| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2008 | A | conf |
ICCAD
|
| 2008 | — | conf |
ISQED
|
| 2007 | — | conf |
Intra-die process parameter variation and leakage analysis of cache at the microarchitectural level.
SoCC
|
| 2006 | Misc | conf |
VLSI Design
|
| 2006 | — | conf |
SoCC
|
| 2006 | — | conf |
ISQED
|
| 2006 | — | conf |
ISQED
|
| 2005 | Misc | conf |
VLSI Design
|
| 2005 | — | conf |
SoCC
|
| 2005 | J | jnl |
J. Low Power Electron.
|
| 2005 | — | conf |
ISVLSI
|
| 2004 | — | conf |
SoCC
|