Pradeep Lall

18 papers Journal 10Unranked 8
YearRankTypeTitle / Venue / Authors
2024 — conf
Cell Lifetime Degradation Model Development for Li-Ion Coin Cells considering Calendar Aging and Post-Knee Degradation (Invited).
IRPS
Pradeep Lall, Ved Soni
2023 — conf
Estimation of SOH Degradation of Coin Cells Subjected to Accelerated Life Cycling with Randomized Cycling Depths and C-Rates.
IRPS
Pradeep Lall, Ved Soni, Guneet Sethi, Kok Yiang
2018 — conf
PHM of state-of-charge for flexible power sources in wearable electronics with EKF.
IRPS
Pradeep Lall, Hao Zhang, Rahul Lall
2018 — conf
Prognostics health management of electronic systems - A reliability physics approach.
IRPS
Pradeep Lall, Kazi Mirza, David Locker
2016 — conf
ANN based RUL assessment for copper-aluminum wirebonds subjected to harsh environments.
ICPHM
Pradeep Lall, Shantanu Deshpande, Luu Nguyen
2016 J jnl
Experimental determination of fatigue behavior of lead free solder joints in microelectronic packaging subjected to isothermal aging.
Microelectron. Reliab.
Muhannad Mustafa, Jeffrey C. Suhling, Pradeep Lall
2016 J jnl
High strain rate constitutive behavior of SAC105 and SAC305 leadfree solder during operation at high temperature.
Microelectron. Reliab.
Pradeep Lall, Di Zhang, Vikas Yadav, David Locker
2016 — conf
Prognostication of remaining useful-life for flexible batteries in foldable wearable electronics.
ICPHM
Pradeep Lall, Hao Zhang
2015 — conf
Prognostication of LED remaining useful life and color stability in the presence of contamination.
ICPHM
Pradeep Lall, Hao Zhang, Lynn Davis
2015 — conf
Prognostication of solder-joint reliability of 0.4mm and 0.5mm pitch bgas subjected to mechanical shocks up to 10, 000G.
ICPHM
Pradeep Lall, Kalyan Dornala, Junchao Wei, Ryan Lowe, Jason Foley
2015 J jnl
Reliability and Failure Modes of Solid-State Lighting Electrical Drivers Subjected to Accelerated Aging.
IEEE Access
Pradeep Lall, Peter Sakalaukus, Lynn Davis
2012 J jnl
Decorrelated Feature Space and Neural Nets Based Framework for Failure Modes Clustering in Electronics Subjected to Mechanical Shock.
IEEE Trans. Reliab.
Pradeep Lall, Prashant Gupta, Kai Goebel
2012 J jnl
Extended Kalman Filter Models and Resistance Spectroscopy for Prognostication and Health Monitoring of Leadfree Electronics Under Vibration.
IEEE Trans. Reliab.
Pradeep Lall, Ryan Lowe, Kai Goebel
2012 J jnl
Prognostics Health Management of Electronic Systems Under Mechanical Shock and Vibration Using Kalman Filter Models and Metrics.
IEEE Trans. Ind. Electron.
Pradeep Lall, Ryan Lowe, Kai Goebel
2011 J jnl
Guest Editorial.
IEEE Trans. Ind. Electron.
Robert Neal Dean, Pradeep Lall, Mathias Nowottnick, William R. Harrell
2011 J jnl
Prognostication of Residual Life and Latent Damage Assessment in Lead-Free Electronics Under Thermomechanical Loads.
IEEE Trans. Ind. Electron.
Pradeep Lall, Chandan Bhat, Madhura Hande, Vikrant More, Rahul Vaidya, Kai Goebel
2009 J jnl
Prognostication of system-state in lead-free electronics equipment under cyclic and steady-state thermo-mechanical loads.
Microelectron. Reliab.
Pradeep Lall, Madhura Hande, Chandan Bhat, Vikrant More, Rahul Vaidya
2007 J jnl
Feature extraction and damage-precursors for prognostication of lead-free electronics.
Microelectron. Reliab.
Pradeep Lall, Madhura Hande, Chandan Bhat, Nokibul Islam, Jeff Suhling, Jay Lee