Pranab K. Nag

13 papers A* 1A 6Misc 1Journal 2Unranked 3
YearRankTypeTitle / Venue / Authors
2017 J jnl
DFM Evaluation Using IC Diagnosis Data.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Ronald Shawn Blanton, Fa Wang, Cheng Xue, Pranab K. Nag, Yang Xue, Xin Li
2013 A conf
DREAMS: DFM rule EvAluation using manufactured silicon.
ICCAD
Ronald D. Blanton, Fa Wang, Cheng Xue, Pranab K. Nag, Yang Xue, Xin Li
2002 J jnl
Modeling the Economics of Testing: A DFT Perspective.
IEEE Des. Test Comput.
Pranab K. Nag, Anne E. Gattiker, Sichao Wei, Ronald D. Blanton, Wojciech Maly
2000 — conf
Cost based tradeoff analysis of standard cell designs.
SLIP
Peng Li, Pranab K. Nag, Wojciech Maly
1998 A conf
Design-Manufacturing Interface: Part I - Vision.
DATE
Wojciech Maly, Pranab K. Nag, Hans T. Heineken, Jitendra Khare
1998 A conf
Design-Manufacturing Interface: Part II - Applications.
DATE
Wojciech Maly, Pranab K. Nag, Charles H. Ouyang, Hans T. Heineken, Jitendra Khare, P. Simon
1997 A* conf
CAD at the Design-Manufacturing Interface.
DAC
Hans T. Heineken, Jitendra Khare, Wojciech Maly, Pranab K. Nag, Charles H. Ouyang, Witold A. Pleskacz
1997 A conf
To DFT or Not to DFT?
ITC
Sichao Wei, Pranab K. Nag, Ronald D. Blanton, Anne E. Gattiker, Wojciech Maly
1996 A conf
Design for manufacturability in submicron domain.
ICCAD
Wojciech Maly, Hans T. Heineken, Jitendra Khare, Pranab K. Nag
1995 — conf
AFFCCA: a tool for critical area analysis with circular defects and lithography deformed layout.
DFT
Igor Bubel, Wojciech Maly, Thomas Waas, Pranab K. Nag, Hans Hartmann, Doris Schmitt-Landsiedel, Susanne Griep
1995 — conf
Hierarchical extraction of critical area for shorts in very large ICs.
DFT
Pranab K. Nag, Wojciech Maly
1995 Misc conf
Testability-oriented channel routing.
VLSI Design
Jitendra Khare, Sujoy Mitra, Pranab K. Nag, U. Maly, Rob A. Rutenbar
1988 A conf
Testing oriented analysis of CMOS ICs with opens.
ICCAD
Wojciech Maly, Pranab K. Nag, Phil Nigh