Pramodchandran N. Variyam

19 papers A 5B 1Misc 7Journal 5Unranked 1
YearRankTypeTitle / Venue / Authors
2010 J jnl
Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication Devices.
J. Electron. Test.
Ganesh Srinivasan, Abhijit Chatterjee, Sasikumar Cherubal, Pramodchandran N. Variyam
2006 A conf
DIBPro: Automatic Diagnostic Program Generation Tool.
ITC
Venkat Kalyanaraman, Bruce C. Kim, Pramodchandran N. Variyam, Sasikumar Cherubal
2005 B conf
Accurate measurement of multi-tone power ratio (MTPR) of ADSL devices using low cost testers.
ETS
Ganesh Srinivasan, Sasikumar Cherubal, Pramodchandran N. Variyam, Melese Teklu, C. P. Wang, David Guidry, Abhijit Chatterjee
2004 J jnl
Partial Bi-Immunity and NP-Completeness
Electron. Colloquium Comput. Complex.
John M. Hitchcock, Aduri Pavan, Pramodchandran N. Variyam
2003 A conf
Automatic Diagnostic Program Generation for Mixed Signal Load Board.
ITC
Kranthi K. Pinjala, Bruce C. Kim, Pramodchandran N. Variyam
2002 Misc conf
Measuring Stray Capacitance on Tester Hardware.
VTS
Achintya Halder, Abhijit Chatterjee, Pramodchandran N. Variyam, John Ridley
2002 J jnl
Prediction of analog performance parameters using fast transienttesting.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Pramodchandran N. Variyam, Sasikumar Cherubal, Abhijit Chatterjee
2000 J jnl
Digital-Compatible BIST for Analog Circuits Using Transient Response Sampling.
IEEE Des. Test Comput.
Pramodchandran N. Variyam, Abhijit Chatterjee
2000 A conf
Increasing the IDDQ test resolution using current prediction.
ITC
Pramodchandran N. Variyam
2000 A conf
Measuring code edges of ADCs using interpolation and its application to offset and gain error testing.
ITC
Pramodchandran N. Variyam, Vinay Agrawal
2000 J jnl
Specification-driven test generation for analog circuits.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Pramodchandran N. Variyam, Abhijit Chatterjee
1999 Misc conf
Efficient Test Generation for Transient Testing of Analog Circuits Using Partial Numerical Simulation.
VTS
Pramodchandran N. Variyam, Junwei Hou, Abhijit Chatterjee
1999 Misc conf
Test Generation for Analog Circuits Using Partial Numerical Simulation.
VLSI Design
Pramodchandran N. Variyam, Junwei Hou, Abhijit Chatterjee
1998 Misc conf
Enhancing Test Effectiveness for Analog Circuits Using Synthesized Measurements.
VTS
Pramodchandran N. Variyam, Abhijit Chatterjee
1998 Misc conf
Hierarchical Statistical Inference Model for Specification Based Testing of Analog Circuits.
VTS
Heebyung Yoon, Pramodchandran N. Variyam, Abhijit Chatterjee, Naveena Nagi
1998 — conf
Specification-Driven Test Design for Analog Circuits.
DFT
Pramodchandran N. Variyam, Abhijit Chatterjee
1997 Misc conf
FLYER: Fast Fault Simulation of Linear Analog Circuits Using Polynomial Waveform and Perturbed State Representation.
VLSI Design
Pramodchandran N. Variyam, Abhijit Chatterjee
1997 Misc conf
Low-cost and efficient digital-compatible BIST for analog circuits using pulse response sampling.
VTS
Pramodchandran N. Variyam, Abhijit Chatterjee, Naveena Nagi
1997 A conf
Test generation for comprehensive testing of linear analog circuits using transient response sampling.
ICCAD
Pramodchandran N. Variyam, Abhijit Chatterjee