Pieter Weckx - RankMe

67 papers A 7B 4C 4Misc 1Journal 16Unranked 35

Year	Rank	Type	Title / Venue / Authors
2025	—	`conf`	Towards a Computationally Efficient Verilog-A Defect-Centric BTI Compact Model for Circuit Aging Simulations. IRPS Dishant Sangani, Dieter Claes, Pieter Weckx, Ben Kaczer, Georges G. E. Gielen
2024	—	`conf`	Backside Power Delivery in High Density and High Performance Context: IR-Drop and Block-Level Power-Performance-Area Benefits. VLSI Technology and Circuits Yun Zhou, S. C. Song, Halil Kükner, Giuliano Sisto, Sheng Yang, Anita Farokhnejad, Mohamed Naeim, Moritz Brunion, Ji-Yung Lin, Odysseas Zografos, Pieter Weckx, Shashank Ekbote, Nick Stevens-Yu, David Greenlaw, Steve Molloy, Geert Hellings, Julien Ryckaert
2024	J	`jnl`	Future Design Direction for SRAM Data Array: Hierarchical Subarray With Active Interconnect. IEEE Trans. Circuits Syst. I Regul. Pap. Hsiao-Hsuan Liu, Carlo Gilardi, Shairfe Muhammad Salahuddin, Zhenlin Pei, Pieter Schuddinck, Yang Xiang, Pieter Weckx, Geert Hellings, Marie Garcia Bardon, Julien Ryckaert, Chenyun Pan, Subhasish Mitra, Francky Catthoor
2024	—	`conf`	Possible Origins, Identification, and Screening of Silent Data Corruption in Data Centers. IRPS Dishant Sangani, Ben Kaczer, Pieter Weckx, Philippe J. Roussel, Subrat Mishra, Erik Jan Marinissen, Georges G. E. Gielen
2024	B	`conf`	Silent Data Corruption: Test or Reliability Problem? ETS Erik Jan Marinissen, Harish Dattatraya Dixit, Ronald Shawn Blanton, Aaron Kuo, Wei Li, Subhasish Mitra, Chris Nigh, Ruben Purdy, Ben Kaczer, Dishant Sangani, Pieter Weckx, Philippe J. Roussel, Georges G. E. Gielen
2024	—	`conf`	Thermal Considerations for Block-Level PPA Assessment in Angstrom Era: A Comparison Study of Nanosheet FETs (A10) & Complementary FETs (A5). VLSI Technology and Circuits S. Mishra, Bjorn Vermeersch, Sankatali Venkateswarlu, Halil Kukner, Gioele Mirabelli, Fabian M. Bufler, Moritz Brunion, Dawit Burusie Abdi, Herman Oprins, Dwaipayan Biswas, Odysseas Zografos, Francky Catthoor, Pieter Weckx, Geert Hellings, James Myers, Julien Ryckaert
2024	—	`conf`	Thermal Performance Evaluation of Multi-Core SOCs Using Power-Thermal Co-Simulation. IRPS Subrat Mishra, Bjorn Vermeersch, Sankatali Venkateswarlu, Halil Kukner, A. Sharma, G. Mirabeli, Fabian M. Bufler, Moritz Brunion, Dawit Burusie Abdi, Herman Oprins, Dwaipayan Biswas, Odysseas Zografos, Francky Catthoor, Pieter Weckx, Geert Hellings, James Myers, Julien Ryckaert
2023	J	`jnl`	3D SRAM Macro Design in 3D Nanofabric Process Technology. IEEE Trans. Circuits Syst. I Regul. Pap. Dawit Burusie Abdi, Shairfe Muhammad Salahuddin, Jürgen Bömmels, Edouard Giacomin, Pieter Weckx, Julien Ryckaert, Geert Hellings, Francky Catthoor
2023	—	`conf`	Block-level Evaluation and Optimization of Backside PDN for High-Performance Computing at the A14 node. VLSI Technology and Circuits Giuliano Sisto, R. Preston, Rongmei Chen, Gioele Mirabelli, Anita Farokhnejad, Yun Zhou, Ivan Ciofi, Anne Jourdain, A. Veloso, Michele Stucchi, Odysseas Zografos, Pieter Weckx, Geert Hellings, Julien Ryckaert
2023	J	`jnl`	Impact of 3-D Integration on Thermal Performance of RISC-V MemPool Multicore SOC. IEEE Trans. Very Large Scale Integr. Syst. Sankatali Venkateswarlu, Subrat Mishra, Herman Oprins, Bjorn Vermeersch, Moritz Brunion, Jun-Han Han, Mircea R. Stan, Dwaipayan Biswas, Pieter Weckx, Francky Catthoor
2023	C	`conf`	Impact of interconnects enhancement on SRAM design beyond 5nm technology node. ISCAS Mohit Kumar Gupta, Pieter Weckx, Manu Perumkunnil Komalan, Julien Ryckaert
2023	A	`conf`	Learning-Oriented Reliability Improvement of Computing Systems From Transistor to Application Level. DATE Behnaz Ranjbar, Florian Klemme, Paul R. Genssler, Hussam Amrouch, Jinhyo Jung, Shail Dave, Hwisoo So, Kyongwoo Lee, Aviral Shrivastava, Ji-Yung Lin, Pieter Weckx, Subrat Mishra, Francky Catthoor, Dwaipayan Biswas, Akash Kumar
2023	—	`conf`	Towards Chip-Package-System Co-optimization of Thermally-limited System-On-Chips (SOCs). IRPS Subrat Mishra, Sankatali Venkateswarlu, Bjorn Vermeersch, Moritz Brunion, Melina Lofrano, Dawit Burusie Abdi, Herman Oprins, Dwaipayan Biswas, Odysseas Zografos, Gaspard Hiblot, Geert Van der Plas, Pieter Weckx, Geert Hellings, James Myers, Francky Catthoor, Julien Ryckaert
2022	—	`conf`	Backside PDN and 2.5D MIMCAP to Double Boost 2D and 3D ICs IR-Drop beyond 2nm Node. VLSI Technology and Circuits Rongmei Chen, Giuliano Sisto, Michele Stucchi, Anne Jourdain, Kenichi Miyaguchi, Pieter Schuddinck, P. Woeltgens, H. Lin, Naveen Kakarla, Anabela Veloso, Dragomir Milojevic, Odysseas Zografos, Pieter Weckx, Geert Hellings, Geert Van der Plas, Julien Ryckaert, Eric Beyne
2022	A	`conf`	Design enablement of CFET devices for sub-2nm CMOS nodes. DATE Odysseas Zografos, Bilal Chehab, Pieter Schuddinck, Gioele Mirabelli, Naveen Kakarla, Yang Xiang, Pieter Weckx, Julien Ryckaert
2022	—	`conf`	Evaluating Forksheet FET Reliability Concerns by Experimental Comparison with Co-integrated Nanosheets. IRPS Erik Bury, Adrian Vaisman Chasin, Ben Kaczer, Michiel Vandemaele, Stanislav Tyaginov, Jacopo Franco, Romain Ritzenthaler, Hans Mertens, Pieter Weckx, N. Horiguchi, Dimitri Linten
2022	J	`jnl`	Evaluation of Nanosheet and Forksheet Width Modulation for Digital IC Design in the Sub-3-nm Era. IEEE Trans. Very Large Scale Integr. Syst. Giuliano Sisto, Odysseas Zografos, Bilal Chehab, Naveen Kakarla, Yang Xiang, Dragomir Milojevic, Pieter Weckx, Geert Hellings, Julien Ryckaert
2022	J	`jnl`	Multitimescale Mitigation for Performance Variability Improvement in Time-Critical Systems. IEEE Trans. Very Large Scale Integr. Syst. Ji-Yung Lin, Pieter Weckx, Subrat Mishra, Alessio Spessot, Francky Catthoor
2022	—	`conf`	Opportunities of Chip Power Integrity and Performance Improvement through Wafer Backside (BS) Connection: Invited Paper. SLIP Rongmei Chen, Giuliano Sisto, Odysseas Zografos, Dragomir Milojevic, Pieter Weckx, Geert Van der Plas, Eric Beyne
2022	A	`conf`	Proactive Run-Time Mitigation for Time-Critical Applications Using Dynamic Scenario Methodology. DATE Ji-Yung Lin, Pieter Weckx, Subrat Mishra, Alessio Spessot, Francky Catthoor
2022	J	`jnl`	Thermal Performance Analysis of Mempool RISC-V Multicore SoC. IEEE Trans. Very Large Scale Integr. Syst. Sankatali Venkateswarlu, Subrat Mishra, Herman Oprins, Bjorn Vermeersch, Moritz Brunion, Jun-Han Han, Mircea R. Stan, Pieter Weckx, Francky Catthoor
2021	—	`conf`	Overhead Reduction with Optimal Margining Using A Reliability Aware Design Paradigm. IRPS Subrat Mishra, Pieter Weckx, Odysseas Zografos, Ji-Yung Lin, Alessio Spessot, Francky Catthoor
2021	—	`conf`	Reliability and Variability-Aware DTCO Flow: Demonstration of Projections to N3 FinFET and Nanosheet Technologies. IRPS Gerhard Rzepa, Markus Karner, Oskar Baumgartner, Georg Strof, Franz Schanovsky, Ferdinand Mitterbauer, Christian Kernstock, Hui-Wen Karner, Pieter Weckx, Geert Hellings, Dieter Claes, Zhicheng Wu, Yang Xiang, Thomas Chiarella, Bertrand Parvais, Jérôme Mitard, Jacopo Franco, Ben Kaczer, Dimitri Linten, Zlatan Stanojevic
2020	J	`jnl`	Analysis of Functional Errors Produced by Long-Term Workload-Dependent BTI Degradation in Ultralow Power Processors. IEEE Trans. Very Large Scale Integr. Syst. Loris Duch, Miguel Peón-Quirós, Pieter Weckx, Alexandre Levisse, Rubén Braojos, Francky Catthoor, David Atienza
2020	—	`conf`	Device Scaling roadmap and its implications for Logic and Analog platform. BCICTS Alessio Spessot, Bertrand Parvais, Amita Rawat, Kenichi Miyaguchi, Pieter Weckx, Doyoung Jang, Julien Ryckaert
2020	—	`conf`	Fast & Accurate Methodology for Aging Incorporation in Circuits using Adaptive Waveform Splitting (AWS). IRPS Subrat Mishra, Pieter Weckx, Ji-Yung Lin, Ben Kaczer, Dimitri Linten, Alessio Spessot, Francky Catthoor
2020	A	`conf`	Mitigation of Sense Amplifier Degradation Using Skewed Design. DATE Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor
2020	—	`conf`	eSRAM Reliability: Why is it still not optimally solved? DTIS Daniël Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor
2019	B	`conf`	Hardware-Based Aging Mitigation Scheme for Memory Address Decoder. ETS Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor
2019	A	`conf`	Methodology for Application-Dependent Degradation Analysis of Memory Timing. DATE Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor
2019	J	`jnl`	Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM. IEEE Trans. Very Large Scale Integr. Syst. Daniel Kraak, Mottaqiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor
2019	J	`jnl`	Understanding the Impact of Time-Dependent Random Variability on Analog ICs: From Single Transistor Measurements to Circuit Simulations. IEEE Trans. Very Large Scale Integr. Syst. Marko Simicic, Pieter Weckx, Bertrand Parvais, Philippe Roussel, Ben Kaczer, Georges G. E. Gielen
2018	J	`jnl`	A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability. Microelectron. Reliab. Ben Kaczer, Jacopo Franco, Pieter Weckx, Philippe Roussel, Vamsi Putcha, Erik Bury, Marko Simicic, Adrian Vaisman Chasin, Dimitri Linten, Bertrand Parvais, Francky Catthoor, Gerhard Rzepa, Michael Waltl, Tibor Grasser
2018	J	`jnl`	Comphy - A compact-physics framework for unified modeling of BTI. Microelectron. Reliab. Gerhard Rzepa, Jacopo Franco, Barry J. O'Sullivan, A. Subirats, Marko Simicic, Geert Hellings, Pieter Weckx, Markus Jech, Theresia Knobloch, Michael Waltl, Philippe Roussel, Dimitri Linten, Ben Kaczer, Tibor Grasser
2018	A	`conf`	Degradation analysis of high performance 14nm FinFET SRAM. DATE Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor
2018	B	`conf`	Device aging: A reliability and security concern. ETS Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Francky Catthoor, Abhijit Chatterjee, Adit D. Singh, Hans-Joachim Wunderlich, Naghmeh Karimi
2018	J	`jnl`	Impact and mitigation of SRAM read path aging. Microelectron. Reliab. Innocent Agbo, Mottaqiallah Taouil, Daniel Kraak, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene
2018	—	`conf`	Scaling CMOS beyond Si FinFET: an analog/RF perspective. ESSDERC Bertrand Parvais, Geert Hellings, Marko Simicic, Pieter Weckx, Jérôme Mitard, Doyoung Jang, V. Deshpande, B. van Liempc, Anabela Veloso, A. Vandooren, Niamh Waldron, Piet Wambacq, Nadine Collaert, Diederik Verkest
2018	—	`conf`	Self-heating-aware CMOS reliability characterization using degradation maps. IRPS Erik Bury, Adrian Vaisman Chasin, Ben Kaczer, Kai-Hsin Chuang, Jacopo Franco, Marko Simicic, Pieter Weckx, Dimitri Linten
2017	—	`conf`	Dedicated technology threshold voltage tuning for 6T SRAM beyond N7. ICICDT Mohit Kumar Gupta, Pieter Weckx, Stefan Cosemans, Pieter Schuddinck, Rogier Baert, Doyoung Jang, Yasser Sherazi, Praveen Raghavan, Alessio Spessot, Anda Mocuta, Wim Dehaene
2017	—	`conf`	Device circuit and technology co-optimisation for FinFET based 6T SRAM cells beyond N7. ESSDERC Mohit Kumar Gupta, Pieter Weckx, Stefan Cosemans, Pieter Schuddinck, Rogier Baert, Dmitry Yakimets, Doyoung Jang, Yasser Sherazi, Praveen Raghavan, Alessio Spessot, Anda Mocuta, Wim Dehaene
2017	J	`jnl`	Impact and Mitigation of Sense Amplifier Aging Degradation Using Realistic Workloads. IEEE Trans. Very Large Scale Integr. Syst. Daniel Kraak, Mottaqiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor
2017	J	`jnl`	Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier. IEEE Trans. Very Large Scale Integr. Syst. Innocent Agbo, Mottaqiallah Taouil, Daniel Kraak, Said Hamdioui, Halil Kukner, Pieter Weckx, Praveen Raghavan, Francky Catthoor
2017	A	`conf`	Mitigation of sense amplifier degradation using input switching. DATE Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene
2016	—	`conf`	Accuracy of Quasi-Monte Carlo technique in failure probability estimations. ICICDT Michail Noltsis, Pieter Weckx, Dimitrios Rodopoulos, Francky Catthoor, Dimitrios Soudris
2016	—	`conf`	Capturing True Workload Dependency of BTI-induced Degradation in CPU Components. ACM Great Lakes Symposium on VLSI Dimitrios Stamoulis, Simone Corbetta, Dimitrios Rodopoulos, Pieter Weckx, Peter Debacker, Brett H. Meyer, Ben Kaczer, Praveen Raghavan, Dimitrios Soudris, Francky Catthoor, Zeljko Zilic
2016	C	`conf`	Comparative BTI analysis for various sense amplifier designs. DDECS Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor
2016	—	`conf`	Quantification of Sense Amplifier Offset Voltage Degradation due to Zero-and Run-Time Variability. ISVLSI Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor, Wim Dehaene
2016	B	`conf`	Read path degradation analysis in SRAM. ETS Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene
2015	—	`conf`	BTI analysis of SRAM write driver. IDT Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor
2015	—	`conf`	Characterization and simulation methodology for time-dependent variability in advanced technologies. CICC Pieter Weckx, Ben Kaczer, Praveen Raghavan, Jacopo Franco, Marko Simicic, Philippe J. Roussel, Dimitri Linten, Aaron Thean, Diederik Verkest, Francky Catthoor, Guido Groeseneken
2015	—	`conf`	Characterization of time-dependent variability using 32k transistor arrays in an advanced HK/MG technology. IRPS Pieter Weckx, Ben Kaczer, C. Chen, Jacopo Franco, Erik Bury, Kaushik Chanda, J. Watt, Philippe J. Roussel, Francky Catthoor, Guido Groeseneken
2015	—	`conf`	Comparative analysis of RD and Atomistic trap-based BTI models on SRAM Sense Amplifier. DTIS Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Stefan Cosemans, Pieter Weckx, Praveen Raghavan, Francky Catthoor
2015	J	`jnl`	Comparison of NBTI aging on adder architectures and ring oscillators in the downscaling technology nodes. Microprocess. Microsystems Halil Kükner, Pieter Weckx, Sébastien Morrison, Jacopo Franco, Maria Toledano-Luque, Moonju Cho, Praveen Raghavan, Ben Kaczer, Doyoung Jang, Kenichi Miyaguchi, Marie Garcia Bardon, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken
2015	—	`conf`	Experimental evidences and simulations of trap generation along a percolation path. ESSDERC Louis Gerrer, Razaidi Hussin, Salvatore M. Amoroso, Jacopo Franco, Pieter Weckx, Marko Simicic, N. Horiguchi, Ben Kaczer, Tibor Grasser, Asen Asenov
2015	—	`conf`	Impact of random telegraph noise on ring oscillators evaluated by circuit-level simulations. ICICDT Azusa Oshima, Pieter Weckx, Ben Kaczer, Kazutoshi Kobayashi, Takashi Matsumoto
2015	—	`conf`	Impact of time-dependent variability on the yield and performance of 6T SRAM cells in an advanced HK/MG technology. ICICDT Pieter Weckx, Ben Kaczer, Philippe J. Roussel, Francky Catthoor, Guido Groeseneken
2015	Misc	`conf`	Integral impact of BTI and voltage temperature variation on SRAM sense amplifier. VTS Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Halil Kukner, Pieter Weckx, Praveen Raghavan, Francky Catthoor
2015	—	`conf`	Origins and implications of increased channel hot carrier variability in nFinFETs. IRPS Ben Kaczer, Jacopo Franco, M. Cho, Tibor Grasser, Philippe J. Roussel, Stanislav Tyaginov, M. Bina, Yannick Wimmer, Luis-Miguel Procel, Lionel Trojman, Felice Crupi, Gregory Pitner, Vamsi Putcha, Pieter Weckx, Erik Bury, Z. Ji, An De Keersgieter, Thomas Chiarella, Naoto Horiguchi, Guido Groeseneken, Aaron Thean
2015	—	`conf`	Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow. ESSDERC Razaidi Hussin, Louis Gerrer, Jie Ding, Liping Wang, Salvatore M. Amoroso, Binjie Cheng, Dave Reid, Pieter Weckx, Marko Simicic, Jacopo Franco, Annelies Vanderheyden, Danielle Vanhaeren, Naoto Horiguchi, Ben Kaczer, Asen Asenov
2015	—	`conf`	The defect-centric perspective of device and circuit reliability - From individual defects to circuits. ESSDERC Ben Kaczer, Jacopo Franco, Pieter Weckx, Philippe Roussel, Erik Bury, Moonju Cho, Robin Degraeve, Dimitri Linten, Guido Groeseneken, Halil Kukner, Praveen Raghavan, Francky Catthoor, Gerhard Rzepa, Wolfgang Gös, Tibor Grasser
2014	—	`conf`	Degradation analysis of datapath logic subblocks under NBTI aging in FinFET technology. ISQED Halil Kukner, Moustafa A. Khatib, Sebastien Morrison, Pieter Weckx, Praveen Raghavan, Ben Kaczer, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken
2014	C	`conf`	NBTI Aging on 32-Bit Adders in the Downscaling Planar FET Technology Nodes. DSD Halil Kukner, Pieter Weckx, Sebastien Morrison, Praveen Raghavan, Ben Kaczer, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken
2014	—	`conf`	On reliability enhancement using adaptive core voltage scaling and variations on nanoscale FPGAs. LATW Petr Pfeifer, Zdenek Plíva, Pieter Weckx, Ben Kaczer
2013	J	`jnl`	Impact of duty factor, stress stimuli, gate and drive strength on gate delay degradation with an atomistic trap-based BTI model. Microprocess. Microsystems Halil Kükner, Pieter Weckx, Praveen Raghavan, Ben Kaczer, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken
2012	—	`conf`	Design of a 150 mV Supply, 2 MIPS, 90nm CMOS, Ultra-Low-Power Microprocessor. PATMOS Pieter Weckx, Nele Reynders, Ilse de Moffarts, Wim Dehaene
2012	C	`conf`	Impact of Duty Factor, Stress Stimuli, and Gate Drive Strength on Gate Delay Degradation with an Atomistic Trap-Based BTI Model. DSD Halil Kukner, Pieter Weckx, Praveen Raghavan, Ben Kaczer, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken