | conf |
ISIE
|
| 2013 | C | conf |
IECON
|
| 2013 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2013 | C | conf |
IECON
|
| 2012 | C | conf |
IECON
|
| 2012 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2012 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2012 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2012 | C | conf |
IECON
|
| 2012 | C | conf |
IECON
|
| 2012 | C | conf |
IECON
|
| 2012 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2012 | C | conf |
IECON
|
| 2012 | C | conf |
IECON
|
| 2011 | J | jnl |
Int. J. Control
|
| 2009 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2008 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2008 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2008 | C | conf |
IAS
|
| 2007 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2007 | C | conf |
IAS
|
| 2007 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2007 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2007 | J | jnl |
EURASIP J. Adv. Signal Process.
|
| 2007 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2007 | C | conf |
IAS
|
| 2006 | — | conf |
CCECE
|
| 2006 | — | conf |
CCECE
|
| 2005 | C | conf |
CCA
|
| 2005 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2004 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2004 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2003 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 1999 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 1999 | J | jnl |
IEEE Trans. Ind. Electron.
|